Patrick Girard  
CNRS Research Director
 
    Research Interests
 
 

My research interests include the various aspects of digital circuit and memory testing, with special emphasis on DfT, BIST, diagnosis, delay testing and power-aware testing. Reliability and fault tolerance of digital ICs, power modeling and estimation, design and test of 3D ICs, as well as test and reliability of approximate circuits are (or have been) also part of my research activities. Future research activities will concentrate on DFT for smart image sensors, AI for test and diagnosis of circuits and systems, and robustness of bio-inspired circuits. A detailed list of past and current topics investigated as part of my research activities is given below.


Delay Testing and Performance Verification

  • Delay Fault Simulation in Digital Circuits

  • BIST of Delay Faults in Digital Circuits

  • BIST of Delay Faults in FPGAs

  • Signal Integrity -Aware Pattern Generation for Delay Testing and Speed Binning

  • At-Speed Design-for-Test Techniques for Test Chip Validation

AI for Test and Diagnosis

  • BIST of Digital Circuits by Learning Techniques

  • Learning-Guided Cell-Aware Diagnosis of Automotive Customer Returns (ongoing)

  • Characterization of Defective Cell Libraries for Test and Diagnosis (ongoing)

Logic Diagnosis

  • Delay Fault Diagnosis in Digital Circuits

  • Diagnosis-Oriented ATPG for Digital Circuits

  • Fault Diagnosis of SoCs

Memory Testing

  • Test and Reliability of Embedded SRAM Memories

  • Test of Low Power SRAM Memories

  • Diagnosis of SRAM Memories (ongoing)

  • Test and Reliability of Embedded FLASH Memories

  • Test and Reliability of Magnetic RAM (MRAM) Memories

Power-aware Testing and Test Strategies for Low Power Devices

  • Low-Power BIST

  • Power-Aware At-speed Scan Testing

  • Test Strategies for Low-Power Digital Circuits

Power Modeling and Estimation

  • Power Estimation for CPU Cores

  • Circuit and Architectural-Level Power Modeling and Estimation

Reliability and Fault Tolerance

  • Design and Test of Fault-Tolerant Digital Structures (ongoing)

  • Radiation-Induced Effects on Electronic Systems and ICs

Design and Test of 3D ICs

  • Power and Thermal Analysis for 3D Integration

  • Addressing Power and Thermal Issues during Test of 3D ICs

Test and Reliability of Approximate Circuits

  • Test Solutions for Approximate Circuits (ongoing)

  • Reliability Analysis and Solutions for Approximate Circuits 

Test of Smart Image Sensors

  • Design for Test and On-Line Testing of Image Sensor Matrices (ongoing)

Robustness of Bio-Inspired Circuits

  • Robustness of NVM-Based Neural Networks for Image Processing in Space Environment (ongoing)