Digest of Papers
Advanced Program is now Available!
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Second IEEE International Workshop on Automotive Reliability &eamp; Test
Fort Worth Convention Center, TX, USA
November 02-03, 2017.
held in conjunction with ITC 2017
The ART workshop focuses exclusively on test and reliability of automotive and mission-critical electronics, including design, manufacturing, burn-in, system-level integration and in-field test, diagnosis and repair solutions, as well as architectures and methods for reliable and safe operations under different environmental conditions. With increasing system complexity, security, stringent runtime requirements for functional safety and cost constraints of a mass market the reliable operation of electronics in safety-critical domains is still a major challenge. The ART Workshop offers a forum to present and discuss these challenges and emerging solutions among researchers and practitioners alike.
ART will take place in conjunction with the IEEE International Test Conference (ITC) and is sponsored by the Test Technology Technical Council (TTTC) of IEEE Computer Society.
You are invited to participate and submit your contributions to the ART Workshop. The workshop's areas of interest include (but are not limited to) the following topics:
- Functional safety
- Robustness and security in automotive
- Multi-layer dependability evaluation
- Verification and validation of automotive systems
- Automotive standards and certification - ISO 26262
- Fault tolerance and self-checking circuits
- Dependability challenges of autonomous driving and e-mobility
Download the Call for Paper
- Submission deadline :
September 8Extended to September 15, 2017
- Notification of acceptance : September 29, 2017
- Camera-ready material : October 13, 2017
The Workshop prefers Full Paper submissions (of up to six pages), but also allows Extended Abstract submissions (of at least two pages). Each submission has to be in a standard IEEE format. The IEEE template can be found here.
Submissions should be made electronically as a single PDF file here.
|General Chair:||Yervant Zorian – Synopsys (US)|
|Vice General Chair:||Davide Appello – ST Micro (IT)|
|Program Chair:||Paolo Bernardi – Polito (IT)|
|Panels:||Rubin Parekhji – TI (IN)|
|Special Sessions:||Peter Sarson – AMS (AT)|
|Publications:||Marco Restifo - Polito (IT)|
|Finance:||Suriya Natarajan – Intel (US)|
|Publicity:||Lorena Anghel - TIMA (FR)|
|Registration:||Teresa McLaurin – ARM (US)|
|Electronic Media:||Alberto Bosio – LIRMM (FR)|
Program Committee (to include)
|W. Dobbelaere||ON Semiconductor|
|D. Gizopoulos||University of Athens|
|A. Hales||Texas Instruments|
|R. Montino||Elmos Semiconductor|
|N. Mukherjee||Mentor Graphics|
|H.M. Von Staudt||Dialog Semiconductor|
|M. Wahl||University of Siegen|
|H.-J. Wunderlich||University of Stuttgart|
Fort Worth Convention Center, Texas, USA