Workshop on SecURity, REliAbiLity, test, prIvacy, Safety and Trust of Future Devices
May 31 - June 01, 2018 - Bremen (Germany)


Relationship between reliability/testability and security is contradictory: reliability addresses issues related with malfunctioning of devices which might naturally happen, while security aims at defeating malicious attempts of altering the normal behavior of a device.
While techniques from one domain can be applied to the other, requirements of one domain can be in significant contrast with the second one.
Besides these issues, with the advance of new research directions such as IoT, Wearable Devices, Cyber Physical Systems, and Autonomous driving, a set of additional properties have to be guaranteed in future devices, including safety, trust and privacy. Even more than before, requirements of one property can be in significant contrast with another one. The proposed workshop addresses this problem aiming at bringing together the involved communities to foster fruitful discussions and collaborations among researchers.

Call for Contributions

We are seeking the submission of short papers discussing the connection and the contradictions of the six topics addressed by the workshop (reliability, test, safety, security, trust, privacy). We accept scientific works, preliminary results, ideas that can generate new insights and that can open a discussion during the workshop.

Perspective authors are invited to submit the title and a short paper (max 2 pages) of the proposed contribution. Accepted papers will be distributed to the workshop attendees.

Download the Call for Contributions


Submission deadline: March 20, 2018

Notification of acceptance: April 6, 2018


Click here to submit your contribution.


Giorgio Di Natale
LIRMM - CNRS / Université Montpellier
161 rue Ada
34095 Montpellier Cedex 5 France

Francesco Regazzoni
ALaRI - USI, Lugano
Università della Svizzera italiana
Via G. Buffi 13 - 6904 Lugano, Switzerland


SURREALIST'18 will take place at the Swissôtel Bremen in the north of Germany, in conjunction with the 23rd IEEE European Test Symposium (ETS18).

Swissotel Bremen
Hillmannplatz 20,
28195 Bremen

More details


The registration to the workshop is handled by the organizers of ETS18.

Register here


Thursday, May 31st, 2018

16:30-16:40 Opening

16:40-17:40 Invited speaker 1

  • Functional Safety and Security: the Challenges in Developing IP for These Markets
  • Pete Harrod, ARM

    17:40-19:00 Regular session 1

  • Comparison of American and European Approaches in RNG online and offline testing
  • Viktor Fischer

  • Security of the robotic ARM/PLOTTER
  • Milena Djukanovic, Luka Radunovic

  • Detection and Defense against Covert Channel Cyber-attack over video stream payload
  • Ofer Hadar, Raz Birman, Yoram Segal and Eldad Hadas

  • Model-Driven Analysis of Security, Reliability, Test, Privacy, Safety and Trust of IoE Services
  • Eugenio Villar

    Friday, June 1st, 2018

    08:30-09:30 Invited Speaker 2

  • Cyber Security and Functional Safety - a couple with a complicated relationship
  • Albrecht Mayer, Infineon automotive microcontroller

    09:30-10:30 Panel

    Safety: Albrecht Mayer, Infineon automotive microcontroller

    Trust: Georg Becker, ESMT Berlin

    Privacy: Eugenio Villar, Universidad de Cantabria

    Security: Benedikt Gierlichs, KU Leuven

    Reliability: H.J. Wunderlich, U. Stuttgart

    Test: Yervant Zorian, Synopsys

    10:30-11:00 Coffee Break

    11:00-12:20 Regular Session 2

  • Area-Efficient Memristor-Crossbar-Based Error Correcting Code Circuit
  • Mamoru Ishizaka, Michihiro Shintani and Michiko Inoue

  • Laser Attacks against DDR Redundancy
  • Paolo Maistri, Jean-Max Dutertre, Regis Leveugle

  • The PDL-RO-PUF: using programmable delay lines in RO-PUFs to drastically increase area efficiency
  • Linus Feiten, Karsten Scheibler, Bernd Becker, Matthias Sauer

  • Scan Chain Encryption in Test Standards
  • Mathieu Da Silva

    12:20-14:00 Lunch Break

    14:00-15:00 Invited Speaker 3: Paolo Prinetto, Politecnico di Torino

    15:00-16:00 Special Session: Nano Security: From Nano-Electronics to Secure Architectures (Organizer: Ilia Polian)

  • Security aspects of BiFeO3 memristive devices
  • Nan Du, Danilo Burger, Ramona Ecke, Stefan E. Schulz, Heidemarie Schmidt

  • Security threats in nanoscale FPGA fabric
  • Dennis Gnad, Mehdi Tahoori

  • Impact of nano-electronics on microarchitectural side-channels
  • Johanna Sepulveda, Georg Sigl

    In conjunction with ETS18

    This event is organized as fringe workshop of the 23rd IEEE European Test Symposium, organized in Bremen from May 28 to June 01, 2018

    More Details