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| ARCHIVES [back to News] |
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| IMSTW'07 Paper |
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"Fully-Efficient ADC Test Technique for ATE with Low
Resolution Arbitrary Wave Generators",
IEEE Internationnal Mixed-Signal workshop, IMSTW'07. |
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| Open Paper |
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Presentation |
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| ETS: "Best Paper Award" for ISyTest Researchers |
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| As a result of outstanding collaboration between NXP and
the LIRMM at ISyTest, Vincent Kerzérho (PhD student NXP/LIRMM),
Philippe Cauvet (SiP Program Test Manager, NXP), Serge Bernard
, Florence Azaďs, Mariane Comte and Michel Renovell (LIRMM
Researchers) received the Best Paper Award at the European
Test Symposium 2007 held in Freiburg (Germany). Their paper
is entitled: "Analog Network of Converters: A DfT Technique
to Test a Complete Set of ADCs and DACs Embedded in a Complex
SiP or SoC". It presents the development of a test method
for analog/digital converters and digital/analog converters
embedded in System-in-Package. Their new test method has two
main features: use of a low-cost tester and a reduced number
of external access points. Serge:"This work is an illustration
of the merit of this close collaboration betweeen the LIRMM
and NXP". Philippe: "The work Vincent has carried out since
the start of his thesis is now recognised for its true value."
For Vincent, participating in this type of conference is very
instructive: "You can see how other people work within the
same field of application." The project is currently in the
experimental validation phase. Internal clients can expect
to use this new procedure in 3 to 4 months. About
ETS: (http://www.ieee-ets.org/)
ETS, the European Test Symposium, is the most important
conference on testing in Europe. It attracts almost 200
researchers and engineers from around the globe each year.
The best paper is selected according to 3 criteria: reviews
by experts, quality of presentation and the audience's opinion.
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Schéma :
"Analog network of converters", a DfT solution
for testing several ADCs and DACs embedded in a SiP
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| Open
Presentation |
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| ISyTest Inauguration : March 27th, 2007 |
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| The ISyTest joint lab is the fruit of dynamic collaboration
between partners: Franck Murray (Director of technology NXP
France), Michel Robert (Director of LIRMM), Pierre Guillon
(Director of Department ST2I, CNRS), Anne-Yvonne Le Dain (Vice-President
of the Languedoc Roussillon region), Jean-Louis Cuq (President
of Montpellier University), Jean-Noël Palazin (Strategy
and Partnership NXP France), Philippe Cauvet and Serge Bernard
(Co-Directors of ISytest, representing NXP and LIRMM respectively),
Marie-Lise Flottes (Director of LIRMM's Microelectronics Department). |
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| On 27 March 2007, NXP France, the CNRS and the University
of Montpellier 2 inaugurated ISyTest, an institute for test
innovation dedicated to integrated system solutions. The objective
of this shared lab is to develop new test methodologies for
SiP (System-in-Package) technologies, and more generally for
SoC (System-on-Chip). |
Stéphanie Poggi |
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Webmaster: S. Belin |
Last Update: June 30th, 2008 |
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