JUNE 10, 2009 |
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8:30 - 8:45 |
Opening Session
Welcome message : Sule Ozev (ASU), IMS3TW General Chair
Program Introduction : Bozena Kaminska (SFU), IMS3TW Program Chair |
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08:50 - 10:50 |
SESSION 1 |
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Keynote: "Mixed-signal design automation - change you can believe in"
Mar Hershenson, Magma-DA, USA |
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Invited Talk: Wireless Interfacing with the Central Nervous System
Maysam Ghovanloo, Georgia Tech, USA |
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Mini-tutorial: A Holistic Approach to High-Speed IO BIST
Karim Arabi, Qualcomm, USA |
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10:50 - 11:10 |
Break |
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11:10 – 12:30 |
SESSION 2
Chair: Andre Ivanov, UBC, Canada |
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“General Design for Test (DfT) Guidelines for RF IC”
Qi Fan, Qualcomm |
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“A Versatile Technique for Evaluating Test Measurements at the Design Stage”
Haralampos-G. Stratigopoulos, Salvador Mir and Jeanne Tongbong, TIMA, France |
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“Demonstration of 20 Gbps Digital Test Signal Synthesis Using SiGe and InP Logic”
D.C. Keezer, C. Gray,D. Minier, P. Ducharme, Georgia Institute of Technology, Atlanta, Georgia, IBM, Bromont, Canada |
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12:30 - 13:30 |
Lunch |
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13:30 - 15:30 |
SESSION 3
Chair: Bernard Courtois, CMP, France |
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Invited Talk: "Cost-Effective Polymer Technologies for MEMS and Microfluidics"
Ash Parameswaran, SFU, Canada |
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Mini-tutorial: “MEMS in Structural Health Monitoring applications”
Andrew Richardson, U. Lancaster, UK |
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“A method for electrical calibration of MEMS accelerometers through multivariate regression”
N. Dumas, F. Azaïs, F. Mailly, P. Nouet, LIRMM, CNRS/U Montpellier, France |
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15:30 - 16:00 |
Break |
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16:00 - 17:30 |
SESSION 4
Chair: Adam Osseiran, Edith Crown U., Australia |
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“TAC: Testing Time Reduction for Digitally-Calibrated Designs”
Hsiu-Ming (Sherman) Chang and Kwang-Ting (Tim) Cheng, University of California, Santa Barbara, USA |
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“Mixed-Signal Testing Using Walsh Functions”
A. Tchegho, S. Sattler and H. Graeb, Germany |
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“Defect-Based Analog Fault Coverage Analysis using Mixed-Mode Fault Simulation”
Joonsung Parky, Srinadh Madhavapeddi , Alessandro Paglieri, Chris Barr and Jacob A. Abraham, University of Texas at Austin, Texas Instruments, Dallas |
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17:30 - 18:30 |
Free time |
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18:30 - 20:30 |
PANEL 1 & Reception
”Can we test heterogeneous systems?”
Moderator: Dave C. Keezer, Georgia Tech, USA
Organizer: Edmund Cretu, UBC, Canada |
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Panelists:
Ian McWalter, CMC Microsystems, Canada
Bernard Courtois, CMP, France
Marry Ann Maher, SoftMEMS, USA
Ash Parameswaran, SFU, Canada
Adam Osseiran, Edith Crown U., Australia |
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JUNE 11, 2009 |
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8:30 – 10:00 |
SESSION 5
Chair: Haralampos-G. Stratigopoulos, TIMA, France |
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“Using Stochastic Differential Equation for Assertion Based Verification of Noise in Analog/RF Circuits”
Rajeev Narayanan, Mohamed H. Zaki, and Sofiene Tahar, Concordia University Montreal, Canada |
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“BIST-Assisted Power Aware Self Healing RF Circuits”
Shyam Kumar Devarakond, Vishwanath Natarajan, Shreyas Sen and Abhijit Chatterjee, Georgia Institute of Technology, Atlanta, GA, USA |
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Invited Talk: “Multiple Energy Domain Simulation for Heterogeneous Systems Testing”
Mary Ann Maher, SoftMEMS, USA |
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10:00 - 10:30 |
Break |
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10:30 – 12:30 |
PANEL 2
”Analog/Mixed Signal Test: Bridging the gap between AMS and digital test”
Organizer: Sanjiv Taneja, Cadence, USA
Moderator: Sanjiv Taneja, Cadence, USA |
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Panelists:
Salem Abdennadher, Intel, USA
Tom Brennan, Advantest, USA
Jochen Rivoir, Verigy, USA
Jacob Abraham, University of Texas, Austin, USA |
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12:30 - 13:30 |
Lunch |
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13:30 - 15:00 |
SESSION 6
Chair: Florence Azais, LIRMM, CNRS/Univ. Montpellier, France |
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“Inkjet Printing of Micro-sensors”
Hussein Al-Chami and Edmond Cretu, UBC, Canada |
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“Dependable Reconfigurable Multi-Sensor Poles for Security”
Hans G. Kerkhoff, University of Twente, Enschede, the Netherlands |
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“Design for Modular Testing of a Multilayer Flexible Wireless Multisensor Platform”
Yindar Chuo, B. Kaminska, SFU, Canada |
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15:00 - 15:30 |
Break |
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15:30 – 17:30 |
SESSION 7
Chair: Edmund Cretu, UBC, Canada |
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“Accurate ADC Dynamic Testing by Means of the Three-Parameter Sine-Fit Algorithm”
Daniel Belega, Dominique Dallet, University of Timisoara, Romania, University of Bordeaux, France |
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“Two Improved Methods for Testing ADC Parametric Faults by Digital Input Signals”
Xiaoqin Sheng, Hans Kerkhoff, University of Twente, the Netherlands |
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“ADC Non-Linearity Low-Cost Test through a Simplified Double-Histogram Method”
M. A. Jalón, E. Peralías, Spain |
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“Vector Based Analog to Digital Converter Sequential Testing Methodology to Minimize ATE Memory and Analysis Requirements”
Sachin Dileep Dasnurkar and Jacob A. Abraham, University of Texas at Austin, USA |
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17:30 - 18:00 |
Break |
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18:00 – 19:30 |
PANEL 3
”AMS/RF/sensor testing: can alternate test or BIST replace functional test? Success stories and their limitations”
Organizer: Salvador Mir, TIMA, France
Moderator: Ismael Rex, TI Tucson, USA |
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Panelists:
Karim Arabi, Qualcomm, USA
Abhijit Chatterjee, Georgia Tech, USA
Craig Force, TI, USA
Hans Kerkhoff, U. Twente, Netherlands
Haralampos Stratigopoulos, TIMA, France |
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20:00 |
Social event, dinner |
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JUNE 12, 2009 |
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8:30 – 10:00 |
SESSION 8
Chair: Salvador Mir, TIMA, France |
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“Verification of Analog and Mixed Signal Designs using On-line Monitoring”
Hiwei Wang, Rajeev Narayanan, Naeem Abbasi,Mohamed H. Zaki, Ghiath Al Sammane, and Sofiene Tahar, Concordia University, Canada |
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“Closed-Loop Built-in-Self-Test for PLL Production Testing with Minimal Tester Resources”
Sachin D. Dasnurkar and Jacob A. Abraham, University of Texas at Austin |
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“Estimation of RF PAs’ nonlinearities after cross-correlating power supply current and output voltage”
Ricardo Veiga, José Machado da Silva, Pedro Mota, INESC Porto, Portugal |
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10:00 - 10:30 |
Break |
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10:30 – 11:00 |
SESSION 9
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Invited talk: “Intracortical microstimulation for creating vision : a multidisciplinary approach”
Mohamad Sawan, Ecole Polytechnique, Montreal, Canada |
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11:00 – 12:30 |
SESSION 10
Chair: Abhijit Chatterjee, Georgia Tech, USA |
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“Reconfigurable Dielectrophoretic Device for Neurotransmitters Sensing and Manipulation”
Mohamed Amine Miled and Mohamad Sawan, Ecole Polytechnique de Montreal, Canada |
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“Surface Plasmon Resonance Biosensor based on Vroman Effect : Towards Cancer Biomarker Detection”
Seokheun Choi and Junseok Chae, Arizona State University, USA |
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“Applications for Low Frequency Impedance Analysis Systems”
M. Giassa, A. Khosla, B. Gray, A. Parameswaran, K. Kholi, R. Rameseshan, SFU, Canada |
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CLOSING REMARKS |
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