2011 Doctoral Thesis Award Winner: Wing Chiu Tam

2011 Finals held at International Test Conference (ITC)
Session Chair: Ilia Polian

1. Wing Chiu Tam (Shawn Blanton, Carnegie Mellon University)
   Title: Physically-Aware Analysis of Systematic Defects in Integrated Circuits
2. Guihai Yan (Xiaowei Li, ICT Beijing)
   Title: Online Timing Variation Detection and Tolerance for Digital Integrated Circuits
3. Urban Ingelsson (Bashir Al-Hashimi, University of Southampton, UK) Title: Investigation into Voltage and Process Variation-Aware Manufacturing Test

1. Guihai Yan (Xiaowei Li, ICT Beijing)
   Title: Online Timing Variation Detection and Tolerance for Digital Integrated Circuits
   
2. Xiao Liu (Qiang Xu, Chinese Univ. of HongKong)
   Title: Trace-Based Post-Silicon Validation and Compression-Aware Test Power Reduction for VLSI Circuits
   
3. Zhiyuan He (Zebo Peng, Petru Eles, Linköping University)
   Title: Temperature Aware and Defect-Probability Driven Test Scheduling for System-on-Chip
   

1. Wing Chiu Tam (Shawn Blanton, Carnegie Mellon University)
   Title: Physically-Aware Analysis of Systematic Defects in Integrated Circuits
2. Aswin Sreedhar (Sandip Kundu, UMass Amherst)
   Title: Managing Lithographic Variations in Design, Reliability and Test Using Statistical Techniques

1. Urban Ingelsson (Bashir Al-Hashimi, University of Southampton, UK)
   Title: Investigation into Voltage and Process Variation-Aware Manufacturing Test
2. Esa Korhonen (Juha Kostamovaara, University of Oulu, Finland)
   Title: On-chip Testing of A/D and D/A Converters. Static Linearity Testing without Statistically Known Stimulus
   
3. Viacheslav Izosimov (Zebo Peng, Petru Eles, Linkoping University, Sweden) Title: Scheduling and Optimization of Fault-Tolerant Distributed Embedded Systems