JUNE 7, 2010

8:15 - 8:30

Opening Session

Welcome message: Florence AZAIS (LIRMM, France), IMS3TW General Chair
Program Introduction: Krishnendu CHAKRABARTY (Duke University, USA), IMS3TW Program Chair

08:30 - 09:15

KEYNOTE TALK 1
Chair: Bernard Courtois

"Integrated Calibration, Validation, and Test -- Rethinking Quality Management Through Reduce, Reuse, and Recycle"
Tim CHENG, University of California - Santa Barbara - USA

09:15 – 10:30

SESSION 1
Alternate testing for ADC, PLL and RF front-end modules
Chair: Michel Renovell

“Improved Method for SNR Prediction in Machine-Learning-Based Test”
Xiaoqin SHENG (University of Twente - Netherlands), Hans KERKHOFF (University of Twente - Netherlands)

“PLL Lock Time Prediction and Parametric Testing by Lock Waveform Characterization”
Sachin DASNURKAR (Qualcomm - USA), Jacob ABRAHAM (University of Texas - USA)

“Optimized digital compatible pulse sequences for testing of RF front end modules”
Aritra BANERJEE (Georgia Tech - USA), Shyam Kumar DEVARAKOND (Georgia Tech - USA), VISHWANATH NATARAJAN (Georgia Tech - USA), Shreyas SEN (Georgia Tech - USA), Abhijit CHATTERJEE (Georgia Tech - USA)

10:30 - 11:00

Break

11:00 – 12:15

SESSION 2
Defect modeling, fault detection & on-line diagnosis for MEMS devices
Chair: Andrew Richardson

“Modeling the influence of etching defects on the sensitivity of MEMS convective accelerometers”
Ahmed REKIK (LIRMM - France), Florence AZAIS (LIRMM - France), Norbert DUMAS (LIRMM - France), Frédérick MAILLY (LIRMM - France), Pascal NOUET (LIRMM - France)

“Simulation and monitoring of resonant frequency of MEMS for failure detection and prediction”
Szilard JAMBORHAZI (Budapest University of Technology and Economics - Hungary), Marta RENCZ (Technical Univ of Budapest - Hungary)

“Smart Drivers for Online Diagnosis of Electrostatic MEMS Actuators”
Norbert DUMAS (LIRMM - France), Latorre LAURENT (LIRMM - France), Frédérick MAILLY (LIRMM - France), Pascal NOUET (LIRMM - France)

12:15 - 14:00

Lunch

14:00 - 15:15

SESSION 3
Converter testing
Chair: Sebastian Sattler

"ADC Testing with Polyharmonics Signals"
Josef VEDRAL (CTU Prague - Czech Republic)

“An adaptive BIST for INL estimation of ADCs without histogram evaluation”
Antonio Jose GINES ARTEAGA (University of Seville - Spain), Eduardo Jose PERALIAS MACIAS (University of Seville - Spain), Adoracion RUEDA (University of Seville - Spain)

“ANC-based method for testing converters with random-phase harmonics”
Vincent KERZERHO (NXP/LIRMM - France), Philippe CAUVET (Ophtimalia - France), Serge BERNARD (LIRMM - France), Florence AZAIS (LIRMM - France), Mariane COMTE (LIRMM - France), Michel RENOVELL (LIRMM - France)

15:15 - 16:05

SESSION 4
Methodologies for virtual testing and mixed-signal test automation
Chair: Cecilia Metra

“DETECTOR: Design and Test Characterization of Mixed-Signal Power Cores”
Tiago MOITA (INESC-ID - Portugal), MARCELINO BICHO DOS SANTOS (IST/INESC-ID - Portugal), Carlos ALMEIDA (IST-UTL/INESC-ID - Portugal)

“Methodology of Virtual Testing of Trimmable Analog Circuits”
Udo SOBE (ZMD AG - Germany), Enno BöHME (ZMD AG - Germany), Karl-Heinz ROOCH (Fraunhofer IIS - Germany)

16:05 - 16:35

Break

16:35 - 18:15

PANEL
”The Role of Test in the Evolution and Maturation of Emerging Technologies”
Moderator: Jacob Abraham, University of Texas, USA
Organizer: Bernard Courtois, CMP, France

Panelists:
Tim Cheng, University of California, Santa Barbara, USA
Bozena Kaminska, Simon Fraser University, Canada
Pascal Nouet, LIRMM, CNRS/Univ. Montpellier 2, France
Salvador MIR, TIMA, Grenoble, France
Hans Kerkhoff, MESA+, Univ. Twente, The Netherlands

19:00 - 20:00

Welcome Reception

JUNE 8, 2010

08:30 - 09:15

KEYNOTE TALK 2
Chair: Bozena Kaminska

"Low-power implantable devices for onset seizures detection and subsequent treatment"
Mohamad SAWAN, Polytechnique Montreal- Canada

09:15 – 10:30

SESSION 5
MEMS design and fabrication & PV cell testing
Chair: Serge Bernard

“MEMS for Sensing High Current Overload”
Bruce KIM (The University of Alabama - USA), Rahim KASIM (Intel - USA)

“DESIGN AND FABRICATION OF 3D PRESSURE SENSORS ON FLEXIBLE SUBSTRATE”
Sebastien NAZEER (Unive Paris SUD - France), Emile MARTINCIC (Unive Paris SUD - France), Jean-Pierre NIKOLOVSKI (CEA Fontenay aux Roses - France), Jean-Paul GILLES (Universite Paris SUD - France), Elisabeth DUFOUR GERGAM (Universite Paris SUD - France), Moustapha HAFEZ (CEA Fontenay aux Roses - France)

“METHOD OF FABRICATING A CONVENIENT LIGHT SOURCE AND ITS EVALUATION IN PV CELL LABORATORY TESTING”
Jeydmer ARISTIZABAL (Simon Fraser University - Canada), Clint LANDROCK (Simon Fraser University - Canada), Bozena KAMINSKA (Simon Fraser University - Canada), Carlo MENON (Simon Fraser University - Canada)

10:30 - 11:00

Break

11:00 – 12:15

SESSION 6
RF and RFID testing
Chair: Mariane Comte

“Evaluation of Built-In Sensors for RF LNA response measurement”
J TONGBONG (TIMA - France), L ABDALLAH (TIMA - France), Salvador MIR (TIMA - France), Haralampos STRATIGOPOULOS (TIMA - France)

“A COMPARISON BETWEEN VOLTAGE AND TRUE POWER BASED EMBEDDED MEASUREMENTS FOR RF TESTING”
MACHADO DA SILVA (INESC Porto - Portugal), Pedro MOTA (INESC Porto - Portugal)

“Read-error-rate evaluation for RFID system on-line testing”
Gilles FRITZ (Grenoble INP - France), Vincent BEROULLE (INPG/ESISAR - France), Minh Duc NGUYEN (Grenoble INP - France), Oum-El-Kheir AKTOUF (Grenoble INP - France), Ioannis PARISSIS (Grenoble INP - France)

12:15 - 14:00

Lunch

14:00 - 16:00

SPECIAL SESSION
Testing Challenges – System Software and Hardware Perspectives
Chair: I. McWalter (CMC Microsystems, Canada)

"Design Verification, Test and Application of Sensium: An Ultra low Power Sensor Network Platform"
Nikolaos Kasparidis, Toumaz Technologies, UK

“3D IC System-In-Package (SiP) Test Challenges - Opportunities – Solutions”
Michael O’Sullivan, Cadence Design Systems, UK

“Testing and Verification of MEMS Based Systems - A Software Perspective”
Sebastien Cases; SoftMEMS EURL, France

“Challenges and New Strategies for Inertial MEMS Testing”
Maurus Tschirky, Acutronic, Switzerland

“MEMUNITY Expertise -- Exemplification by Means of Parameter Identification of Membranes”
Steffen Michael; IMMS, Germany

16:00 - 16:30

Break

16:30 - 17:20

SESSION 7
Microfluidic and medical applications
Chair: Hans Kerkhoff

“Test Metric Assessment of Microfluidic Systems through Heterogeneous Fault Simulation”
Thomas MYERS (University of Hull - United Kingdom), Ian BELL (University of Hull - United Kingdom)

“Novel Feature Assisting in the Prediction of sEMG Muscle Fatigue Towards Wearable Autonomous System”
Mohammed AL-MULLA (Essex University - United Kingdom)

18:45 - 23:00

Social Event

JUNE 9, 2010

08:45 - 09:35

SESSION 8
Dependability and reliability
Chair: Bruce Kim

"Dependable Digitally-Assisted Mixed-Signal IPs Based on Integrated Self-Test & Self-Calibration"
Hans KERKHOFF (University of Twente - Netherlands), Jinbo WAN (University of Twente - the Netherlands)

"Self-Checking Monitor for NBTI Due Degradation"
Cecilia METRA (Università di Bologna - Italy), Martin Eugenio OMANA (University of Bologna - Italy), Daniele ROSSI (University of Bologna - Italy), Nicolo BOSIO (University of Bologna - Italy)

09:40 – 10:30

SESSION 9
Converter auto-correction and self-trimming
Chair: Haralampos Stratigopoulos

“Adaptive LUT-based System for In Situ ADC Auto-correction”
Serge BERNARD (LIRMM - France), Florence AZAIS (LIRMM - France), Mariane COMTE (LIRMM - France), Olivier POTIN (LIRMM - France), Vincent KERZERHO (NXP/LIRMM, France), Michel RENOVELL (LIRMM - France)

“Comparator based self-trim and self-test scheme”
HANS MARTIN VON STAUDT (Dialog Semiconductor - United Kingdom)

10:30 - 11:00

Break

11:00 – 12:15

SESSION 10
Testing high-speed signals
Chair: Salvador Mir

“AM demodulation of analog/RF signals using digital tester channels”
Florence AZAIS (LIRMM - France), Nicolas POUS (LIRMM - France), Laurent LATORRE (LIRMM - France), Jochen RIVOIR (Verigy Germany GmbH - Germany)

“Jitter Characterization of Incoherently Sub-Sampled High-Speed Digital Signals”
Hyun CHOI (Georgia Tech - USA), Abhijit CHATTERJEE (Georgia Tech - USA)

“Extending a DWDM Optical Network Test System to 10 Gbps x4”
DAVID C KEEZER (Georgia Tech - USA), Carl GRAY (Georgia Tech - USA)

12:15 - 14:00

Lunch

14:00 - 14:50

SESSION 11
Analog test signal generation and charge-to-digital conversion
Chair: David Keezer

"Guidelines for the efficient design of sinewave generators for analog/mixed-signal BIST"
Manuel BARRAGAN (IMSE-CNM - Spain), Diego VAZQUEZ (IMSE-CNM-CSIC - Spain), Adoracion RUEDA (IMSE-CNM - Spain), JOSE L HUERTAS (Universidad De Sevilla - Spain)

“A New Method of Charge-to-Digital Conversion”
MAREK MISKOWICZ (AGH University of Science and Technology - Poland), DARIUSZ KOSCIELNIK (AGH University of Science and Technology - Poland)

14:50 - 15:00

CLOSING REMARKS