Call for Contributions
Call for Papers
Pdf Version| Paper submissions | January |
| Notification | February 22, 2019 |
| Camera ready | March 27, 2019 |
The aim of the conference is to cope with technology scaling limits and the emergence of novel paradigms. The areas of interest include design, technology, test and dependability of electronic products. The proposed work must introduce new concepts concerning methodologies, tools and theoretical approaches for design, verification and validation. Topics of the conference include, but are not limited to:
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Integrated Systems Design:
SOC, SIP design; Multiprocessor systems; Embedded systems; Wireless systems; Network on Chip; Neuromorphic computation; Analog, Mixed Signal and RF systems; MEMS and MOEMS; Low Voltage and Low Power systems; Synthesis (physical, logic); Simulation, Validation and Verification; Hardware Security
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Integrated Systems Technology:
Emerging resistive memories; Nanoelectronics; Device Modeling; Material Characterization; Failure Analysis; New Components; Packaging; Process Technology; Reliability Issues; Innovative technologies
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Integrated Systems Testing and Reliability:
Test and Security Issues; Defect and Fault Modeling; Analog and Mixed Signal Testing; MEMS/MOEMS Testing; SOC and SIP Testing; Delay Testing; Memory Testing; Single event effect on electronics; Hardness insurance; Fault Simulation, ATPG; DFT, BIST, BISR; On-line Testing; Fault Tolerant Systems; Approximate computing; Quantum computing; Alternative Test Strategies
The papers accepted to the conference will appear in formal IEEE proceedings.
Journal Special Issue
An extended version or developments of the accepted papers will be invited to participate to a special issue of the Microelectronics Reliability Journal by Elsevier editor.
Here the details on the special issue
Call for Special Session
Pdf Version| Proposal submissions | January |
| Notification | February 22, 2019 |
| Camera ready | March 27, 2019 |
Special Session proposal: DTIS 2020 seeks proposals for Special Sessions. The special sessions should aim at providing a complementary experience with respect to the regular sessions by focusing on hot and emerging topics of interest to the Nanotechnology Community (emerging technologies, approximate computing, beyond Von Neumann architectures such as neuromorphic and in-memory computing), as well as on multidisciplinary topics, that are expected to have a significant impact on the future technologies. A special session could consist of a set of individual presentations or a panel, possibly including experts from the industry. As for the standard sessions, the papers accepted to the special sessions will appear in formal IEEE proceedings.
Proposal submissions should be presented in a single PDF to be sent via e-mail to the Special Session Chair:
Paolo Bernardi - paolo.bernardi at polito.it
Journal Special Issue
As for the standard sessions, an extended version or developments of the accepted papers will be invited to participate to a special issue of the Microelectronics Reliability Journal by Elsevier editor.
Here the details on the special issue