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Second IEEE International Workshop on Automotive Reliability &eamp; Test

Fort Worth Convention Center, TX, USA
November 02-03, 2017.

held in conjunction with ITC 2017

The ART workshop focuses exclusively on test and reliability of automotive and mission-critical electronics, including design, manufacturing, burn-in, system-level integration and in-field test, diagnosis and repair solutions, as well as architectures and methods for reliable and safe operations under different environmental conditions. With increasing system complexity, security, stringent runtime requirements for functional safety and cost constraints of a mass market the reliable operation of electronics in safety-critical domains is still a major challenge. The ART Workshop offers a forum to present and discuss these challenges and emerging solutions among researchers and practitioners alike.

ART will take place in conjunction with the IEEE International Test Conference (ITC) and is sponsored by the Test Technology Technical Council (TTTC) of IEEE Computer Society.

You are invited to participate and submit your contributions to the ART Workshop. The workshop's areas of interest include (but are not limited to) the following topics:

  • Functional safety
  • Robustness and security in automotive
  • Multi-layer dependability evaluation
  • Verification and validation of automotive systems
  • Automotive standards and certification - ISO 26262
  • Fault tolerance and self-checking circuits
  • Dependability challenges of autonomous driving and e-mobility
  • Transient events- effects and mitigation
  • Aging effects on automotive electronics
  • Power-up, power-down and periodic test
  • System level test
  • Built-In Self-Test (BIST and SBST) in automotive systems
  • Functional and structural test generation
  • High quality volume test- minimizing DPPM
  • Life cycle test cost minimization
  • Download the Call for Paper

    Important Dates

    • Submission deadline : September 8 Extended to September 15, 2017
    • Notification of acceptance : September 29, 2017
    • Camera-ready material : October 13, 2017

    Paper Submission

    The Workshop prefers Full Paper submissions (of up to six pages), but also allows Extended Abstract submissions (of at least two pages). Each submission has to be in a standard IEEE format. The IEEE template can be found here.

    Submissions should be made electronically as a single PDF file here.

    Organizing Committee

    General Chair: Yervant Zorian – Synopsys (US)
    Vice General Chair: Davide Appello – ST Micro (IT)
    Program Chair: Paolo Bernardi – Polito (IT)
    Panels: Rubin Parekhji – TI (IN)
    Special Sessions: Peter Sarson – AMS (AT)
    Publications: Marco Restifo - Polito (IT)
    Finance: Suriya Natarajan – Intel (US)
    Publicity: Lorena Anghel - TIMA (FR)
    Registration: Teresa McLaurin – ARM (US)
    Electronic Media: Alberto Bosio – LIRMM (FR)

    Program Committee (to include)

    O. BallanXilinx
    N. BishnoiGlobalfoundries
    G. BoschiIntel
    W. CoeXilinx
    A. CronSynopsys
    W. DobbelaereON Semiconductor
    P. EngelkeInfineon
    C. EychenneBosch
    D. GizopoulosUniversity of Athens
    A. HalesTexas Instruments
    P. HarrodARM
    G. Harutyunyan Synopsys
    A. MajumdarXilinx
    R. MarianiIntel
    R. MontinoElmos Semiconductor
    N. MukherjeeMentor Graphics
    K. RamamoortyInfineon
    E. SanchezPolito
    A. SanghaniIntel
    H.M. Von StaudtDialog Semiconductor
    M. WahlUniversity of Siegen
    H.-J. WunderlichUniversity of Stuttgart




    Fort Worth Convention Center, Texas, USA