MEMS Testing

• "A Behavioral Model of MEMS Convective Accelerometers for the Evaluation of Design and Calibration Strategies at System Level", Journal of Electronic Testing, Volume 27, Number 3, pp. 411-423, June 2011,
  
• “A Dependable Micro-Electronic Peptide Synthesizer Using Electrode Data”, VLSI Design, Hindawi Publishing Corporation, Volume 2008, 9 pages.
• “Study of an electrical setup for capacitive MEMS accelerometers test and calibration”, Journal of Electronic Testing, theory and applications, 26: 111-125, March 10, 2010.
  

MEMS conditioning and read-out electronics

• “Improvement of Power Supply Rejection Ratio in Wheatstone-bridge based piezoresistive MEMS”, Analog Integrated Circuits and Signal Processing, Vol. 71, Iss. 1, pp. 1-9, 2012.
• “Study of First-Order Thermal S-D Architecture for Convective Accelerometers”, Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS, DTIP 2008, p.100-104.
• “Design of Smart Drivers for Electrostatic MEMS Switches”, Sensors and Actuators A: Physical, Vol. 167, Issue 2, Pages: 422-432, June 2011.

Convective accelerometers

• “Noise analysis of a first-order thermal sigma-delta architecture for convective accelerometers”, Analog Integrated Circuits and Signal Processing, 2010, Volume 63, Number 3, Pages 415-423.
  
• “A Closed-Loop Architecture with Digital Output for Convective Accelerometers” IEEE Computer Society Annual Symposium on VLSI, ISVLSI'08, 7-9 April 2008, Page(s): 51–56.
• “HDL modeling of convective accelerometers for system design and optimization”, Sensors and Actuators A: Physical, Vol. 142, pp. 178-184, March 2008.

MEMS design (Caracterisation, modeling, ...)

• “A Fully Integrated Inertial Measurement Unit: Application to Attitude and Heading Determination”, IEEE Sensors Journal, vol.11, no.11, pp.2852-2860, Nov. 2011.
  
• “Nonlinear mechanism in MEMS devices for energy harvesting applications”, Journal of Micromechanics and Microengineering, 12 pp., Vol.20, Iss.12, December 2010.
  
• “Analytical and Finite-Element Modeling of Localized-Mass Sensitivity of Thin-Film Bulk Acoustic-Wave Resonators (FBAR)”, IEEE Sensors Journal, vol. 9, no. 8, pp. 892-901, Aug. 2009.
  
• «Automated on-wafer extraction of equivalent-circuit parameters in thin-film bulk acoustic wave resonators and substrate”, Microwave and Optical Technology Letters, Vol. 50, n° 1, Pages : 4-7, 2008.
• “An approach to integrate MEMS into high-level system design flows”, Circuits and Systems and TAISA Conference, NEWCAS-TAISA 2008, 22-25 June 2008, Page(s): 273–276.
• “A CMOS Multi-sensor System for 3D Orientation Determination” IEEE Computer Society Annual Symposium on VLSI, ISVLSI, 7-9 April 2008, Page(s): 57–62.

• “A Physics-Based Compact Model for ESD Protection Diodes under Very Fast Transients”, 30^th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2008, 7-11 Sept. 2008, Page(s): 67-75.
• “Characterization of the transient behavior of gated/STI diodes and their associated BJT in the CDM time domain”, Microelectronics Reliability, Vol. 49, Iss. 12, Dec. 2009, pp. 1424-1432.

Latest invited talks

• « Conception de Microsystèmes Monolithiques Testables et Robustes aux Variations de Process », Ecole d'hiver Francophone sur les Technologies de Conception des systèmes embarqués Hétérogènes, Grand Hôtel de Paris, Villard-de-Lans, 10-12 janvier 2007.
• « Challenges in MEMS Manufacture Testing and embedded test solutions », NTC (Northern Test Center) Remote and Embedded Testing Seminar, Pohto, Oulu, Finlande, May 29^th, 2007.
• « Motionless testing of embedded inertial sensors », Design, Test & Manufacturing Technologies for Integrated Micro & Nano systems Summit, Lancaster, October 1^st-4^th, 2007.

• « Electrostatic discharge protection device comprising several thyristors», US patent relative to the protection of Integrated Circuits against ESD, 2006.
• « Gated thyristor and related system and method », US extension of a French patent relative to the protection of Integrated Circuits against ESD, 2008. 
• «Circuit d'amplification d'un signal représentant une variation de résistance d'une résistance variable et capteur correspondant», French patent application relative to low-power, high resolution conditioning of resistive sensors.