Serge Bernard

CNRS Researcher  

Research

Analog and Mixed-Signal Testing

• Design-for-Testability (DfT),
• 'Built-In-Self-Test (BIST),
• Analog-to-Digital Converter Testing,
• System-in-Package (SiP) Testing.
• Built-in-Self Repair (BISR)

Integrated Circuit Design for Medical Applications

• Neural Stimulator for Functional Electrical Stimulation (FES),
• Physiological Signal Recording (ElectroNeuroGram: ENG).
• Medical devices development in the field of ophtalmology and vision based equipments.

Dependability

• Dependability at system level
• Dependability for Analog and mixed signal circuits