Michel Renovell  
Directeur de Recherche CNRS - ‘IEEE Distinguish Lecturer’  
 
Professionnal Activity
 
 

Committee Chair

2006-xxxx Co-Chair for Europe of the Semiconductor Test Consortium – University Group
2004-2005 VICE-CHAIR of the IEEE Test Technology Technical Council
2003-2004 Head of the French Test network (CNRS)
2000-2004 Chair of the Communication Group of the IEEE Test Technology Technical Council
1996-2000 Vice-Chair of the Technical Activity Group of the IEEE TTTC
1999-present Chair of the FPGA Testing Technical Activity of the IEEE TTTC

Permanent Editor of Journal

2006-present Editor of the Journal VLSI Design. Springer
2002-present Editor of the Journal IEEE Design & Test of Computers.
1998-present Editor of the Journal of Electronics Testing : Theory and Application (JETTA), Kluwer.

Awards

2006 Best Paper Award DELTA2006 conference Kuala Lumpur Malaysia
2005 Best Paper Award Latin American Test Workshop 2005 Buenos Aires Argentina
2003 Nominated IEEE Computer Society Core Member
2002 Meritorious Service Award of IEEE Computer Society (received Baltimore - USA)
2001 Teruhiko Yamada Memorial Award (received Kyoto – Japan)

Reviewer for International Publishers/Institutions

2003-2005 Reviewer for EEC Projects
2005 Reviewer for the Irish Science Foundation
2005 Reviewer for the Elsevier publisher
2005 Reviewer for the Morgan Kaufman Publishers
2004 Reviewer for the Dutch Agency for Technology (STW)
2003 Reviewer for the Canadian Science Foundation

General Chair of Conferences

2008 Co-General Chair of the Int. Design & Test of Integrated System 2008 (Tunisia)
2008 General Chair of the Int. Design & Diagnosis of Circuits and Systems 2008 (Slovaquia)
2006 Co-General Chair of the Int. Design & Test of Integrated System 2006 (Tunisia)
2004 General Chair of the European Test Symposium 2004 (France)
2004 Vice-General Chair of the East West Design & Test Workshop 2004 (Ukrain)
2003 Vice-General Chair of the European Test Workshop 2003 (Netherland)
2002 General Chair of the International Field Programmable Logic Conference 2002 (France)
2000 General Chair of the IEEE International Mixed Signal Testing Workshop 2000 (France)

Executive Committee

2004-present Chair of the Executive Committee of the the International DELTA conference
2003-present Member of the Executive Committee of the Iberchip-Project
2003-present Member of the Executive Committee of the European Test Symposium
2002-present Member of the Executive Committee of the the International DELTA conference
2002-present Member of the Executive Committee of the the Intern. Conf on Field Programmable Logic
2001-present Member of the Executive Committee of the International Workshop on Design and Diagnosis of Electronics Circuits.
2001-present Member of the Executive Committee of the International Conference on Design of Circuits and Integrated Systems.
2001 & 2003 Member of the Executive Committee of the International DATE Conference (Design And Test in Europe).
1999-present Member of the Executive Committee of the IEEE Intern. Mixed Signal Testing Workshop.

Program Chair

2008 Program Chair of the South Brazilian Conf. on Integrated Circuit 2007 Porto Alegre Brazil
2008 Program Chair of the International DELTA Symposium 2008 (Hong Kong)
2005 Program Chair of the European Test Symposium 2005 (Estonia)
2004 Program Chair of the International DELTA workshop 2004 (Australia)
2004 Vice-Program Chair of the IEEE Intern. Mixed Signal Testing Workshop 2004 (USA).
2003 Program Chair of the IEEE International Mixed Signal Testing Workshop 2003 (Spain).
2002 Program Chair of the International DELTA workshop 2002 (New Zealand)
2001 Program Chair of the International Conference on Design of Circuits and Integrated Systems 2001 (Portugal)
2001 Program Chair of the IEEE International Workshop on Design and Diagnosis of Electronics Circuits 2001 (Hungaria)
2000 Program Chair of the Intern. Conf. on Design of Circuits and Integ. Systems 2000 (France)
1999 Program Chair of the IEEE International Mixed Signal Testing Workshop 1999 (Canada)

Topic Chair

2007 Topic Chair of the Latin-American Test Workshop 2007 (Lima Perou)
2006-2007 Topic Chair of the European Test Symposium 2006 (England-UK)
2006 Topic Chair of the VLSI Test Symposium 2006 (Berkeley USA)
2002-present Topic Chair of the International Test Conference(ITC).
2001-present Topic Chair of the International DATE Conference (Design And Test in Europe).
1998-1999-2003 Topic Chair of the IEEE European Test Workshop 1998 – 1999 - 2003.
1997 Topic Chair of the International Conference on Innovative Systems 1997.

IEEE Tutorialist

2003-present IEEE Distinguish Lecturer

Tutorialist in International Conferences

2003-present IEEE Distinguish Lecturer
2004 Tutorial on FPGA Testing at the EWD&TC2004 Conference, Yalta, Ukrain.
2004 Tutorial on FPGA Testing at the AQTR2004 Conference, Cluj-Napoca, Romania.
2004 Tutorial on Defect Modeling at the DDECS2004 Conference, Bratislava, Slovaquia.
2004 Tutorial on FPGA Testing at the LATW2004 Conference, Cartagena, Colombia.
2003 Tutorial on FPGA Testing at the CSIT2003 Conference, Yerevan, Armenia.
2003 Tutorial on Analog Circuit testing at the ISCAS2003 Conference, Bangkok, Thailand.
2003 Tutorial on Defect Modeling at the IberChip2003 Conference, LaHavana, Cuba.
2002 Tutorial on FPGA testing at the DCIS2002 Conference, Santander, Spain..
2002 Tutorial on FPGA testing at the SBCCI2002 Conference, PortoAlegre, Brazil.
2002 Tutorial on FPGA testing at the International Test Conference 2002, Baltimore, USA.

Member of Organizing Committee

2006 Honorary Committee of the AQTR2006 Conference, Cluj-Napoca, Romania
2006 Europe Liaison for the IEEE Asian Test Symposium (Furooka, Japan).
2004-2005 Finance Chair of the IEEE VLSI Test Symposium (USA).
2003-2004 Panel Chair of the IEEE Latin-American Test Workshop (Natal, Brazil).
2003-2004 Publicity Chair of the IEEE Asian Test Symposium (Xian, China).
2003-2004 Publicity Chair of the IEEE International Workshop on Defect-Based Testing (USA).
2003 Publicity Chair of the IEEE VLSI Test Symposium (USA).
2002 Tutorial Chair of the IEEE Intern. Mixed Signal Testing Workshop 2002 (Switzerland).

Editor of Proceedings

2002 Editor of the International Field Programmable Logic Conference 2002 proceedings.
2002 Editor of the International DELTA workshop (New Zealand) 2002 proceedings.
2001 Editor of the IEEE Workshop on Design and Diag. of EC (Hungaria) 2001 proceedings.
2001 Editor of the Intern. Conference on Design of Cir. and Integ. Systems 2000 (Portugal).
2000 Editor of the Intern. Conference on Design of Cir. and Integ. Systems 2000 (France).

Member of Program Committee

ICCAD: 2006-present International Conference on CAD
ITC : 2002-present IEEE International Test Conference.
VTS : 2000-present IEEE International VLSI Test Symposium.
DATE : 99-present International Design And Test in Europe Conference.
ICCD : 2000-2002 International Conference on Circuit and Devices.
ETS : 96-present IEEE European Test Workshop/Symposium.
ATS : 2001-present IEEE Asian Test Symposium.
DBT : 2002-present IEEE International Workshop on Defect-Based Testing.
IMSTW : 97-present IEEE International Mixed Signal Testing Workshop.
TECS : 97-2003 IEEE International Workshop on Test of Embedded-Core Systems.
LATW : 2000-present IEEE Latin-American Test Workshop.
DDECS : 2000-present IEEE International Conference on Design and Diagnosis of Electronics Circuits.
ECS : 2001-present IEEE International Conference on Electronic Circuit and Systems.
ISIS : 1997 International Conference on Inovative System in Silicon.
EDCC : 1996 European Dependable Computing Conference.
EWDC : 2001 European Workshop on Dependable Computing.
DCIS : 96-present International Conference of Design of Circuits and Integrated Systems.
SBCCI : 98-present South-Brasilian Conference on Integrated Circuit.

PhD Supervisor

2006-xxxx Co-Supervisor of a PhD thesis in Slovenia
2006-xxxx Co-Supervisor of a PhD thesis in Iran
2005-xxxx Co-Supervisor of a PhD thesis in Brazil
2005-xxxx Co-Supervisor of a PhD thesis in Tunisia
1999-present Supervisor of 20 PhD students in France

Invited Paper

2005 International East-West Design & Test Workshop (Ukrania)
2005 Computer Science & Information Technology (Armenia)
2004 International Conference on Micro-Electronic (Tunisia)
2004 International Baltic Electronic Conference (Estonia)
2004 International System & Circuit Conference (Tunisia)
2003 International East-West Design & Test Conference (Ukrania)
2003 International Conference on Electronic Circuits and Systems (Slovaquia)
2001 International Symposium on Quality of Electron Devices (USA)
2000 International Test Conference (USA)
2000 International Conference on Field Programmable Logic (Austria)
1999 International Conference on Microelectronics (Algeria)
1998 Brasilian Conference on Integrated Circuit (Brazil)

Invited Seminar

2006 University of Cordoba (Argentina)
2006 University of Porto Alegre Brazil 2006 (Brazil)
2005 VirageLogic Yerevan (Armenia)
2003 Freiburg University 2003 (Germany)
2002 Stanford University 2002 (USA)
2000 CNES 2000 (France)
2000 AT&T Bell Labs Princeton 2000 (USA)
2000 University of Porto Alegre Brazil 2000 (Brazil)
2001 INTEL 2001 (USA)
98,99…02 University of Valence 98,99,00,01,02 (France)
99 Sunrise California 99 (USA)
99 Logic Vision California 99 (USA)
99 University of Rio de Janeiro 99 (Brazil)
98 University of Britsh Columbia (Canada)
98 University of Victoria 98 (Canada)
98 Quickturn California 98 (USA)
97 University of Sao Paolo 97 (Brazil)