Committee Chair

• Technical Activities Chair of the Test Technology Technical Council (TTTC) of the IEEE Computer Society  http://www.ieee-tttc.org/

• (from 2006 to 2009) Vice-Chair of the IEEE European Test Technology Technical Council (ETTTC) of the IEEE Computer Society http://www.etttc.org/

Awards

• IEEE Fellow – since January 2015

• Golden Core Member of the IEEE Computer Society – since March 2011

• Meritorious Service Award - IEEE Computer Society (received in Santa Cruz, USA) - 2010

• Certificate of Appreciation - IEEE Council on Electronic Design Automation – 2018

• Certificate of Appreciation - IEEE Computer Society (received in Austin, USA) - 2009

• Certificate of Appreciation - IEEE Computer Society (received in Santa Clara, USA) - 2007

• Certificate of Appreciation - IEEE Computer Society (received in Santa Clara, USA) - 2006

• Certificate of Appreciation - IEEE Computer Society (received in Austin, USA) - 2005

Editor of Journal

• Founder and Editor-in-Chief of ASP Journal of Low Power Electronics, published by American Scientific publishers http://www.aspbs.com/jolpe/

• Associate Editor of IEEE Transactions on Emerging Topics in Computing, published by IEEE Computer Society http://www.computer.org/web/tetc

• Associate Editor of IEEE Transactions on Computers, published by IEEE Computer Society https://www.computer.org/web/tc/

• Associate Editor of JETTA - Journal of Electronic Testing, published by Springer http://www.springerlink.com/content/jetta/

• (from 2015 to 2018) Associate Editor of IEEE Transactions on CAD, published by IEEE CEDA. http://www.ieee-ceda.org/publications/tcad/

• (from 2009 to 2014) Associate Editor of IEEE Transactions on VLSI Systems, published by IEEE Computer Society  http://tvlsi.egr.duke.edu/

• (from 2005 to 2009) Associate Editor of IEEE Transactions on Computers, published by IEEE Computer Society https://www.computer.org/web/tc/

• (from 2005 to 2007) Associate Editor of Journal of Embedded Computing, published by IOS Press (The Netherlands) http://www.embeddedcomputing.org

• Member of the Editorial Board of the IEEE Computer Society

Conference

• Executive Committee

  Since 2016 : IEEE North Atlantic Test Workshop (NATW) http://natw.ieee.org/

  Since 2014 : IEEE International Symposium on Embedded Computing and System Design (ISED) http://www.ised2016.org/

  Since 2011 : IEEE European Test Symposium (ETS) http://www.ieee-ets.org/

  Since 2011 : IEEE Asian Test Symposium (ATS) http://www.ecs.umass.edu/ece/ats11/

  Since 2011 : IEEE International NEWCAS Conference http://newcas2016.ieee.ca/

  Since 2010 : IEEE Asian Symposium on Quality Electronic Design (ASQED) http://www.asqed.com/

  Since 2008 : IEEE International Symposium on Electronic Design, Test & Applications http://nnttf.ecu.edu.au/delta2010/

  Since 2007 : IEEE International Conference on Design & Technology of Integrated Systems http://www.emc-lab.net/Conferences/DTIS2008/

  From 2007 to 2010 : ACM/IEEE Design Automation and Test in Europe (DATE) http://www.date-conference.com/conference/next.htm

  In 2007 : ACM/IEEE Design Automation Conference (DAC) http://www.dac.com/44th/index.html

• General Chair and vice-Chair
  

  2016 : IEEE International Symposium on Embedded Computing and System Design (ISED), Patna, India http://www.ised2016.org/

  2015 : IEEE Computer Society Annual Symposium on VLSI (ISVLSI), Montpellier, France http://www.isvlsi.org/

  2013 : 18th IEEE European Test Symposium (ETS), Avignon, France http://www.lirmm.fr/ETS13/

  2012 : 5th IEEE International Workshop on Impact of Low Power Design on Test and Reliability (LPonTR), Grenoble, France http://www.LPonTR-2012/

  2012 : 17th IEEE European Test Symposium (ETS), Grenoble, France http://ets2012.imag.fr/

  2011 : 4th IEEE International Workshop on Impact of Low Power Design on Test and Reliability (LPonTR), Trondheim, Norway http://www.LPonTR-2011/

  2010 : 3rd IEEE International Workshop on Impact of Low Power Design on Test and Reliability (LPonTR), Prague, Czech republic http://www.LPonTR-2010/

  2009 : 2nd IEEE International Workshop on Impact of Low Power Design on Test and Reliability (LPonTR), Sevilla, Spain http://www.LPonTR-2009/

  2003 : 1st IST MARLOW workshop, Montpellier, France http://www.lowpower.org/

• Program Chair and vice-Chair

  2014 : IEEE Computer Society Annual Symposium on VLSI (ISVLSI), Tampa, FL, USA http://www.isvlsi.org/

  2012 : IEEE FTFC Conference, France http://davis.isep.fr/ftfc/

  2008 : IEEE European Test Symposium (ETS), Italy http://www.cad.polito.it/~ets08/

  2007 : IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, Poland http://www.iele.polsl.pl/ddecs2007

  2006 : IEEE International Conference on Design & Test of Integrated Systems, Tunisia http://www.ceslab.org/conferences/DTIS2006/

  2006 : IEEE International Workshop on Electronic Design, Test & Applications, Malaysia http://www.monash.edu.my/events/Delta2006

  2005 : IFIP International Conference on Embedded And Ubiquitous Computing, Nagasaki, Japan http://euc2005.he.nias.ac.jp/

• Topic or Track Chair

  2020 : IEEE International Symposium on Quality Electronic Design (ISQED) https://www.isqed.org/

  2020 : IEEE/ACM/EDAA Design Automation and Test in Europe (DATE), Grenoble, France http://www.date-conference.com/

  2019 : IEEE On-Line Testing Symposium (IOLTS), Rhodes Island, Greece http://tima.univ-grenoble-alpes.fr/conferences/fedfro/fedfro19/

  2019 : IEEE/ACM/EDAA Design Automation and Test in Europe (DATE), Florence, Italy http://www.date-conference.com/

  2018 : IEEE On-Line Testing Symposium (IOLTS), Platja d’Aro, Spain http://tima.univ-grenoble-alpes.fr/conferences/fedfro/fedfro18/

  2018 : IEEE European Test Symposium (ETS), Bremen, Germany http://www.informatik.uni-bremen.de/ets18/

  2017 : IEEE International NEWCAS Conference, Strasbourg, France http://newcas2017.org/

  2017 : IEEE European Test Symposium (ETS), Limassol, Cyprus http://www.ets17.org.cy/

  2016 : IEEE International NEWCAS Conference, Vancouver, Canada http://newcas2016.ieee.ca/

  2015 : IEEE International Conference on Electronics Circuits and Systems, Cairo, Egypt http://www.ieee-icecs2015.org/

  2015 : IEEE International NEWCAS Conference, Grenoble, France http://www.newcas2015.org/

  2014 : IEEE International NEWCAS Conference, Trois-Rivières, Canada http://www.newcas2014.org/

  2013 : IEEE International NEWCAS Conference, Paris, France http://www.newcas2013.org/

  2012 : IEEE Asian Symposium on Quality Electronic Design (ASQED), Penang, Malaysia http://www.asqed.com/

  2012 : IEEE International NEWCAS Conference, Montreal, Canada http://www.newcas2012.org/

  2011 : IEEE Asian Symposium on Quality Electronic Design (ASQED), Kuala Lumpur, Malaysia http://www.asqed.com/

  2011 : IEEE International NEWCAS Conference, Bordeaux, France http://www.newcas2011.org/

  2010 : IEEE Asia Symposium on Quality Electronic Design (ASDEQ), Penang, Malaysia http://www.asqed.com/

  2010 : IEEE / ACM Design Automation and Test in Europe (DATE), Dresden, Germany http://www.date-conference.com/

  2009 : IEEE / ACM Design Automation and Test in Europe (DATE), Nice, France http://www.date-conference.com/

  2008 : IEEE International Conference on Computer Design (ICCD), Lake Tahoe, USA http://iccd-conference.org/

  2008 : IEEE / ACM Design Automation and Test in Europe (DATE), Munich, Germany http://www.date-conference.com/

  2007 : ACM/IEEE Design Automation Conference, San Diego, USA http://www.dac.com/44th/index.htm

  2007 : IEEE / ACM Design Automation and Test in Europe (DATE), Nice, France http://www.date-conference.com/

  2006 : IEEE / ACM Design Automation and Test in Europe (DATE), Munich, Germany http://www.date-conference.com/

  2005 : IEEE European Test Symposium (ETS), Tallinn, Estonia http://www.ttu.ee/ati/ETS

  2005 : IEEE / ACM Design Automation and Test in Europe (DATE), Munich, Germany http://www.date-conference.com/

  2004 : IEEE / ACM Design Automation and Test in Europe (DATE), Paris, France http://www.date-conference.com/

• Editor of Proceedings

  2015 : IEEE Computer Society Annual Symposium on VLSI

  2014 : IEEE Computer Society Annual Symposium on VLSI

  2013 : IEEE European Test Symposium

  2012 : IEEE European Test Symposium

  2008 : IEEE European Test Symposium

  2007 : IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems

  2006 : IEEE International Conference on Design & Test of Integrated Systems

  2006 : IEEE International Workshop on Electronic Design, Test and Applications

  2001 : IFIP International Conference on VLSI-SOC

  2000 : XV International Conference on Design of Circuits and Integrated Systems

• Organizing Committee

  2019 : “European Liaison” - IEEE North Atlantic Test Workshop, Essex, Vermont, USA

  2018 : “European Liaison” - IEEE North Atlantic Test Workshop, Essex, Vermont, USA

  2017 : “European Liaison” - IEEE North Atlantic Test Workshop, Providence, Rhode Island, USA

  2016 : “Panel Chair” - IEEE European Test Symposium, Amsterdam, Pays-Bas

  2016 : “European Liaison” - IEEE North Atlantic Test Workshop, Providence, Rhode Island, USA

  2015 : “Tutorial Chair” - IEEE International Conference on Microelectronics, Casablanca, Marocco

  2011 : “Embedded Tutorial Chair” - IEEE European Test Symposium, Trondheim, Norway

  2010 : “Panel Chair” - IEEE European Test Symposium, Prague, Czech Republic

  2009 : “Embedded Tutorial Chair” - IEEE European Test Symposium, Seville, Spain

  2008 : “European Liaison” - IEEE Asian Test Symposium, Sapporo, Japan

  2007 : “Embedded Tutorial Chair” - IEEE European Test Symposium, Freiburg, Germany

  2004 : “Local Organization Chair” - IEEE European Test Symposium, Ajaccio, France

  2002 : “Publicity Chair” - International Conference on Field Programmable Logic and Applications

  2001 : “Tutorial Chair” - IFIP International Conference on VLSI-SOC

  2000 : “Publication Chair” - IEEE Mixed-Signal Testing Workshop

  2000 : “Publication Chair” - XV International Conference on Design of Circuits and Integrated Systems

  1996 : “Publication Chair” - IEEE European Test Workshop

  1994 : IEEE North Atlantic Test Workshop - European Part

• Program Committee

  since 2020: IEEE International Symposium on Quality Electronic DesignISQED 2020

  since 2019: IEEE International Conference on Very Large Scale Integration VLSI-SOC 2019

  since 2019: Approximate Computing Workshop AxC 2019

  since 2018: ISFA International Conference on Microelectronic Devices and Technologies MicDAT 2018

  since 2017: IARIA International Conference on Systems ICONS 2017

  since 2015: IEEE International Design & Test Symposium IDT 2015

  since 2015: IEEE International Conference on Microelectronics ICM 2015

  since 2015: IARIA International Conference on Advances in Circuits, Electronics and Microelectronics CENICS 2015

  since 2015: 19th International Symposium on VLSI Design and Test VDAT 2015

  since 2015 : IEEE International Conference on VLSI Design VLSI Design 2015

  since 2014 : IEEE International Symposium on Quality Electronic Design ISQED 2014

  since 2014 : European Workshop on Microelectronics Education EWME 2014

  since 2013 : IEEE Faible Tension Faible Consommation Conference FTFC 2013

  since 2013 : IEEE International Reliability Innovations Conference IRIC 2013

  since 2012 : IEEE International Electronic Design Education Conference IEDEC 2012

  since 2010 : IEEE Asia Symposium on Quality Electronic Design ASQED 2010

  from 2010 to 2012 : IEEE International Workshop on Reliability Aware System Design and Test RASDAT 2010

  since 2009 : IEEE / IARIA International Conference on Advances in System Testing and Validation Lifecycle VALID 2009

  from 2008 to 2013 : IEEE International Workshop on Defect and Data Driven Testing D3T 2008

  from 2008 to 2009 : IEEE International Conference on Signals, Circuits & Systems SCS 2008

  from 2008 to 2013 : IEEE International Test Conference ITC 2008

  from 2007 to 2008 : IEEE International Conference on Computer Design ICCD 2008

  since 2006 : ACM/IEEE International Symposium on Low Power Electronics and Design ISLPED 2006

  from 2006 to 2014 : IEEE VLSI Test Symposium VTS 2006

  since 2006 : IEEE International Conference on Design & Test of Integrated Systems DTIS 2006

  since 2006 : IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems DDECS 2006

  since 2005 : IEEE Asian Test Symposium ATS 2005

  in 2005 : IFIP International Conference on Embedded And Ubiquitous Computing  EUC'2005

  from 2005 to 2007 : IEEE/ACM Design Automation Conference 42nd DAC

  from 2005 to 2007: IFIP International Conference on VLSI-SOC IFIP VLSI SoC 2005

  from 2005 to 2006 : IEEE International Workshop on Power And Timing Modeling, Optimization and Simulation PATMOS 2005

  from 2004 to 2010 : IEEE/ACM Design Automation and Test in Europe DATE 05

  from 2004 to 2006 : IEEE Reconfigurable Architectures Workshop 12th RAW 2005

  since 2002 : IEEE European Test Symposium ETS'05

  since 2002 : IEEE International symposium on Electronic Design, Test & Applications DELTA 2004

  since 2001 : IEEE International On-Line Testing Symposium IOLTS 2005

• Best Paper Award

  2016 : IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, Kosice, Slovaquia

  2015 : IEEE International Conference on Microelectronics, Casablanca, Marocco

  2009 : IEEE / IARIA International Conference on Advances in System Testing and Validation Lifecycle, Porto, Portugal

  2006 : IEEE PhD Research in Microelectronics and Electronics, Otranto, Italy (Bronze Certificate)

  2005 : IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, Sopron, Hongrie

  2004 : IEEE European Test Symposium, Ajaccio, France

• Conference Tutorial

  2019 : "Developments and Practices for Testing MRAM Memories"

  given at IEEE International Conference on Microelectronic (ICM), Cairo, Egypt, December 16th, 2019

  2019 : "Power-Aware Testing in the Era of IoT"

  given at IEEE International Test Conference (ITC), Washington, USA, November 11th, 2019

  2019 : "Developments and Practices for Testing MRAM Memories"

  given at IEEE International Symposium on Quality Electronic Design (ISQED), Santa Clara, USA, March 7th, 2019

  2018 : "Power-Aware Testing in the Era of IoT"

  given at IEEE Asian Test Symposium (ATS), Hefei, China, October 15th, 2018

  2018 : "Power-Aware Testing in the Era of IoT"

  given at IEEE International Symposium on Circuits & Systems (ISCAS), Florence, Italy, May 29th, 2018

  2018 : "Power-Aware Testing in the Era of IoT"

  given at IEEE Latin-American Test Symposium (LATS), Sao Paulo, Brazil, March 16th, 2018

  2018 : "Power-Aware Testing in the Era of IoT"

  given at IEEE International Symposium on Quality Electronic Design (ISQED), Santa Clara, USA, March 13th, 2018

  2017 : "Power-Aware Testing in the Era of IoT"

  given at IEEE Asian Test Symposium (ATS), Taipei, Taiwan, November 27th, 2017

  2012 : "Power-Aware Testing and Test Strategies for Low Power Devices"

  given at IEEE Asian Test Symposium (ATS), Niigata, Japan, November 19th, 2012

  2012 : "Power-Aware Testing and Test Strategies for Low Power Devices"

  given at IEEE International Test Conference (ITC), Anaheim, USA, November 4th, 2012

  2012 : "Advanced Test Methods for SRAMs"

  given at IEEE VLSI Test Symposium (VTS), Hawai, USA, April 25th, 2012

  2012 : "Power-Aware Testing and Test Strategies for Low Power Devices"

  given at IEEE International Symposium on Quality of Electronic Design (ISQED), Santa Clara, USA, March 20th, 2012

  2011 : "Power-Aware Testing and Test Strategies for Low Power Devices"

  given at IEEE International Test Conference (ITC), Anaheim, USA, September 19th, 2011

  2011 : "Advanced Test Methods for SRAMs"

  given at IEEE Latin American Test Workshop (LATW), Porto de Galinhas, Brazil, March 30th, 2011

  2011 : "Power-Aware Testing and Test Strategies for Low Power Devices"

  given at IEEE/ACM Design Automation and Test in Europe (DATE) , Grenoble, France, March 14th, 2011

  2010 : "Power-Aware Testing and Test Strategies for Low Power Devices"

  given at IEEE International Conference on Microelectronics (ICM), Cairo, Egypt, December 19th, 2010

  2010 : "Power-Aware Testing and Test Strategies for Low Power Devices"

  given at IEEE International Midwest Symposium on Circuits and Systems (MWSCAS), Seattle, USA, August 1st, 2010

  2010 : "Power-Aware Testing and Test Strategies for Low Power Devices"

  given at IEEE International NEWCAS Conference, Montreal, Canada, June 20th, 2010

  2010 : "Power-Aware Testing and Test Strategies for Low Power Devices"

  given at IEEE Latin American Test Workshop (LATW), Punta del Este, Uruguay, March 28, 2010

  2009 : "Power-Aware Testing and Test Strategies for Low Power Devices"

  given at IEEE Asian Test Symposium (ATS), Taichung, Taiwan, November 23rd, 2009

  2009 : "Power-Aware Testing and Test Strategies for Low Power Devices"

  given at IEEE International Test Conference (ITC), Austin, USA, November 1st, 2009

  2008 : "Power-Aware Testing and Test Strategies for Low Power Devices"

  given at IEEE/ACM Design Automation and Test in Europe (DATE), Munich, Germany, March 10th, 2008

• Keynote Talk

  2019 : "Machine Learning Techniques for Improving Fault Diagnosis in SoCs"

  given at 1st International Workshop on AI Chip Design, Nanjing, China, June 5th, 2019

  2018 : "Test and Reliability of MRAM Memories"

  given at IEEE International Workshop on Spintronic Memory and Logic, Beijing, China, October 19th, 2018

  2017 : "Testing Approximate Digital Circuits"

  given at IEEE Workshop on RTL and High Level Testing, Taipei, Taiwan, November 30th, 2017

  2017 : "Testing Approximate Digital Circuits"

  given at IEEE Latin-American Test Symposium (LATS), Bogota, Colombie, March 15th, 2017

  2016 : "Test of Low Power Memories: Constraints and Industrial Practices"

  given at International Workshop on Spintronic Memory and Logic, Bejing, China, May 2, 2016

  2015 : "Test of Low Power Devices: Constraints and Industrial Practices"

  given at IEEE International Conference on Microelectronics (ICM), Casablanca, Marocco, December 21, 2015

  2008 : "Power : The New Dimension of Test"

  given at IEEE Workshop on RTL and High Level Testing (WRTLT), Sapporo, Japan, November 28, 2008

• Invited Paper

  2017 : IEEE Workshop on RTL and High Level Testing, Taipei, Taiwan

  2017 : IEEE Latin-American Test Symposium, Bogota, Colombia

  2016 : IEEE International Conference on Electronics, Circuits and Systems, Monte Carlo, Monaco

  2016 : IEEE International Workshop on Spintronic Memory and Logic, Beijing, China

  2015 : IEEE International Conference on Microelectronics, Casablanca, Marocco

  2012 : IEEE Asian Test Symposium, Niigata, Japan

  2011 : IEEE Asian Test Symposium, New Delhi, India (2 invited papers)

  2011 : IEEE Latin-American Test Workshop, Porto De Galinhas, Brazil

  2008 : IEEE Workshop on RTL and High Level Testing, Sapporo, Japan

  2008 : IEEE VLSI Test Symposium, San Diego, USA

  2006 : IEEE Workshop on RTL and High Level Testing, Fukuoka, Japan

  2006 : IEEE East-West Design and Test Workshop, Sochi, Russia

  2005 : MEDEA+ Design Automation Conference, Paris, France

  2004 : IEEE International Workshop on Electronic Design, Test & Applications, Perth, Australia

  2003 : International East-West Design and Test Conference, Yalta, Ukraine

  2000 : IEEE International Symposium on Quality of Electronic Design, San Jose, USA

• Panelist

  2008 : Workshop on RTL and High Level Testing, Sapporo, Japan

  2007 : IEEE Design & Technologies of Integrated Circuits Conference, Rabat, Marocco

  2005 : 1st Reconfigurable Communication-centric SoCs Workshop, Montpellier, France

Research Contracts

• STMicroelectronics, Crolles, France, topic: "Exploring Artificial Intelligence Solutions to Characterize the Behavior of Defective Cells in Nanometer Digital Circuits", from 2019 to 2022

• STMicroelectronics, Grenoble, France, topic: "Design for Test and On-Line Test of Image Sensor Matrices", from 2019 to 2022

• ANR EDITSoC "Electrical Diagnosis for IoT SoCs in automotive", National Program, from 2018 to 2020 http://www.agence-nationale-recherche.fr/

• LIA LAFISI "French-Italian research LAboratory on hardware-software Integrated Systems", from 2017 to 2020 https://www.lirmm.fr/lia_lafisi/

• PENTA HADES "Hierarchy-Aware and secure embedded test infrastructure for Dependability and performance Enhancement of integrated Systems", European Program, from 2017 to 2019 https://www.project-hades.eu/

• STMicroelectronics, Crolles, France, topic: "Fault Diagnosis in SRAM Memories", from 2016 to 2019

• CEA-LETI, Grenoble, France, topic: "Test for Quality of 3D ICs", from 2013 to 2014

• STMicroelectronics, Crolles, France, topic: "At-Speed Design-for-Test Techniques", from 2013 to 2016

• HiCool "Solutions de Conception Front End de Systèmes sur Puce de Faible Dissipation de Puissance", Fond Unique Interministériel (FUI), from 2013 to 2016

• LIA LAFISI "French-Italian research LAboratory on hardware-software Integrated Systems", from 2013 to 2016 https://www.lirmm.fr/lia_lafisi/

• CATRENE MASTER_3D "MAnufacturing Solutions Targeting competitive European pRoduction in 3D", European Program, from 2012 to 2015 http://www.catrene.org/

• ENIAC ELESIS "European Library-based flow of Embedded Silicon test Instrument", European Program, from 2012 to 2015 http://www.eniac.org/

• CEA-LETI, Grenoble, France, topic: "Test for Quality of 3D ICs", from 2011 to 2012

• STMicroelectronics, Grenoble, France, topic: "Logic Diagnosis for Automotive Embeded Systems", from 2011 to 2013

• ST-Ericsson, Grenoble, France, topic: "Test of Low Power Digital Systems", from 2011 to 2013

• Intel Mobile Communications, Sophia Antipolis, France, topic: "Test of Low Power SRAM Memories", from 2010 to 2013

• ANR EMYR "Enhancement of MRAM Memory Yield and Reliability", National Program, from 2010 to 2013 http://www.agence-nationale-recherche.fr/

• PICS (Projet International de Coopération Scientifique) with Politecnico di Torino, Italy, funded by CNRS, from 2010 to 2012

• ANR HAMLET "High Altitude Memory Test", National Program, from 2009 to 2011 http://www.agence-nationale-recherche.fr/

• Infineon Technologies, Sophia Antipolis, France, topic: "Test and Reliability of SRAM Memories", from 2008 to 2010

• CATRENE TOETS "Towards One European Test Solution", European Program, from 2009 to 2011 http://www.catrene.org/

• STMicroelectronics, Crolles, France, topic: "Diagnosis of Electrical Failures in Logic Designs", from 2006 to 2009

• MEDEA+ NanoTEST "Test Challenges for Nanometer Technologies", European Program, from 2005 to 2008 http://www.medea.org/

• ATMEL, Rousset, France, topic: "Test of Embedded FLASH Memories", from 2004 to 2007

• IST MARLOW "A central MARket place for dissemination of LOW-power microelectronics design knowledge", European Program, from 2002 to 2005 http://www.lowpower.org/

• MEDEA+ ASSOCIATE "Advanced Solutions for SOC Innovative Testing in Europe", European Program, from 2001 to 2004 http://www.medea.org/

• INTEL Corporation, Santa Clara, USA, topic: "BIST of Pipelined Sequential Circuits", from 2000 to 2001

• EUREKA MEDEA "Advanced Tools for Deep Submicron Design Project", European Program, from 1997 to 2001

• ESPRIT III ATSEC "Advanced Test Generation and Testable Design Methodology for Sequential Circuits", European Program, from 1992 to 1995

Partnership / Collaboration with Academia

• Anhui University, Heifei, China (since 2019)

• Beihang University, Beijing, China (since 2018)

• Laboratoire d'Informatique de Paris 6 (LIP6), Paris, France (since 2018)

• University Federico II, Napoly, Italy (since 2016)

• Institut Matériaux Microélectronique Nanosciences de Provence (IM2NP), Marseille, France (since 2013)

• Université of Jyväskylä, Finland (since 2013)

• TIMA Laboratory, Grenoble, France (since 2013)

• University of Massachusetts, Amherst, USA (since 2011)

• Institut d’Electronique du Sud (IES), University of Montpellier, France (since 2010)

• University of Connecticut, Storrs, CA, USA (since 2008)

• McMaster University, Hamilton, Canada (since 2008)

• Kyushu Institute of Technology, Fukuoka, Japan (since 2007)

• Duke University, Durham, NC, USA (since 2006)

• University of Southampton, United Kingdom (since 2005)

• Politecnico di Torino, Italy (since 2005)

• University of Nara, Japan (since 2003)

• University of Stuttgart, Germany (from 2000 to 2001)

• UPC, Barcelona, Spain (from 1998 to 2000)

• INESC, Lisbon, Portugal (from 1998 to 2000)

• LAG (Laboratoire d'Automatique de Grenoble) - INPG (from 1998 to 2001)

• Computer Science department of LIRMM (from 1996 to 2001)

Partnership / Collaboration with Industry

• Cypress Semiconductor, San Jose, USA (since 2013)

• DeFacTo Technologies, Grenoble, France (since 2013)

• DOCEA Power, Grenoble, France (since 2013)

• ATMEL, Nantes, France (since 2012)

• LSI Logic, Milpitas, , California, USA (since 2011)

• STMicroelectronics, Grenoble, France (since 2010)

• Crocus Technology, Grenoble, France (since 2010)

• ST-Ericsson, Grenoble, France (since 2010)

• Texas Instruments, Dallas, Texas, USA (since 2010)

• SynTest Technologies, Sunnyvalle, USA (since 2007)

• ATMEL, Rousset, France (since 2004)

• ST Microelectronics, Crolles, France (since 2003)

• Synopsys Inc., Mountain View, USA (from 2001 to 2004)

• Infineon Technologies, Sophia Antipolis, France (since 2001)

• Intel Corporation, Folsom, USA (in 2000)

• Lucent Technologies, Bell Labs (in 1996)

Partnership with Public Research Institutes

• CNES, Toulouse, France (since 2013)

• CERN, Geneve, Switzerland (since 2013)

• Rutherford Appleton Laboratory, Harwell Oxford Didcot, UK (since 2013)

• Jet Propulsion Laboratory, Passadena, USA (since 2012)

• Imec, Leuven, Belgium (since 2011)

• CEA-LETI, Grenoble, France (since 2011)

• CEA-LIST, Saclay, France (since 2005)

Invited Seminar in Industry

• 2018 : ChipMotion, Heifei, China
  
• 2017 : MediaTeck, Hsinchu, Taiwan
  
• 2014 : DOCEA Power et DeFacTo Technologies, Grenoble, France
  

• 2011 : Intel Mobile Communications, Sophia Antipolis, France

• 2011 : ST Microelectronics, Grenoble, France

• 2010 : ST-Ericsson, Grenoble, France

• 2009 : Faraday Technology Corporation, Hsin-Chu, Taiwan

• 2008 : Hitachi, Tokyo, Japon

• 2007 : ATMEL, Nantes, France

• 2006 : ST Microelectronics, Crolles, France

• 2002 : Philips Research, Eindhoven, The Netherlands

• 2002 : Infineon Technologies, Sophia Antipolis, France

• 2001 : Synopsys Inc., Mountain View, USA

• 2000 : Intel Corp., Santa Clara, USA

• 1996 : Lucent Technologies (Bell Labs), Murray Hill, USA