Scientific Statement
Integrated electronic systems are at the heart of numerous products used nowadays in our society of information and communication technologies (ICT). However, technological advancements towards the « ultimate CMOS » impose similar advancements of test techniques to ensure a high quality level of manufactured circuits. Moreover, during lifetime, it is also crucial to ensure that a circuit will be able to detect and tolerate errors due to permanent defects or transient faults. This requires various (software, hardware), multi-level (system, architectural, circuit) and low-cost dedicated techniques.