- B. Al-Hashimi - Univ. of Southampton, UK
- M. Alioto - University of Sienna, Italy
- A. Alvandpour - Linkoping Univ., Sweden
- N. Azemard - LIRMM, France
- D. Bertozzi - Univ. di Bologna, Italy
- L. Bisdounis - INTRACOM, Greece
- A. Bogliolo - Univ. di Urbino, Italy
- J. A. Carballo - IBM, USA
- N. Chang - Seoul National Univ., Korea
- J. Figueras - Univ. Catalunya, Spain
- E. Friedman - Univ of Rochester, USA
- C. E. Goutis - Univ. Patras, Greece
- E. Grass - IHP, Germany
- J. L. Güntzel - Univ. Fed. de Pelotas, Brazil
- P. Girard - LIRMM, France
- R. Hartenstein - Univ. Kaiserslautern, Germany
- R. Jakushokas – Univ. of Rochester, USA
- J. Juan Chico - Univ. Sevilla, Spain
- N. Julien-Talon - Lester, France
- K. Karagianni - Univ. of Patras, Greece
- S. Khatri - Univ. of Colorado, USA
- P. Larsson-Edefors - Chalmers T. U., Sweden
- P. Marchal - IMEC, Belgium
- P. Maurine- LIRMM, France
- V. Moshnyaga - Univ. Fukuoka, Japan
- W. Nebel - Univ. Oldenburg, Germany
- D. Nikolos – Univ. of Patras, Greece
- J. A. Nossek - T. U. Munich, Germany
- A. Nunez - Univ. Las Palmas, Spain
- V.G. Oklobdzija - U. California Davis, USA
- V. Paliouras – Univ. of Patras, Greece
- M. Papaefthymiou - Univ. Michigan, USA
- F. Pessolano - Philips, The Netherlands
- H. Pfleiderer - Univ. Ulm, Germany
- C. Piguet - CSEM, Switzerland
- M. Poncino - Univ. di Verona, Italy
- R. Reis - Univ. Porto Alegre, Brazil
- M. Robert - Univ. Montpellier, France
- A. Rubio - Univ. Catalunya, Spain
- D. Sciuto - Politecnico di Milano, Italy
- D. Soudris - Univ. Thrace, Greece
- J. Sparsø - DTU, Denmark
- A. Stauffer - EPFL, Lausanne
- T. Stouraitis - Univ. Patras, Greece
- A. M. Trullemans - Univ. LLN, Belgium
- J. Vounckx - IMEC vzw, Belgium
- R. Zafalon - STMicroelectronics, Italy
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