SmartIES: Smart Integrated Electronic Systems

The SmartIES (Smart Integrated Electronic Systems) team focuses on design methods and modeling devices, systems, and integrated circuits. These activities comprise the development of methods, tools, and principles based on physical or electrical simulation approaches. Our main contributions include work on the continuity and extension of, or break with, Moore’s law, the impact of emerging technologies (FDSOI and FINFET) on design methods or functional block architectures, integration approaches (3D stacking and 3D monolithic integration), and heterogeneous integration with novel devices (MRAM, Carbon Nanotubes) on inte-grated circuits. This research is usually paralleled by technological demonstrations (specific circuits, bench experiments, model integration in simulators, etc.), which allow us to illustrate our work with practical examples relating to the transversal research lines of the Department.

Research topics

The design of integrated circuits and systems meeting power and delay constraints has relied upon the continued scaling of silicon CMOS technology. But in the advent of Internet of Things (IoT) and Artificial Intelligence (AI), applications are evolving and demand processing of massive amount of data. Moreover, such applications impose stringent constraints on energy efficiency, performance, reliability and security. In this context, SmartIES aims at developing innovative design solutions with advanced CMOS or emerging technologies.

SmartIES activities are organized in three areas:

Emerging technologies and Advanced CMOS

Keywords: 3D integration, Carbon Nanotubes, Quantum computing, Adiabatic Logic, MRAM, MEMS/NEMS, CNT based biosensors, advanced analogue design, adaptive design solutions, statistical based design, low power design.

SmartIES investigates materials beyond silicon, which could help create the next generation of ICs. Carbon nanotubes are one-dimensional (1D) material and are among the contenders for energy efficient electronics. Other promising contenders are the two-dimensional (2D) materials (graphene, MoS2, etc.) as well as the vertical stacks of different two-dimensional materials known as Van Der Waals heterostructures.
Similarly, spintronics based memory is considered as a potential low power alternative to replace CMOS memory. In the quest of energy efficiency, SmartIES explorezs vertical integration such as three-dimensional (3D) stacking and monolithic 3D (M3D) integration to enable higher functionality, small form factor and heterogeneous implementation. Moreover, novel computing paradigms (adiabatic reversible logic, neuromorphic and quantum computing) are investigated to re-think how architectures and systems are designed to optimize power, performance and reliability.
But before, designing ICs with these emerging technologies necessitates the foundation of behavioral and realistic models for devices, interconnects and memory cells. Therefore, our research focuses on developing physics-driven electrical, thermal, reliability and statistical models to investigate various technology parameters such as process variation, temperature, noise, performance, power consumption and overall energy efficiency.
In recent years, we have researched on:

- Physics-driven modeling and simulation for devices and interconnects based on 1D and 2D materials for integrated circuits regarding power, performance, reliability, adaptability and scalability.
- Exploiting novel 1D/2D field-effect devices for biosensing applications.
- Physics-driven modeling and simulation for magnetic MRAM memories in integrated circuits and study their performance and reliability under temperature variations.
- Modeling and design of micro- and nano-electromechanical switches (MEMS/NEMS)
- Physical design and optimization techniques for energy efficient and reliable system design while considering process variations.
- Design space exploration of various integration schemes such as 3D stacking and monolithic 3D integration for large-scale energy efficient system design
- Exploring novel computing paradigms such as adiabatic reversible logic, neuromorphic computing and quantum computing.

Adaptive Sensors and Multi-Sensors Systems

Keywords: Data Fusion, Biosensors, Life and Environment Monitoring, Sensors for Physiological signal Communicating Systems, Bio Impedance Sensing, Signal Processing.

SmartIES develops sensors and/or associated conditioning electronics for specific or generic applications. Specific systems were developed for micro-system conditioning, bioelectric signal measurement (peripheral nervous system), intra-ocular pressure measurement (glaucoma diagnosis or prevention), bio-impedance spectroscopy (fat content, vitellogenesis in fish) and CNT-FET based biosensors (cancer-related enzymatic activity).
Moreover, generic interfaces for resistive or capacitive sensors are developed for conditioning and analog-to-digital signal conversion. They are in particular based on architectures or oscillators and are characterized as being compact, robust, adaptive, low-power and the nearest possible to the sensor.
SmartIES also designs connected multi-sensor systems. Main addressed applications are inertial navigation and marine species monitoring (tuna, marlin, turtles) both in terms of geolocation and physiological parameters measurements.
Last, the constant decreasing of the price of sensors enables heavy redundancy in system design. SmartIES develops data-fusion algorithms based on artificial neural networks, complementary filtering or dynamic weightening in order to improve resolution or robustness of these measurement systems.

Secure Integrated Circuits and Systems

Keywords: Side-Channel Attacks, Fault Injection, embedded cryptography, integrated countermeasures, IC integrity and authenticity, statistical and learning techniques, Signal Processing.

SmartIES aims at developing innovative solutions for designing and characterizing secure integrated circuits and systems against various attacks (side-channel and fault injection) aiming at denial of service or at extracting secret information. More precisely, smartIES has developed expertise related to the exploitation of electromagnetic (EM) waves and works at :

- Identifying unrevealed threats and new fault injection and side-channel attacks,
- Modeling the EM leakages and the impact of EM interference on ICs,
- Developing tools and platforms for an efficient characterization of ICs,
- Providing solutions to evaluate security during the design flow of ICs,
- Defining hardware countermeasures at the right cost,
- Developing solutions to detect hardware Trojans and counterfeits.

These activities are carried out through collaborative projects with industry, academics and government agencies or through direct partnerships. Technological transfers have been done towards some of our partners aiming notably at using our EM fault or Body Bias injection solutions; SmartIES being pioneer in this area.

Members

Staff

Associates & Students

Publications 2014 - 2019: Evaluation period

International Journals

2019

  1. From theory to practice: horizontal attacks on protected implementations of modular exponentiations
    Ibrahima Diop, Yanis Linge, Thomas Ordas, Pierre-Yvan Liardet, Philippe Maurine
    Journal of Cryptographic Engineering, Springer, 2019, 9 (1), pp.37-52. ⟨10.1007/s13389-018-0181-1⟩. ⟨lirmm-01713147⟩.
  2. Investigation of Pt-Salt-Doped-Standalone-Multiwall Carbon Nanotubes for On-Chip Interconnect Applications
    Jie Liang, Rongmei Chen, Raphaël Ramos, Jaeyoung Lee, Hanako Okuno, Dipankar Kalita, Vihar P. Georgiev, Salim Berrada, Toufik Saadi, Benjamin Uhlig, Katherina Lilienthal, Abitha Dhavamani, Fabian Konemann, Bernd Gotsmann, Bingan Chen, Asenov Asen, Jean Dijon, Aida Todri-Sanial
    IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, In press, pp.1-7. ⟨https://ieeexplore.ieee.org/document/8664183⟩. ⟨10.1109/TED.2019.2901658⟩. ⟨lirmm-02082869⟩.
  3. Low-Cost Digital Test Solution for Symbol Error Detection of RF ZigBee Transmitters
    Thibault Vayssade, Florence Azaïs, Laurent Latorre, Francois Lefèvre
    IEEE Transactions on Device and Materials Reliability, Institute of Electrical and Electronics Engineers, 2019, 19 (1), pp.16-24. ⟨10.1109/TDMR.2019.2898769⟩. ⟨lirmm-02077048⟩.
  4. Tagging Atlantic bluefin tuna from a farming cage: An attempt to reduce handling times for large scale deployments
    Tristan Rouyer, Sylvain Bonhommeau, Nicolas Giordano, Saviour Ellul, Giovanni Ellul, Simeon Deguara, Bertrand Wendling, Mohamed Moez Belhaj, Vincent Kerzérho, Serge Bernard
    Fisheries Research, Elsevier, 2019, 211, pp.27-31. ⟨10.1016/j.fishres.2018.10.025⟩. ⟨lirmm-01938880⟩.
  5. A global database of water vapor isotopes measured with high temporal resolution infrared laser spectroscopy
    Zhongwang Wei, Xuhui Lee, Franziska Aemisegger, Marion Benetti, Max Berkelhammer, Mathieu Casado, Kelly Caylor, Emanuel Christner, Christoph Dyroff, Omaira Garcìa, Yenny González, Timothy Griffis, Naoyuki Kurita, Jie Liang, Mao-Chang Liang, Guanghui Lin, David Noone, Konstantin Gribanov, Niels Munksgaard, Matthias Schneider, François Ritter, Hans Christian Steen-Larsen, Christine Vallet-Coulomb, Xuefa Wen, Jonathon Wright, Wei Xiao, Kei Yoshimura
    Scientific Data , Nature Publishing Group, 2019, 6, pp.180302. ⟨10.1038/sdata.2018.302⟩. ⟨hal-02009630⟩.
  6. Breaking the speed-power-accuracy trade-off in current mirror with non-linear CCII feedback
    Mohan Julien, Serge Bernard, Fabien Soulier, Vincent Kerzérho, Guy Cathébras
    Microelectronics Journal, Elsevier, 2019, 83, pp.77-85. ⟨10.1016/j.mejo.2018.11.016⟩. ⟨lirmm-01954318⟩.

2018

  1. Effects of extraction method and storage of dry tissue on marine lipids and fatty acids
    Fany Sardenne, Nathalie Bodin, Luisa Métral, Anaïs Crottier, Fabienne Le Grand, Antoine Bideau, Blandine Brisset, Jérôme Bourjea, Claire Saraux, Sylvain Bonhommeau, Vincent Kerzérho, Serge Bernard, Tristan Rouyer
    Analytica Chimica Acta, Elsevier Masson, 2018, 1051, pp.82-93. ⟨10.1016/j.aca.2018.11.012⟩. ⟨lirmm-01938883⟩.
  2. A high-reliability and low-power computing-in-memory implementation within STT-MRAM
    Liuyang Zhang, Erya Deng, Hao Cai, You Wang, Lionel Torres, Aida Todri-Sanial, Youguang Zhang
    Microelectronics Journal, Elsevier, 2018, 81, pp.69-75. ⟨10.1016/j.mejo.2018.09.005⟩. ⟨lirmm-01880058⟩.
  3. Atomistic to Circuit-Level Modeling of Doped SWCNT for On-Chip Interconnects
    Jie Liang, Jaehyun Lee, Salim Berrada, Vihar Georgiev, Reetu Raj Pandey, Rongmei Chen, Asen Asenov, Aida Todri-Sanial
    IEEE Transactions on Nanotechnology, Institute of Electrical and Electronics Engineers, 2018, 17 (6), pp.1084-1088. ⟨10.1109/TNANO.2018.2802320⟩. ⟨lirmm-01795792⟩.
  4. System-level simulations of multi-sensor systems and data fusion algorithms
    Josué Manuel Rivera Velázquez, Frédérick Mailly, Pascal Nouet
    Microsystem Technologies, Springer Verlag, 2018, &#x27E8;10.1007/s00542-018-4204-8&#x27E9;. &#x27E8;lirmm-01919558&#x27E9;. <10.1007/s00542-018-4204-8>
  5. Power Supply Noise Aware Task Scheduling on Homogeneous 3D MPSoCs Considering the Thermal Constraint
    Ying-Lin Zhao, Jianlei Yang, Weisheng Zhao, Aida Todri-Sanial, Yuanqing Cheng
    Journal of Computer Science and Technology, Springer Verlag, 2018, 33 (5), pp.966-983. &#x27E8;10.1007/s11390-018-1868-6&#x27E9;. &#x27E8;lirmm-01879928&#x27E9;.
  6. Variability Study of MWCNT Local Interconnects Considering Defects and Contact Resistances - Part II: Impact of Charge Transfer Doping
    Rongmei Chen, Jie Liang, Jaehyun Lee, Vihar P. Georgiev, Raphael Ramos, Hanako Okuno, Dipankar Kalita, Yuanqing Cheng, Liuyang Zhang, Reetu Raj Pandey, Salvatore Amoroso, Campbell Millar, Asenov Asen, Jean Dijon, Aida Todri-Sanial
    IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2018, 65 (11), pp.4963-4970. &#x27E8;10.1109/TED.2018.2868424&#x27E9;. &#x27E8;lirmm-01879940&#x27E9;.
  7. Variability Study of MWCNT Local Interconnects Considering Defects and Contact Resistances - Part I: Pristine MWCNT
    Rongmei Chen, Jie Liang, Jaehyun Lee, Vihar P. Georgiev, Raphael Ramos, Hanako Okuno, Dipankar Kalita, Yuanqing Cheng, Liuyang Zhang, Reetu Raj Pandey, Salvatore Amoroso, Campbell Millar, Asenov Asen, Jean Dijon, Aida Todri-Sanial
    IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2018, 65 (11), pp.4955-4962. &#x27E8;https://ieeexplore.ieee.org/document/8465994/&#x27E9;. &#x27E8;10.1109/TED.2018.2868421&#x27E9;. &#x27E8;lirmm-01879935&#x27E9;.
  8. Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults
    Raphael Andreoni Camponogara-Viera, Jean-Max Dutertre, Marie-Lise Flottes, Olivier Potin, Giorgio Di Natale, Bruno Rouzeyre, Rodrigo Possamai Bastos
    Microelectronics Reliability, Elsevier, 2018, 88-90 (29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2018)), pp.128-134. &#x27E8;10.1016/j.microrel.2018.07.111&#x27E9;. &#x27E8;hal-01893676&#x27E9;.
  9. Understanding Electromigration in Cu-CNT Composite Interconnects: A Multiscale Electrothermal Simulation Study
    Jaehyun Lee, Salim Berrada, Fikru Adamu-Lema, Nicole Nagy, Vihar P. Georgiev, Toufik Sadi, Jie Liang, Raphael Ramos, Hamilton Carrillo-Nunez, Dipankar Kalita, Katharina Lilienthal, Marcus Wislicenus, Reetu Raj Pandey, Bingan Chen, Kenneth B. K. Teo, Goncalo Goncalves, Hanako Okuno, Benjamin Uhlig, Aida Todri-Sanial, Jean Dijon, Asen Asenov
    IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2018, 65 (9), pp.3884-3892. &#x27E8;10.1109/TED.2018.2853550&#x27E9;. &#x27E8;lirmm-01867729&#x27E9;.
  10. On-chip Generation of Sine-wave Summing Digital Signals: an Analytic Study Considering Implementation Constraints
    Stéphane David-Grignot, Achraf Lamlih, Mohamed Moez Belhaj, Vincent Kerzérho, Florence Azaïs, Fabien Soulier, Philippe Freitas, Tristan Rouyer, Sylvain Bonhommeau, Serge Bernard
    Journal of Electronic Testing, Springer Verlag, 2018, 34 (3), pp.281-290. &#x27E8;10.1007/s10836-018-5710-4&#x27E9;. &#x27E8;lirmm-01706621&#x27E9;.
  11. A Temperature-Hardened Sensor Interface with a 12-Bit Digital Output Using a Novel Pulse Width Modulation Technique
    Emna Chabchoub, Franck Badets, Frédérick Mailly, Pascal Nouet, Mohamed Masmoudi
    Sensors, MDPI, 2018, 18 (4), pp.1107-1227. &#x27E8;10.3390/s18041107&#x27E9;. &#x27E8;lirmm-01768824&#x27E9;.
  12. Addressing the Thermal Issues of STT-MRAM From Compact Modeling to Design Techniques
    Liuyang Zhang, Yuanqing Cheng, Kang Wang, Lionel Torres, Youguang Zhang, Aida Todri-Sanial
    IEEE Transactions on Nanotechnology, Institute of Electrical and Electronics Engineers, 2018, 17 (2), pp.345-352. &#x27E8;https://ieeexplore.ieee.org/document/8283654/&#x27E9;. &#x27E8;10.1109/TNANO.2018.2803340&#x27E9;. &#x27E8;lirmm-01880065&#x27E9;.
  13. Estimating the Signal-to-Noise ratio under repeated sampling of the same centered signal: applications to side-channel attacks on a cryptoprocessor
    Gilles Ducharme, Philippe Maurine
    IEEE Transactions on Information Theory, Institute of Electrical and Electronics Engineers, 2018, 64 (9), pp.6333-6339. &#x27E8;10.1109/TIT.2018.2851217&#x27E9;. &#x27E8;hal-01830075&#x27E9;.

2017

  1. An On-Chip Technique to Detect Hardware Trojans and Assist Counterfeit Identification
    Maxime Lecomte, Jacques Jean-Alain Fournier, Philippe Maurine
    IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE, 2017, 25 (12), pp.3317-3330. &#x27E8;10.1109/TVLSI.2016.2627525&#x27E9;. &#x27E8;lirmm-01430925&#x27E9;.
  2. Method for evaluation of transient-fault detection techniques
    Raphael Andreoni Camponogara-Viera, Rodrigo Possamai Bastos, Jean-Max Dutertre, Philippe Maurine, Rodrigo Iga Jadue
    Microelectronics Reliability, Elsevier, 2017, 76-77, pp.68-74. &#x27E8;10.1016/j.microrel.2017.07.007&#x27E9;. &#x27E8;lirmm-01690185&#x27E9;.
  3. New Calibration Technique of Contact-less Resonant Biosensor
    Anthony Deluthault, Vincent Kerzérho, Serge Bernard, Fabien Soulier, Philippe Cauvet
    Journal of Electronic Testing, Springer Verlag, 2017, 33 (3), pp.365-375. &#x27E8;10.1007/s10836-017-5660-2&#x27E9;. &#x27E8;lirmm-01925598&#x27E9;.
  4. Mutual information analysis: higher-order statistical moments, efficiency and efficacy
    Mathieu Carbone, Yannick Teglia, Gilles R. Ducharme, Philippe Maurine
    Journal of Cryptographic Engineering, Springer, 2017, Journal of Cryptographic Engineering, 7 (1), pp.1-17. &#x27E8;http://link.springer.com/journal/13389&#x27E9;. &#x27E8;10.1007/s13389-016-0123-8&#x27E9;. &#x27E8;lirmm-01285152&#x27E9;.
  5. Smart-MEMS based inertial measurement units: gyro-free approach to improve the grade
    Gaurav Chatterjee, Laurent Latorre, Frédérick Mailly, Pascal Nouet, Nacim Hachelef, Coumar Oudéa
    Microsystem Technologies, Springer Verlag, 2017, 23 (9), pp.3969-3978. &#x27E8;10.1007/s00542-015-2741-y&#x27E9;. &#x27E8;lirmm-01262816&#x27E9;.
  6. A fully-digital and ultra-low-power front-end for differential capacitive sensors
    Patcharee Kongpark, Souha Hacine, Laurent Latorre, Frédérick Mailly, Pascal Nouet
    Microsystem Technologies, Springer Verlag, 2017, 23 (9), pp.3991-4000. &#x27E8;10.1007/s00542-015-2777-z&#x27E9;. &#x27E8;lirmm-01272416&#x27E9;.
  7. A Survey of Carbon Nanotube Interconnects for Energy Efficient Integrated Circuits
    Aida Todri-Sanial, Raphael Ramos, Hanako Okuno, Jean Dijon, Abitha Dhavamani, Marcus Widlicenus, Katharina Lilienthal, Benjamin Uhlig, Toufik Sadi, Vihar Georgiev, Asen Asenov, Salvatore Amoroso, Andrew Pender, Andrew Brown, Campbell Millar, Fabian Motzfeld, Bernd Gotsmann, Jie Liang, Goncalo Goncalves, Nalin Rupesinghe, Ken Teo
    IEEE Circuits and Systems Magazine -New Series-, Institute of Electrical and Electronics Engineers, 2017, 17 (2), pp.47-62. &#x27E8;10.1109/MCAS.2017.2689538&#x27E9;. &#x27E8;lirmm-01795757&#x27E9;.
  8. Electromagnetic fault injection: the curse of flip-flops
    Sébastien Ordas, Ludovic Guillaume-Sage, Philippe Maurine
    Journal of Cryptographic Engineering, Springer, 2017, 7 (3), pp.183-197. &#x27E8;10.1007/s13389-016-0128-3&#x27E9;. &#x27E8;lirmm-01430913&#x27E9;.
  9. Efficient Objective Metric Tool for Medical Electrical Device Development: Eye Phantom for Glaucoma Diagnosis Device
    Anthony Deluthault, Luc Mezenge, Philippe Cauvet, Vincent Kerzérho, Fabien Soulier, Serge Bernard
    Journal of Sensors, Hindawi Publishing Corporation, 2017, 2017, pp.Article ID 8436123. &#x27E8;10.1155/2017/8436123&#x27E9;. &#x27E8;lirmm-01770976&#x27E9;.

2016

  1. Temperature Impact Analysis and Access Reliability Enhancement for 1T1MTJ STT-RAM
    Bi Wu, Yuanqing Cheng, Jianlei Yang, Aida Todri-Sanial, Weisheng Zhao
    IEEE Transactions on Reliability, Institute of Electrical and Electronics Engineers, 2016, 65 (4), pp.1755-1768. &#x27E8;10.1109/TR.2016.2608910&#x27E9;. &#x27E8;lirmm-01446148&#x27E9;.
  2. Alleviating Through-Silicon-Via Electromigration for 3-D Integrated Circuits Taking Advantage of Self-Healing Effect
    Yuanqing Cheng, Aida Todri-Sanial, Jianlei Yang, Weisheng Zhao
    IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE, 2016, 24 (11), pp.3310-3322. &#x27E8;10.1109/TVLSI.2016.2543260&#x27E9;. &#x27E8;lirmm-01446125&#x27E9;.
  3. A Study of 3-D Power Delivery Networks With Multiple Clock Domains
    Aida Todri-Sanial, Yuanqing Cheng
    IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE, 2016, 24 (11), pp.3218-3231. &#x27E8;10.1109/TVLSI.2016.2549275&#x27E9;. &#x27E8;lirmm-01446137&#x27E9;.
  4. Energy Study for 28 nm Fully Depleted Silicon-On-Insulator Devices
    Rida Kheirallah, Gilles Ducharme, Nadine Azemard
    Journal of Low Power Electronics, American Scientific Publishers, 2016, 12 (1), pp.58-63. &#x27E8;10.1166/jolpe.2016.1420&#x27E9;. &#x27E8;lirmm-01295833&#x27E9;.
  5. SSB Phase Noise Evaluation of Analog/IF Signals on Standard Digital ATE
    Florence Azaïs, Stéphane David-Grignot, Laurent Latorre, François Lefevre
    Journal of Electronic Testing, Springer Verlag, 2016, 32 (1), pp.69-82. &#x27E8;10.1007/s10836-015-5556-y&#x27E9;. &#x27E8;lirmm-01347312&#x27E9;.
  6. Electrothermal Analysis of Carbon Nanotubes Power Delivery Networks for Nanoscale Integrated Circuits
    Alessandro Magnani, Massimiliano De Magistris, Aida Todri-Sanial, Antonio Maffucci
    IEEE Transactions on Nanotechnology, Institute of Electrical and Electronics Engineers, 2016, 15 (3), pp.380-388. &#x27E8;10.1109/TNANO.2016.2535390&#x27E9;. &#x27E8;lirmm-01445865&#x27E9;.
  7. A phantom axon setup for validating models of action potential recordings
    Olivier Rossel, Fabien Soulier, Serge Bernard, David Guiraud, Guy Cathébras
    Medical and Biological Engineering and Computing, Springer Verlag, 2016, 10 (4), pp.671-678. &#x27E8;10.1007/s11517-016-1463-3&#x27E9;. &#x27E8;lirmm-01347422&#x27E9;.
  8. Digital Embedded Test Instrument for On-Chip Phase Noise Testing of Analog/RF Integrated Circuits
    Florence Azaïs, Stéphane David-Grignot, Laurent Latorre, François Lefevre
    Journal of Circuits, Systems, and Computers, World Scientific Publishing, 2016, 25 (3), pp.#1640014. &#x27E8;10.1142/S0218126616400144&#x27E9;. &#x27E8;lirmm-01233013&#x27E9;.

2015

  1. Efficiency evaluation of analog/RF alternate test: Comparative study of indirect measurement selection strategies
    Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, Michel Renovell
    Microelectronics Journal, Elsevier, 2015, 46 (11), pp.1091-1102. &#x27E8;10.1016/j.mejo.2015.09.014&#x27E9;. &#x27E8;lirmm-01232890&#x27E9;.
  2. A new monolithic 3-axis thermal convective accelerometer: principle, design, fabrication and characterization
    Huy Binh Nguyen, Frédérick Mailly, Laurent Latorre, Pascal Nouet
    Microsystem Technologies, Springer Verlag, 2015, 21 (9), pp.1867-1877. &#x27E8;10.1007/s00542-014-2254-0&#x27E9;. &#x27E8;lirmm-01166797&#x27E9;.
  3. Pressure sensing method based on the transient response of a thermally actuated micro-wire
    Olivier Legendre, Hervé Bertin, Hervé Mathias, Ming Zhang, Souhil Megherbi, Frédérick Mailly
    Sensors and Actuators A: Physical , Elsevier, 2015, 221, pp.115-122. &#x27E8;10.1016/j.sna.2014.10.029&#x27E9;. &#x27E8;lirmm-01166822&#x27E9;.
  4. Special Issue on Advances in Design of Ultra-Low Power Circuits and Systems in Emerging Technologies
    Aida Todri-Sanial, Sanjukta Bhanja
    ACM Journal on Emerging Technologies in Computing Systems, Association for Computing Machinery, 2015, Guest Editorial, 12 (2), pp.#11. &#x27E8;10.1145/2756554&#x27E9;. &#x27E8;lirmm-01255756&#x27E9;.
  5. Vertical and horizontal correlation attacks on RNS-based exponentiations
    Guilherme Perin, Laurent Imbert, Philippe Maurine, Lionel Torres
    Journal of Cryptographic Engineering, Springer, 2015, 5 (3), pp.171-185. &#x27E8;10.1007/s13389-015-0095-0&#x27E9;. &#x27E8;lirmm-01269799&#x27E9;.
  6. Phase Noise Testing of Analog/IF Signals Using Digital ATE: A New Post-Processing Algorithm for Extended Measurement Range
    Stéphane David-Grignot, Florence Azaïs, Laurent Latorre, François Lefevre
    Journal of Electronic Testing, Springer Verlag, 2015, 31 (5-6), pp.443-459. &#x27E8;10.1007/s10836-015-5548-y&#x27E9;. &#x27E8;lirmm-01233017&#x27E9;.

2014

  1. A model of the leakage in the frequency domain and its application to CPA and DPA
    Sébastien Tiran, Sébastien Ordas, Yannick Teglia, Michel Agoyan, Philippe Maurine
    Journal of Cryptographic Engineering, Springer, 2014, 4 (3), pp.197-212. &#x27E8;10.1007/s13389-014-0074-x&#x27E9;. &#x27E8;lirmm-01096000&#x27E9;.
  2. Evaluating a Radiation Monitor for Mixed-Field Environments based on SRAM Technology
    Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri-Sanial, Arnaud Virazel, Julien Mekki, Markus Brugger, Frédéric Wrobel, Frédéric Saigné
    Journal of Instrumentation, IOP Publishing, 2014, 9 (5), pp.#C05052. &#x27E8;10.1088/1748-0221/9/05/C05052&#x27E9;. &#x27E8;lirmm-01234448&#x27E9;.
  3. Multiple Cell Upset Classification in Commercial SRAMs
    Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri-Sanial, Arnaud Virazel, Helmut Puchner, Christopher Frost, Frédéric Wrobel, Frédéric Saigné
    IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2014, 61 (4), pp.1747-1754. &#x27E8;http://ieeexplore.ieee.org/Xplore/home.jsp&#x27E9;. &#x27E8;10.1109/TNS.2014.2313742&#x27E9;. &#x27E8;lirmm-01234446&#x27E9;.
  4. Enhancing Confidence in Indirect Analog/RF Testing against the Lack of Correlation between Regular Parameters and Indirect Measurements
    Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, Michel Renovell
    Microelectronics Journal, Elsevier, 2014, 45 (3), pp.336-344. &#x27E8;10.1016/j.mejo.2013.12.006&#x27E9;. &#x27E8;lirmm-00936443&#x27E9;.
  5. An SRAM Based Monitor for Mixed-Field Radiation Environments
    Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri-Sanial, Arnaud Virazel, Julien Mekki, Markus Brugger, Frédéric Wrobel, Frédéric Saigné
    IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2014, 61 (4), pp.1663-1670. &#x27E8;http://ieeexplore.ieee.org/Xplore/home.jsp&#x27E9;. &#x27E8;10.1109/TNS.2014.2299733&#x27E9;. &#x27E8;lirmm-01234441&#x27E9;.
  6. Study of Low-Cost Electrical Test Strategies for Post-Silicon Yield Improvement of MEMS Convective Accelerometers
    Ahmed Rekik, Florence Azaïs, Frédérick Mailly, Pascal Nouet
    Journal of Electronic Testing, Springer Verlag, 2014, 30 (1), pp.87-100. &#x27E8;10.1007/s10836-013-5423-7&#x27E9;. &#x27E8;lirmm-00984275&#x27E9;.
  7. A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs
    João Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Jérémy Alvarez-Hérault, Ken Mackay
    IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE, 2014, 22 (11), pp.2326-2335. &#x27E8;10.1109/TVLSI.2013.2294080&#x27E9;. &#x27E8;lirmm-01248578&#x27E9;.
  8. Globally Constrained Locally Optimized 3-D Power Delivery Networks
    Aida Todri-Sanial, Sandip Kundu, Patrick Girard, Alberto Bosio, Luigi Dilillo, Arnaud Virazel
    IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE, 2014, 22 (10), pp.2131-2144. &#x27E8;10.1109/TVLSI.2013.2283800&#x27E9;. &#x27E8;lirmm-01255754&#x27E9;.
  9. Dynamic Variability Monitoring Using Statistical Tests for Energy Efficient Adaptive Architectures
    Lionel Vincent, Edith Beigné, Suzanne Lesecq, Julien Mottin, David Coriat, Philippe Maurine
    IEEE Transactions on Circuits and Systems Part 1 Fundamental Theory and Applications, Institute of Electrical and Electronics Engineers (IEEE), 2014, Part I: Regular Papers, 61 (6), pp.1741-1754. &#x27E8;10.1109/TCSI.2013.2290850&#x27E9;. &#x27E8;lirmm-01096015&#x27E9;.

International Communications

2019

  1. Reliable Power Delivery and Analysis of Power-Supply Noise During Testing in Monolithic 3D ICs
    Abhishek Koneru, Aida Todri-Sanial, Krishnendu Chakrabarty
    VTS: VLSI Test Symposium, Apr 2019, Monterey, CA, United States. &#x27E8;lirmm-02131987&#x27E9;. <http://tttc-vts.org/public_html/new/2019/technical-program/>
  2. SmartVista: Smart Autonomous Multi Modal Sensors for Vital Signs Monitoring
    Kafil M. Razeeb, Cian O'Murchu, Aida Todri-Sanial, Frederik Sebelius, Indranil Bose, Colm O 'Dwyer
    SSI: Smart System Integration Conference, Apr 2019, Barcelona, Spain. &#x27E8;lirmm-02132005&#x27E9;. <https://ssi.mesago.com/content/dam/messefrankfurt-mesago/ssi/2019/documents/pdf/SSI2019_Konferenzprogramm_WEB.pdf>

2018

  1. Power-Supply Noise Analysis for Monolithic 3D ICs Using Electrical and Thermal Co-Simulation
    Abhishek Koneru, Aida Todri-Sanial, Krishnendu Chakrabarty
    ICECS: International Conference on Electronics Circuits and Systems, Dec 2018, Bordeaux, France. &#x27E8;lirmm-01880158&#x27E9;. <https://www.ieee-icecs2018.org>
  2. A multitone analysis for bioimpedance spectroscopy using minimal digital ressource
    Fabien Soulier, Achraf Lamlih, Vincent Kerzérho, Serge Bernard
    ICST: International Conference on Sensing Technology, Dec 2018, Limerick, Ireland. &#x27E8;lirmm-01954549&#x27E9;. <http://www.ece.ul.ie/icst2018>
  3. Electromagnetic Activity vs. Logical Activity: Near Field Scans for Reverse Engineering
    Marc Lacruche, Philippe Maurine
    CARDIS: Smart Card Research and Advanced Applications, Nov 2018, Montpellier, France. pp.140-155, &#x27E8;10.1007/978-3-030-15462-2_10&#x27E9;. &#x27E8;lirmm-01943151&#x27E9;.
  4. From Spintronic Devices to Hybrid CMOS/Magnetic System On Chip
    Sophiane Senni, Frédéric Ouattara, Jad Mohdad, Kaan Sevin, Guillaume Patrigeon, Pascal Benoit, Pascal Nouet, Lionel Torres, François Duhem, Gregory Di Pendina, Guillaume Prenat
    VLSI-SoC: Very Large Scale Integration - System-on-Chip, Oct 2018, Verona, Italy. pp.188-191, &#x27E8;10.1109/VLSI-SoC.2018.8644875&#x27E9;. &#x27E8;hal-01982791&#x27E9;.
  5. The impact of pulsed electromagnetic fault injection on true random number generators
    Maxime Madau, Michel Agoyan, Josep Balash, Milos Grujic, Patrick Haddad, Philippe Maurine, Vladimir Rozic, Dave Singelee, Bohan Yang, Ingrid Verbauwhede
    FDTC: Fault Diagnosis and Tolerance in Cryptography, Sep 2018, Amsterdam, Netherlands. pp.43-48, &#x27E8;10.1109/FDTC.2018.00015&#x27E9;. &#x27E8;lirmm-01943112&#x27E9;.
  6. Exploiting Phase Information in Thermal Scans for Stealthy Trojan Detection
    Maxime Cozzi, Jean-Marc Galliere, Philippe Maurine
    DSD: Digital System Design, Aug 2018, Prague, Slovakia. pp.573-576, &#x27E8;10.1109/DSD.2018.00100&#x27E9;. &#x27E8;lirmm-01872499&#x27E9;.
  7. A Robust Dual Reference Computing-in-Memory Implementation and Design Space Exploration Within STT-MRAM
    Liuyang Zhang, Wang Kang, Hao Cai, Peng Ouyang, Lionel Torres, Youguang Zhang, Aida Todri-Sanial, Weisheng Zhao
    ISVLSI: International Symposium on Very Large Scale Integration, Jul 2018, Hong Kong, China. pp.275-280, &#x27E8;10.1109/ISVLSI.2018.00058&#x27E9;. &#x27E8;lirmm-01880184&#x27E9;.
  8. Combined analysis of supply voltage and body-bias voltage for energy management
    Rida Kheirallah, Jean-Marc Galliere, Nadine Azemard, Gilles Ducharme
    PATMOS: Power and Timing Modeling, Optimization and Simulation, Jul 2018, Platja d’Aro, Spain. pp.88-91, &#x27E8;10.1109/PATMOS.2018.8464159&#x27E9;. &#x27E8;lirmm-01867809&#x27E9;.
  9. Low-cost functional test of a 2.4 GHz OQPSK transmitter using standard digital ATE
    Thibault Vayssade, Florence Azaïs, Laurent Latorre, Francois Lefèvre
    IOLTS: International On-Line Testing Symposium, Jul 2018, Platja d'Aro, Spain. pp.17-22, &#x27E8;10.1109/IOLTS.2018.8474229&#x27E9;. &#x27E8;lirmm-01997910&#x27E9;.
  10. Chameleon: A Thermally Adaptive Error Correction Code Design for STT-MRAM LLCs
    Dijun Liu, Yuanqing Cheng, Y. Wang, B. Wu, B. Zhang, Aida Todri-Sanial, Weisheng Zhao
    DAC: Design Automation Conference, Jun 2018, San Fransisco, United States. &#x27E8;lirmm-01880209&#x27E9;.
  11. Challenges and Progress on Carbon Nanotube Integration for BEOL Interconnects
    Benjamin Uhlig, Abitha Dhavamani, Nicole Nagy, Katharina Lilienthal, Liske R., Raphael Ramos, Jean Dijon, Hanako Okuno, Dipankar Kalita, Lee Jaehyun, Vihar P. Georgiev, Asenov Asen, Salvatore Amoroso, Liping Wang, Koenemann Fabien, Bernd Gotsmann, Goncalo Goncalves, Bingam Cheng, Jie Liang, Reetu Raj Pandey, Rongmei Chen, Aida Todri-Sanial
    IITC: International Interconnect Technology Conference, Jun 2018, Santa Clara, United States. pp.16-18, &#x27E8;10.1109/IITC.2018.8430411&#x27E9;. &#x27E8;lirmm-01880138&#x27E9;.
  12. Wideband Fully Differential Current Driver with Optimized Output Impedance for Bioimpedance Measurements
    Achraf Lamlih, Philippe Freitas, Stéphane David-Grignot, Jérémie Salles, Vincent Kerzérho, Fabien Soulier, Serge Bernard, Tristan Rouyer, Sylvain Bonhommeau
    ISCAS: International Symposium on Circuits and Systems, May 2018, Florence, Italy. &#x27E8;10.1109/ISCAS.2018.8351464&#x27E9;. &#x27E8;lirmm-01874027&#x27E9;. <10.1109/ISCAS.2018.8351464>
  13. Post-fabrication soft trimming of resistive sensors
    Ibrahim Shankhour, Jad Mohdad, Frédérick Mailly, Pascal Nouet
    DTIP: Design, Test, Integration and Packaging, May 2018, Roma, Italy. &#x27E8;10.1109/DTIP.2018.8394221&#x27E9;. &#x27E8;lirmm-01827725&#x27E9;. <10.1109/DTIP.2018.8394221>
  14. A generic model for sensor simulation at system level
    Pascal Nouet, Josué Manuel Rivera Velázquez, Frédérick Mailly
    DTIP: Design, Test, Integration and Packaging, May 2018, Roma, Italy. &#x27E8;10.1109/DTIP.2018.8394198&#x27E9;. &#x27E8;lirmm-01827709&#x27E9;. <10.1109/DTIP.2018.8394198>
  15. Thermal Scans for Detecting Hardware Trojans
    Maxime Cozzi, Philippe Maurine, Jean-Marc Galliere
    COSADE: Constructive Side-Channel Analysis and Secure Design, Apr 2018, Singapour, Singapore. pp.117-132, &#x27E8;10.1007/978-3-319-89641-0_7&#x27E9;. &#x27E8;lirmm-01823444&#x27E9;.
  16. Standard CAD Tool-Based Method for Simulation of Laser-Induced Faults in Large-Scale Circuits
    Raphael Andreoni Camponogara-Viera, Jean-Max Dutertre, Philippe Maurine, Rodrigo Possamai Bastos
    ISPD: International Symposium on Physical Design, Mar 2018, Monterey, CA, United States. pp.160-167, &#x27E8;10.1145/3177540.3178243&#x27E9;. &#x27E8;lirmm-01743368&#x27E9;.
  17. Using multifunctional standardized stack as universal spintronic technology for IoT
    Mehdi B. Tahoori, Sarath Mohanachandran Nair, Rajendra Bishnoi, Sophiane Senni, Jad Mohdad, Frédérick Mailly, Lionel Torres, Pascal Benoit, Abdoulaye Gamatié, Pascal Nouet, Frédéric Ouattara, Gilles Sassatelli, Kotb Jabeur, Pierre Vanhauwaert, Alexandru Atitoaie, Ioana Firastrau, G. Di Pendina, Guillaune Prenat
    DATE: Design, Automation and Test in Europe, Mar 2018, Dresden, Germany. pp.931-936, &#x27E8;10.23919/DATE.2018.8342143&#x27E9;. &#x27E8;hal-01864468&#x27E9;.
  18. Progress on carbon nanotube BEOL interconnects
    Benjamin Uhlig, Jie Liang, Lee Jaehyun, Raphael Ramos, Abitha Dhavamani, Nicole Nagy, Jean Dijon, Hanako Okuno, Dipankar Kalita, Vihar P. Georgiev, Asenov Asen, Salvatore Amoroso, Liping Wang, Campbell Millar, F. Konemann, Bernd Gotsmann, Goncalo Goncalves, Bingham Chen, Reetu Raj Pandey, Rongmei Chen, Aida Todri-Sanial
    DATE: Design, Automation and Test in Europe, Mar 2018, Dresden, Germany. pp.937-942, &#x27E8;10.23919/DATE.2018.8342144&#x27E9;. &#x27E8;lirmm-01880198&#x27E9;.

2017

  1. A physics-based investigation of Pt-salt doped carbon nanotubes for local interconnects
    Jie Liang, Raphael Ramos, Jean Dijon, H. Okuno, D. Kalita, D. Renaud, J. Lee, Vihar Georgiev, Salim Berrada, T. Sadi, A. Asenov, B. Uhlig, K. Lilienthal, A. Dhavamani, F. Konemann, B. Gotsmann, G. Goncalves, B. Chen, K. Teo, Reetu Raj Pandey, Aida Todri-Sanial
    IEDM: International Electron Devices Meeting, Dec 2017, San Francisco, United States. &#x27E8;10.1109/IEDM.2017.8268502&#x27E9;. &#x27E8;lirmm-01795777&#x27E9;. <10.1109/IEDM.2017.8268502>
  2. An {EM} Fault Injection Susceptibility Criterion and Its Application to the Localization of Hotspots
    Philippe Maurine, Maxime Madau, Michel Agoyan
    CARDIS: Smart Card Research and Advanced Applications, Nov 2017, Lugano, Switzerland. pp.180-195, &#x27E8;10.1007/978-3-319-75208-2_11&#x27E9;. &#x27E8;lirmm-02100194&#x27E9;.
  3. Synchronised 4-Phase Resonant Power Clock Supply for Energy Efficient Adiabatic Logic
    Nicolas Jeanniot, Gael Pillonnet, Pascal Nouet, Nadine Azemard, Aida Todri-Sanial
    ICRC: International Conference on Rebooting Computing, Nov 2017, Washington, DC, United States. &#x27E8;10.1109/ICRC.2017.8123661&#x27E9;. &#x27E8;lirmm-01768831&#x27E9;. <10.1109/ICRC.2017.8123661>
  4. Atomistic to circuit level modeling of defective doped SWCNTs with contacts for on-chip interconnect application
    Jie Liang, Lee Jaehyun, Salim Berrada, Vihar P. Georgiev, Asenov Asen, Nadine Azemard, Aida Todri-Sanial
    NMDC: Nanotechnology Materials and Devices Conference, Oct 2017, Singapore, Singapore. &#x27E8;10.1109/NMDC.2017.8350506&#x27E9;. &#x27E8;lirmm-01880220&#x27E9;. <10.1109/NMDC.2017.8350506>
  5. Method for evaluation of transient-fault detection techniques
    Raphael Andreoni Camponogara-Viera, Rodrigo Possamai Bastos, Jean-Max Dutertre, Philippe Maurine
    ESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Sep 2017, Bordeaux, France. &#x27E8;hal-01721081&#x27E9;.
  6. Atoms-to-circuits simulation investigation of CNT interconnects for next generation CMOS technology
    Jaehyun Lee, Jie Liang, Salvatore Amoroso, Toufik Sadi, Liping Wang, Asen Asenov, Andrew Pender, Dave Reid, Vihar Georgiev, Campbell Millar, Aida Todri-Sanial
    SISPAD: Simulation of Semiconductor Processes and Devices, Sep 2017, Kamakura, Japan. &#x27E8;10.23919/SISPAD.2017.8085287&#x27E9;. &#x27E8;lirmm-01795803&#x27E9;. <10.23919/SISPAD.2017.8085287>
  7. The impact of vacancy defects on CNT interconnects: From statistical atomistic study to circuit simulations
    Jaehyun Lee, Salim Berrada, Jie Liang, Toufik Sadi, Vihar Georgiev, Aida Todri-Sanial, Dipankar Kalita, Raphaël Ramos, Hanako Okuno, Jean Dijon, Asen Asenov
    SISPAD: International Conference on Simulation of Semiconductor Processes and Devices, Sep 2017, Kamakura, Japan. &#x27E8;10.23919/SISPAD.2017.8085288&#x27E9;. &#x27E8;lirmm-01795799&#x27E9;. <10.23919/SISPAD.2017.8085288>
  8. Role of Laser-Induced IR Drops in the Occurrence of Faults: Assessment and Simulation
    Raphael Andreoni Camponogara-Viera, Jean-Max Dutertre, Rodrigo Possamai Bastos, Philippe Maurine
    DSD: Digital System Design, Aug 2017, Vienna, Austria. pp.252-259, &#x27E8;10.1109/DSD.2017.43&#x27E9;. &#x27E8;lirmm-01699776&#x27E9;.
  9. High Temperature, Time Domain Sensor Interface based on Phase Shifter
    Emna Chabchoub, Franck Badets, Mohamed Masmoudi, Pascal Nouet, Frédérick Mailly
    HiTen: High Temperature Electronics Network, Jul 2017, Cambridge, United Kingdom. pp.103-108, &#x27E8;10.4071/2380-4491.2017.HiTEN.103&#x27E9;. &#x27E8;lirmm-01684794&#x27E9;.
  10. GREAT: HeteroGeneous IntegRated Magnetic tEchnology Using Multifunctional Standardized sTack
    Mehdi B. Tahoori, Sarath Mohanachandran Nair, Rajendra Bishnoi, Sophiane Senni, Jad Mohdad, Frédérick Mailly, Lionel Torres, Pascal Benoit, Pascal Nouet, Rui Ma, Martin Kreißig, Frank Ellinger, Kotb Jabeur, Pierre Vanhauwaert, Gregory Di Pendina, Guillaune Prenat
    ISVLSI: International Symposium on Very Large Scale Integration, Jul 2017, Bochum, Germany. pp.344-349, &#x27E8;10.1109/ISVLSI.2017.67&#x27E9;. &#x27E8;lirmm-01708599&#x27E9;.
  11. Analytical Study of On-chip Generations of Analog Sine-wave Based on Combined Digital Signals
    Stéphane David-Grignot, Achraf Lamlih, Vincent Kerzérho, Florence Azaïs, Fabien Soulier, Serge Bernard
    IMSTW: International Mixed Signals Testing Workshop, Jul 2017, Thessaloniki, Greece. &#x27E8;10.1109/IMS3TW.2017.7995205&#x27E9;. &#x27E8;lirmm-01699387&#x27E9;. <10.1109/IMS3TW.2017.7995205>
  12. New time-domain conditioning circuit for resistive sensor: Behavioral modelling for simulation and optimization
    Emna Chabchoub, Franck Badets, Mohamed Masmoudi, Frédérick Mailly, Pascal Nouet
    MIXDES: Mixed Design of Integrated Circuits and Systems, Jun 2017, Bydgoszcz, Poland. pp.408-411, &#x27E8;10.23919/MIXDES.2017.8005242&#x27E9;. &#x27E8;lirmm-01687778&#x27E9;.
  13. Importance of IR Drops on the Modeling of Laser-Induced Transient Faults
    Raphael Andreoni Camponogara-Viera, Philippe Maurine, Jean-Max Dutertre, Rodrigo Possamai Bastos
    SMACD: Synthesis, Modeling, Analysis and simulation methods and applications to Circuit Design, Jun 2017, Giardini Naxos, Taormina, Italy. &#x27E8;10.1109/SMACD.2017.7981593&#x27E9;. &#x27E8;hal-01721087&#x27E9;. <10.1109/SMACD.2017.7981593>
  14. A hierarchical model for CNT and Cu-CNT composite interconnects: from density functional theory to circuit-level simulations
    Lee Jaehyun, Sadi Toufik, Jie Liang, Vihar Georgiev, Aida Todri-Sanial, Asenov Asen
    IWCN: International Workshop on Computational Nanotechnology, Jun 2017, Windermere, United Kingdom. &#x27E8;lirmm-01800290&#x27E9;. <http://iwcn2017.iopconfs.org/>
  15. Formal analysis of high-performance stabilized active-input current mirror
    Mohan Julien, Serge Bernard, Fabien Soulier, Vincent Kerzérho, Guy Cathébras
    ISCAS: International Symposium on Circuits and Systems, May 2017, Baltimore, MD, United States. &#x27E8;10.1109/ISCAS.2017.8051012&#x27E9;. &#x27E8;lirmm-01710205&#x27E9;. <10.1109/ISCAS.2017.8051012>
  16. A high temperature, 12-bit-time-domain sensor interface based on injection locked oscillator
    Emna Chabchoub, Franck Badets, Pascal Nouet, Mohamed Masmoudi, Frédérick Mailly
    ISCAS: International Symposium on Circuits and Systems, May 2017, Baltimore, United States. pp.1-4, &#x27E8;10.1109/ISCAS.2017.8050504&#x27E9;. &#x27E8;lirmm-01687348&#x27E9;.
  17. Toward Carbon Nanotube Computing
    Aida Todri-Sanial
    Emerging Technology, May 2017, Varsovie, Poland. &#x27E8;lirmm-01457269&#x27E9;. <http://www.etcmos.com/current_event.php?event=2017>
  18. Electrical performance of carbon-based power distribution networks with thermal effects
    A. Magnani, M. de Magistris, S. Heidari, Aida Todri-Sanial, A. Maffucci
    SPI: Signal and Power Integrity, May 2017, Baveno, Italy. &#x27E8;10.1109/SaPIW.2017.7944044&#x27E9;. &#x27E8;lirmm-01795816&#x27E9;. <10.1109/SaPIW.2017.7944044>
  19. Combo of innovative educational approaches to teach industrial test to undergraduate students
    Beatrice Pradarelli, Pascal Nouet, Laurent Latorre
    EDUCON: Global Engineering Education Conference, Apr 2017, Athens, Greece. pp.56-64, &#x27E8;10.1109/EDUCON.2017.7942824&#x27E9;. &#x27E8;lirmm-01768840&#x27E9;.
  20. Impacts of Technology Trends on Physical Attacks?
    Philippe Maurine, Sylvain Guilley
    COSADE: Constructive Side-Channel Analysis and Secure Design, Apr 2017, Paris, France. pp.190-206, &#x27E8;10.1007/978-3-319-64647-3_12&#x27E9;. &#x27E8;lirmm-01690188&#x27E9;.
  21. Formal analysis of bandwidth enhancement for high-performance active-input current mirror
    Mohan Julien, Serge Bernard, Fabien Soulier, Vincent Kerzérho, Guy Cathébras
    DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2017, Palma de Mallorca, Spain. &#x27E8;10.1109/DTIS.2017.7930162&#x27E9;. &#x27E8;lirmm-01710201&#x27E9;. <10.1109/DTIS.2017.7930162>
  22. Power and Performance Analysis of Doped SW/DW CNT for On-Chip Interconnect Application
    Aida Todri-Sanial, Jie Liang
    GRAPHENE, Mar 2017, Barcelone, Spain. &#x27E8;lirmm-01800286&#x27E9;. <http://www.grapheneconf.com/2017/>
  23. Highly linear voltage-to-time converter based on injection locked relaxation oscillators
    Emna Chabchoub, Franck Badets, Mohamed Masmoudi, Pascal Nouet, Frédérick Mailly
    SSD: Systems, Signals and Devices, Mar 2017, Marrakech, Morocco. &#x27E8;10.1109/SSD.2017.8167011&#x27E9;. &#x27E8;lirmm-01712478&#x27E9;. <10.1109/SSD.2017.8167011>

2016

  1. EKF-based state estimation for train localization
    Damien Veillard, Frédérick Mailly, Philippe Fraisse
    IEEE SENSORS, Oct 2016, Orlando, United States. &#x27E8;10.1109/ICSENS.2016.7808726&#x27E9;. &#x27E8;lirmm-01445352&#x27E9;. <10.1109/ICSENS.2016.7808726>
  2. Mixed-level simulation tool for design optimization of electrical impedance spectroscopy systems
    Achraf Lamlih, Vincent Kerzérho, Serge Bernard, Fabien Soulier, Mariane Comte, Michel Renovell, Tristan Rouyer, Sylvain Bonhommeau
    IWIS: International Workshop on Impedance Spectroscopy, Sep 2016, Chemnitz, Germany. &#x27E8;lirmm-01457544&#x27E9;. <https://www.tu-chemnitz.de/etit/messtech/iwis/openconf/modules/request.php?module=oc_program&action=program.php>
  3. Investigation of electrical and thermal properties of carbon nanotube interconnects
    Aida Todri-Sanial
    PATMOS: Power and Timing Modeling, Optimization and Simulation, Sep 2016, Brême, Zimbabwe. pp.25-32, &#x27E8;10.1109/PATMOS.2016.7833421&#x27E9;. &#x27E8;lirmm-01457289&#x27E9;.
  4. Physical description and analysis of doped carbon nanotube interconnects
    Jie Liang, Liuyang Zhang, Nadine Azemard, Pascal Nouet, Aida Todri-Sanial
    PATMOS: Power and Timing Modeling, Optimization and Simulation, Sep 2016, Brême, Germany. pp.250-255, &#x27E8;10.1109/PATMOS.2016.7833695&#x27E9;. &#x27E8;lirmm-01457338&#x27E9;.
  5. Electrothermal Modeling and Analysis of Carbon Nanotube Interconnects
    Aida Todri-Sanial
    PATMOS: Power And Timing Modeling, Optimization and Simulation, Sep 2016, Brême, Germany. &#x27E8;lirmm-01457256&#x27E9;. <http://www.item.uni-bremen.de/patmos/>
  6. Problem-Based Learning Approach to Teach Printed Circuit Boards Test
    Béatrice Pradarelli, Pascal Nouet, Laurent Latorre
    ICL: Interactive Collaborative Learning, Sep 2016, Belfast, United Kingdom. &#x27E8;lirmm-01385626&#x27E9;. <http://www.icl-conference.org/icl2016/>
  7. Modeling and Simulation of Carbon Nanotube Interconnects
    Aida Todri-Sanial
    SISPAD: Simulation of Semiconductor Processes and Devices, Sep 2016, Nuremberg, Germany. &#x27E8;lirmm-01457260&#x27E9;. <http://www.sispad2016.org>
  8. A Simple Conditioner for Resonant Intraocular Pressure Sensor
    Fabien Soulier, Frédérick Mailly, Vincent Kerzérho, Anthony Deluthault, Serge Bernard, Philippe Cauvet
    EUROSENSORS XXX, Sep 2016, Budapest, Hungary. pp.67-70, &#x27E8;10.1016/j.proeng.2016.11.149&#x27E9;. &#x27E8;lirmm-01426019&#x27E9;.
  9. An Embedded Digital Sensor against EM and BB Fault Injection
    David El-Baze, Jean-Baptiste Rigaud, Philippe Maurine
    FDTC: Fault Diagnosis and Tolerance in Cryptography, Aug 2016, Santa Barbara, CA, United States. pp.78-86, &#x27E8;10.1109/FDTC.2016.14&#x27E9;. &#x27E8;lirmm-01434028&#x27E9;.
  10. Efficient calibration of contact-less resonant bio-sensor affected by operating conditions
    Anthony Deluthault, Vincent Kerzérho, Serge Bernard, Fabien Soulier, Philippe Cauvet
    IMSTW: International Mixed-Signal Testing Workshop, Jul 2016, Sant Feliu de Guixols, Spain. pp.1-6, &#x27E8;10.1109/IMS3TW.2016.7524219&#x27E9;. &#x27E8;lirmm-01430618&#x27E9;.
  11. Proceedings of the 18th Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS (DTIP 2016)
    Benoit Charlot, Yoshio Mita, Pascal Nouet, Francis Pressecq, Marta Rencz, Peter Schneider, Niels Tas
    DTIP: Design, Test, Integration and Packaging of MEMS/MOEMS, May 2016, Budapest, Hungary. pp.329. &#x27E8;lirmm-01433526&#x27E9;.
  12. Quantitative evaluation of reliability and performance for STT-MRAM
    Liuyang Zhang, Aida Todri-Sanial, Wang Kang, Youguang Zhang, Lionel Torres, Yuanqing Cheng, Weisheng Zhao
    ISCAS: International Symposium on Circuits and Systems, May 2016, Montréal, QC, Canada. pp.1150-1153, &#x27E8;10.1109/ISCAS.2016.7527449&#x27E9;. &#x27E8;lirmm-01446275&#x27E9;.
  13. Per Peers Learning Education Approach to Teach Industrial Test to Undergraduate Students
    Béatrice Pradarelli, Pascal Nouet, Laurent Latorre
    EWME: European Workshop on Microelectronics Education, May 2016, Southampton, United Kingdom. &#x27E8;lirmm-01385619&#x27E9;. <http://ewme2016.ecs.soton.ac.uk>
  14. A clustering technique for fast electrothermal analysis of on-chip power distribution networks
    Alessandro Magnani, Massimiliano De Magistris, Antonio Maffucci, Aida Todri-Sanial
    SPI: Signal and Power Integrity, May 2016, Turin, Italy. pp.1-4, &#x27E8;10.1109/SaPIW.2016.7496292&#x27E9;. &#x27E8;lirmm-01446283&#x27E9;.
  15. Investigation of the power-clock network impact on adiabatic logic
    Nicolas Jeanniot, Aida Todri-Sanial, Pascal Nouet, Gaël Pillonnet, Hervé Fanet
    SPI: Signal and Power Integrity, May 2016, Turin, Italy. pp.1-4, &#x27E8;10.1109/SaPIW.2016.7496270&#x27E9;. &#x27E8;hal-01348476&#x27E9;.
  16. Granularity and detection capability of an adaptive embedded Hardware Trojan detection system
    Maxime Lecomte, Jacques Jean-Alain Fournier, Philippe Maurine
    HOST: Hardware Oriented Security and Trust, May 2016, McLean, VA, United States. pp.135-138, &#x27E8;10.1109/HST.2016.7495571&#x27E9;. &#x27E8;lirmm-01434150&#x27E9;.
  17. Reliability and performance evaluation for STT-MRAM under temperature variation
    Liuyang Zhang, Yuanqing Cheng, Wang Kang, Youguang Zhang, Lionel Torres, Weisheng Zhao, Aida Todri-Sanial
    EuroSimE: Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, Apr 2016, Montpellier, France. pp.1-4, &#x27E8;10.1109/EuroSimE.2016.7463380&#x27E9;. &#x27E8;lirmm-01446252&#x27E9;.
  18. Present and future prospects of carbon nanotube interconnects for energy efficient integrated circuits
    Aida Todri-Sanial, Alessandro Magnani, Massimiliano De Magistris, Antonio Maffucci
    EuroSimE: Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, Apr 2016, Montpellier, France. &#x27E8;10.1109/EuroSimE.2016.7463379&#x27E9;. &#x27E8;lirmm-01446241&#x27E9;. <10.1109/EuroSimE.2016.7463379>
  19. Industrial Test Project Oriented Education
    Béatrice Pradarelli, Pascal Nouet, Laurent Latorre
    EDUCON: Global Engineering Education Conference, Apr 2016, Abu Dhabi, United Arab Emirates. &#x27E8;lirmm-01256447&#x27E9;. <http://www.educon-conference.org/educon2016/index.php>
  20. A Fully-Digital Em Pulse Detector
    El-Baze David, Jean-Baptiste Rigaud, Philippe Maurine
    DATE: Design, Automation and Test in Europe, Mar 2016, Dresden, Germany. &#x27E8;lirmm-01269860&#x27E9;. <http://www.date-conference.com/conference/session/5.3>
  21. On-Chip Fingerprinting of IC Topology for Integrity Verification
    Maxime Lecomte, Jacques Jean-Alain Fournier, Philippe Maurine
    DATE: Design, Automation and Test in Europe, Mar 2016, Dresden, Germany. pp.133-138. &#x27E8;lirmm-01269856&#x27E9;.
  22. Body Biasing Injection Attacks in Practice
    Noemie Beringuier-Boher, Marc Lacruche, David El-Baze, Jean-Max Dutertre, Jean-Baptiste Rigaud, Philippe Maurine
    CS2: Cryptography and Security in Computing Systems, Jan 2016, Prague, Czech Republic. pp.49-54, &#x27E8;10.1145/2858930.2858940&#x27E9;. &#x27E8;lirmm-01434143&#x27E9;.

2015

  1. Thoroughly analyzing the use of ring oscillators for on-chip hardware trojan detection
    Maxime Lecomte, Philippe Maurine, Jacques Jean-Alain Fournier
    ReConFig: ReConFigurable Computing and FPGAs, Dec 2015, Mexico, Mexico. pp.1-6, &#x27E8;10.1109/ReConFig.2015.7393363&#x27E9;. &#x27E8;lirmm-01354318&#x27E9;.
  2. Collision for Estimating SCA Measurement Quality and Related Applications
    Ibrahima Diop, Mathieu Carbone, Sébastien Ordas, Yanis Linge, Pierre Yvan Liardet, Philippe Maurine
    CARDIS: Smart Card Research and Advanced Applications, Nov 2015, Bochum, Germany. pp.143-157, &#x27E8;10.1007/978-3-319-31271-2_9&#x27E9;. &#x27E8;lirmm-01319093&#x27E9;.
  3. Relevance of impedance spectroscopy for the monitoring of implant-induced fibrosis: A preliminary study
    Noëlle Lewis, Cyril Lahuec, S Renaud, E Mcadams, P Bogonez-Franco, C Lethias, S Kellouche, F Carreiras, Andrea Pinna, Aymeric Histace, M Boissiere, E Pauthe, I Lagroye, Fabien Soulier, Serge Bernard, S Binczak, Bertrand Granado, Patrick Garda, M Terosiet, Alexandre Goguin, Olivier Romain
    BIOCAS: Biomedical Circuits and Systems, Oct 2015, Atlanta, United States. pp.1-4, &#x27E8;10.1109/BioCAS.2015.7348399&#x27E9;. &#x27E8;hal-01246840&#x27E9;.
  4. EM Injection: Fault Model and Locality
    Sébastien Ordas, Ludovic Guillaume-Sage, Philippe Maurine
    FDTC: Fault Diagnosis and Tolerance in Cryptography, Sep 2015, Saint Malo, France. pp.3-13, &#x27E8;10.1109/FDTC.2015.9&#x27E9;. &#x27E8;lirmm-01319078&#x27E9;.
  5. Carbon nanotube interconnects for energy-efficient integrated circuits
    Aida Todri-Sanial
    TNT: Trends in Nanotechnology, Sep 2015, Toulouse, France. &#x27E8;lirmm-01446233&#x27E9;.
  6. Statistical Energy Study for 28nm FDSOI Technology
    Rida Kheirallah, Gilles Ducharme, Nadine Azemard
    VARI: Workshop on CMOS Variability, Sep 2015, Salvador, Bahia, Brazil. &#x27E8;lirmm-01256280&#x27E9;. <http://www.inf.ufrgs.br/vari/>
  7. Collision Based Attacks in Practice
    Diop Ibrahima, Pierre-Yvan Liardet, Yanis Linge, Philippe Maurine
    DSD: Digital System Design, Aug 2015, Madeire, Portugal. pp.367-374, &#x27E8;10.1109/DSD.2015.24&#x27E9;. &#x27E8;lirmm-01269809&#x27E9;.
  8. Carbon-based Power Delivery Networks for nanoscale ICs: electrothermal performance analysis
    Alessandro Magnani, Massimiliano De Magistris, Aida Todri-Sanial, Antonio Maffucci
    IEEE-NANO: Nanotechnology, Jul 2015, Rome, Italy. pp.416-419, &#x27E8;10.1109/NANO.2015.7388625&#x27E9;. &#x27E8;lirmm-01446739&#x27E9;.
  9. On Analysis of On-chip DC-DC Converters for Power Delivery Networks
    Ghizlane Mouslih, Aida Todri-Sanial, Pascal Nouet
    ISVLSI: IEEE Computer Society Annual Symposium on VLSI, Jul 2015, Montpellier, France. pp.557-560, &#x27E8;10.1109/ISVLSI.2015.96&#x27E9;. &#x27E8;lirmm-01446182&#x27E9;.
  10. On the Performance Exploration of 3D NoCs with Resistive-Open TSVs
    Charles Effiong, Vianney Lapotre, Abdoulaye Gamatié, Gilles Sassatelli, Aida Todri-Sanial, Khalid Latif
    ISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.579-584, &#x27E8;10.1109/ISVLSI.2015.49&#x27E9;. &#x27E8;lirmm-01248588&#x27E9;.
  11. A framework for efficient implementation of analog/RF alternate test with model redundancy
    Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, Michel Renovell
    ISVLSI: IEEE Computer Society Annual Symposium on VLSI, Jul 2015, Montpellier, France. pp.621-626, &#x27E8;10.1109/ISVLSI.2015.30&#x27E9;. &#x27E8;lirmm-01233104&#x27E9;.
  12. Toward adaptation of ADCs to operating conditions through on-chip correction
    Vincent Kerzérho, Ludovic Guillaume-Sage, Florence Azaïs, Mariane Comte, Michel Renovell, Serge Bernard
    ISVLSI: IEEE Computer Society Annual Symposium on VLSI, Jul 2015, Montpellier, France. pp.634-639, &#x27E8;10.1109/ISVLSI.2015.62&#x27E9;. &#x27E8;lirmm-01233117&#x27E9;.
  13. In-silico Phantom Axon: Emulation of an Action Potential Propagating Along Artificial Nerve Fiber
    Olivier Rossel, Fabien Soulier, Serge Bernard, David Guiraud, Guy Cathébras
    ISVLSI: IEEE Computer Society Annual Symposium on VLSI, Jul 2015, Montpellier, France. pp.228-230, &#x27E8;10.1109/ISVLSI.2015.123&#x27E9;. &#x27E8;lirmm-01237977&#x27E9;.
  14. Digital on-chip measurement circuit for built-in phase noise testing
    Stéphane David-Grignot, Florence Azaïs, Laurent Latorre, François Lefevre
    IMSTW: International Mixed-Signals Test Workshop, Jun 2015, Paris, France. &#x27E8;10.1109/IMS3TW.2015.7177880&#x27E9;. &#x27E8;lirmm-01233161&#x27E9;. <10.1109/IMS3TW.2015.7177880>
  15. A generic methodology for building efficient prediction models in the context of alternate testing
    Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, Michel Renovell
    IMSTW: International Mixed-Signals Test Workshop, Jun 2015, Paris, France. &#x27E8;10.1109/IMS3TW.2015.7177873&#x27E9;. &#x27E8;lirmm-01233150&#x27E9;. <10.1109/IMS3TW.2015.7177873>
  16. Une pedagogie par projet pour des etudiants acteurs et auteurs de leur apprentissage
    Béatrice Pradarelli, Pascal Nouet, Laurent Latorre
    QPES: Questions de Pédagogie dans l’Enseignement Supérieur, Jun 2015, Brest, France. &#x27E8;lirmm-01256445&#x27E9;. <http://www.colloque-pedagogie.org/?q=node/5>
  17. An architecture-level cache simulation framework supporting advanced PMA STT-MRAM
    Bi Wu, Yuanqing Cheng, Ying Wang, Aida Todri-Sanial, Guangyu Sun, Lionel Torres, Weisheng Zhao
    NANOARCH: Nanoscale Architectures, Jun 2015, Boston, MA, United States. pp.7-12, &#x27E8;10.1109/NANOARCH.2015.7180576&#x27E9;. &#x27E8;lirmm-01248586&#x27E9;.
  18. A New Technique for Low-Cost Phase Noise Production Testing from 1-bit Signal Acquisition
    Stéphane David-Grignot, Florence Azaïs, Laurent Latorre, François Lefevre
    ETS: European Test Symposium, May 2015, Cluj-Napoca, Romania. pp.1-6, &#x27E8;10.1109/ETS.2015.7138761&#x27E9;. &#x27E8;lirmm-01233093&#x27E9;.
  19. A body-biasing of readout circuit for STT-RAM with improved thermal reliability
    Lun Yang, Yuanqing Cheng, Yuhao Wang, Hao Yu, Weisheng Zhao, Aida Todri-Sanial
    ISCAS: International Symposium on Circuits and Systems, May 2015, Lisbon, Portugal. pp.1530-1533, &#x27E8;10.1109/ISCAS.2015.7168937&#x27E9;. &#x27E8;lirmm-01720592&#x27E9;.
  20. A node clustering reduction scheme for power grids electrothermal analysis
    Alessandro Magnani, M. de Magistris, Antonio Maffucci, Aida Todri-Sanial
    SPI: Signal and Power Integrity, May 2015, Berlin, Germany. pp.1-4, &#x27E8;10.1109/SaPIW.2015.7237399&#x27E9;. &#x27E8;lirmm-01248589&#x27E9;.
  21. An ultra-low-power front-end for differential capacitive sensors
    Patcharee Kongpark, Frédérick Mailly, Laurent Latorre, Pascal Nouet
    DTIP: Design, Test, Integration and Packaging, Apr 2015, Montpellier, France. &#x27E8;10.1109/DTIP.2015.7160964&#x27E9;. &#x27E8;lirmm-01235453&#x27E9;. <10.1109/DTIP.2015.7160964>
  22. MEMS based Inertial Measurement Units
    Gaurav Chatterjee, Laurent Latorre, Frédérick Mailly, Pascal Nouet, Nacim Hachelef, Coumar Oudéa
    DTIP: Design, Test, Integration and Packaging, Apr 2015, Montpellier, France. pp.1-5, &#x27E8;10.1109/DTIP.2015.7160966&#x27E9;. &#x27E8;lirmm-01235526&#x27E9;.
  23. Exploring the limit of ENG spatio-temporal filtering for velocity-selectivity
    Mariam Abdallah, Olivier Rossel, Serge Bernard, Fabien Soulier, Guy Cathébras
    NER: Neural Engineering, Apr 2015, Montpellier, France. &#x27E8;lirmm-01168118&#x27E9;.
  24. Embedded test instrument for on-chip phase noise evaluation of analog/IF signals
    Florence Azaïs, Stéphane David-Grignot, Laurent Latorre, François Lefevre
    DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2015, Belgrade, Serbia. pp.237-242, &#x27E8;10.1109/DDECS.2015.11&#x27E9;. &#x27E8;lirmm-01233136&#x27E9;.
  25. Statistical Energy Study for 28nm FDSOI Devices
    Rida Kheirallah, Jean-Marc Galliere, Aida Todri-Sanial, Gilles Ducharme, Nadine Azemard
    EuroSimE: Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, Apr 2015, Budapest, Hungary. &#x27E8;10.1109/EuroSimE.2015.7103149&#x27E9;. &#x27E8;lirmm-01168602&#x27E9;. <10.1109/EuroSimE.2015.7103149>
  26. A digital technique for the evaluation of SSB phase noise of analog/RF signals
    Florence Azaïs, Stéphane David-Grignot, François Lefevre, Laurent Latorre
    LATS: Latin-American Test Symposium, Mar 2015, Puerto Vallarta, Mexico. &#x27E8;10.1109/LATW.2015.7102407&#x27E9;. &#x27E8;lirmm-01233125&#x27E9;. <10.1109/LATW.2015.7102407>
  27. Interest of MIA in frequency domain?
    Mathieu Carbone, Michel Agoyan, Yannick Teglia, Gilles Ducharme, Philippe Maurine
    CS2: Cryptography and Security in Computing Systems, Jan 2015, Amtersdam, Netherlands. pp.35-35, &#x27E8;10.1145/2694805.2694812&#x27E9;. &#x27E8;lirmm-01111693&#x27E9;.

2014

  1. Evidence of a larger EM-induced fault model
    Sébastien Ordas, Ludovic Guillaume-Sage, Karim Tobich, Jean-Max Dutertre, Philippe Maurine
    CARDIS: Smart Card Research and Advanced Applications, Nov 2014, Paris, France. pp.245-259, &#x27E8;10.1007/978-3-319-16763-3_15&#x27E9;. &#x27E8;emse-01099037&#x27E9;.
  2. CMOS implementation of a 3-axis thermal convective accelerometer
    Frédérick Mailly, Huy Binh Nguyen, Laurent Latorre, Pascal Nouet
    IEEE SENSORS, Nov 2014, Valencia, Spain. pp.1471-1474, &#x27E8;10.1109/ICSENS.2014.6985292&#x27E9;. &#x27E8;lirmm-01166836&#x27E9;.
  3. Exploring potentials of perpendicular magnetic anisotropy STT-MRAM for cache design
    Xiaolong Zhang, Yuanqing Cheng, Weisheng Zhao, Youguang Zhang, Aida Todri-Sanial
    ICSICT: International Conference on Solid-State and Integrated Circuit Technology, Oct 2014, Guilin, China. &#x27E8;10.1109/ICSICT.2014.7021342&#x27E9;. &#x27E8;lirmm-01248593&#x27E9;. <10.1109/ICSICT.2014.7021342>
  4. Low-cost phase noise testing of complex RF ICs using standard digital ATE
    Stéphane David-Grignot, Florence Azaïs, Laurent Latorre, François Lefevre
    ITC: International Test Conference, Oct 2014, Seattle, WA, United States. &#x27E8;10.1109/TEST.2014.7035301&#x27E9;. &#x27E8;lirmm-01119356&#x27E9;. <10.1109/TEST.2014.7035301>
  5. Electromagnetic analysis, deciphering and reverse engineering of integrated circuits (E-MATA HARI)
    Laurent Chusseau, Rachid Omarouayache, Jérémy Raoult, Sylvie Jarrix, Philippe Maurine, Karim Tobich, Alexandre Boyer, Bertrand Vrignon, John Shepherd, Thanh-Ha Le, Maël Berthier, Lionel Rivière, Bruno Robisson, Anne-Lise Ribotta
    VLSI-SoC: Very Large Scale Integration - System-on-Chip, Oct 2014, Playa del Carmen, Mexico. pp.1-6, &#x27E8;10.1109/VLSI-SoC.2014.7004189&#x27E9;. &#x27E8;lirmm-01434592&#x27E9;.
  6. ElectroMagnetic Analysis and Fault Injection onto Secure Circuits
    Paolo Maistri, Regis Leveugle, Lilian Bossuet, Alain Aubert, Viktor Fischer, Bruno Robisson, Nicolas Moro, Philippe Maurine, Jean-Max Dutertre, Mathieu Lisart
    VLSI-SoC: Very Large Scale Integration - System-on-Chip, Oct 2014, Mexico, Mexico. &#x27E8;10.1109/VLSI-SoC.2014.7004182&#x27E9;. &#x27E8;emse-01099025&#x27E9;. <10.1109/VLSI-SoC.2014.7004182>
  7. Study of adaptive tuning strategies for Near Field Communication (NFC) transmitter module
    Mouhamadou Dieng, Florence Azaïs, Mariane Comte, Serge Bernard, Vincent Kerzérho, Michel Renovell, Thibault Kervaon, Paul-Henri Pugliesi-Conti
    IMS3TW'14: International Mixed-Signals, Sensors, and Systems Test Workshop, Sep 2014, Porto ALegre, Brazil. pp.1-6, &#x27E8;10.1109/IMS3TW.2014.6997401&#x27E9;. &#x27E8;lirmm-01119365&#x27E9;.
  8. Stochastic model for phase noise measurement from 1-bit signal acquisition
    Stéphane David-Grignot, Florence Azaïs, François Lefevre, Laurent Latorre
    IMS3TW'14: International Mixed-Signals, Sensors, and Systems Test Workshop, Sep 2014, Porto Alegre, Brazil. pp.1-6, &#x27E8;10.1109/IMS3TW.2014.6997400&#x27E9;. &#x27E8;lirmm-01119368&#x27E9;.
  9. Real-Time Testing of 90nm COTS SRAMs at Concordia Station in Antarctica
    Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri-Sanial, Arnaud Virazel, Philippe Cocquerez, Jean-Luc Autran, Antonio Litterio, Frédéric Wrobel, Frédéric Saigné
    NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France. &#x27E8;lirmm-01237709&#x27E9;. <http://ieee-npss.org/wp-content/uploads/2014/03/2014-NSREC.pdf>
  10. Efficient Dynamic Test Methods for COTS SRAMs Under Heavy Ion Irradiation
    Georgios Tsiligiannis, Luigi Dilillo, Viyas Gupta, Alberto Bosio, Patrick Girard, Aida Todri-Sanial, Arnaud Virazel, Helmut Puchner, Alexandre Louis Bosser, Arto Javanainen, Ari Virtanen, Frédéric Wrobel, Laurent Dusseau, Frédéric Saigné
    NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France. &#x27E8;lirmm-01237660&#x27E9;.
  11. A Delay Probability Metric for Input Pattern Ranking Under Process Variation and Supply Noise
    Anu Asokan, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
    ISVLSI: IEEE Computer Society Annual Symposium on VLSI, Jul 2014, Tampa, FL, United States. pp.226-231, &#x27E8;10.1109/ISVLSI.2014.42&#x27E9;. &#x27E8;lirmm-01248592&#x27E9;.
  12. Methodology for Self-Adaptation of Electronic Medical Devices: Application to an Intraocular Pressure Sensor
    Anthony Deluthault, Fabien Soulier, Serge Bernard, Vincent Kerzérho, Luc Menzenge, Philippe Cauvet
    IOLTS: International On-Line Testing Symposium, Jul 2014, Platja d'Aro, Spain. &#x27E8;lirmm-01084361&#x27E9;. <http://tima.imag.fr/conferences/IOLTS/iolts14/>
  13. Self-Adaptive NFC Systems
    Vincent Kerzérho, Florence Azaïs, Mouhamadou Dieng, Mariane Comte, Serge Bernard, Michel Renovell, Paul-Henri Pugliesi-Conti, Thibault Kervaon
    IOLTS: International On-Line Testing Symposium, Jul 2014, Platja d'Aro, Spain. &#x27E8;lirmm-01084355&#x27E9;.
  14. Solutions for the self-adaptation of communicating systems in operation
    Martin Andraud, Anthony Deluthault, Mouhamadou Dieng, Florence Azaïs, Serge Bernard, Philippe Cauvet, Mariane Comte, Thibault Kervaon, Vincent Kerzérho, Salvador Mir, Paul-Henri Pugliesi-Conti, Michel Renovell, Fabien Soulier, Emmanuel Simeu, Haralampos-G Stratigopoulos
    IOLTS: International On-line Test Symposium, Jul 2014, Platja d’Aro, Spain. pp.234-239, &#x27E8;10.1109/IOLTS.2014.6873705&#x27E9;. &#x27E8;hal-01118068&#x27E9;.
  15. Simplified review of DCDC switching noise and spectrum contents
    Adnan Fares, Sami Ajram, Guy Cathébras
    PRIME: Ph.D. Research in Microelectronics and Electronics, Jun 2014, Grenoble, France. pp.1-4, &#x27E8;10.1109/PRIME.2014.6872677&#x27E9;. &#x27E8;lirmm-01246095&#x27E9;.
  16. Phase noise measurement on IF analog signals using standard digital ATE resources
    Stéphane David-Grignot, Laurent Latorre, Florence Azaïs, François Lefevre
    NEWCAS: New Circuits and Systems, Jun 2014, Trois-Rivieres, Canada. pp.121-124, &#x27E8;10.1109/NEWCAS.2014.6933998&#x27E9;. &#x27E8;lirmm-01119359&#x27E9;.
  17. Performance exploration of partially connected 3D NoCs under manufacturing variability
    Anelise Kologeski, Fernanda Lima Kastensmidt, Vianney Lapotre, Abdoulaye Gamatié, Gilles Sassatelli, Aida Todri-Sanial
    NEWCAS: New Circuits and Systems, Jun 2014, Trois-Rivieres, QC, Canada. pp.61-64, &#x27E8;10.1109/NEWCAS.2014.6933985&#x27E9;. &#x27E8;lirmm-01248595&#x27E9;.
  18. Investigations on alternate analog/RF test with model redundancy
    Haithem Ayari, Florence Azaïs, Serge Bernard, Vincent Kerzérho, Syhem Larguech, Mariane Comte, Michel Renovell
    STEM Workshop, May 2014, Paderborn, Germany. &#x27E8;lirmm-01119374&#x27E9;. <http://www.ets14.de/pages/workshops/stem-workshop.php>
  19. iBoX — Jitter based Power Supply Noise sensor
    Miroslav Valka, Alberto Bosio, Luigi Dilillo, Aida Todri-Sanial, Arnaud Virazel, Patrick Girard, Philippe Debaud, Stephane Guilhot
    ETS: European Test Symposium, May 2014, Paderborn, United States. pp.1-2, &#x27E8;10.1109/ETS.2014.6847830&#x27E9;. &#x27E8;lirmm-01248601&#x27E9;.
  20. A Comprehensive Evaluation of Functional Programs for Power-Aware Test
    Aymen Touati, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Arnaud Virazel, Paolo Bernardi
    NATW: North Atlantic Test Workshop, May 2014, Johnson City, NY, United States. pp.69-72, &#x27E8;10.1109/NATW.2014.23&#x27E9;. &#x27E8;lirmm-01248597&#x27E9;.
  21. Investigation of horizontally aligned carbon nanotubes for efficient power delivery in 3D ICs
    Aida Todri-Sanial
    SPI: Signal and Power Integrity, May 2014, Ghent, Belgium. &#x27E8;10.1109/SaPIW.2014.6844535&#x27E9;. &#x27E8;lirmm-01973590&#x27E9;. <10.1109/SaPIW.2014.6844535>
  22. A frequency leakage model for SCA
    Sébastien Tiran, Sébastien Ordas, Yannick Teglia, Michel Agoyan, Philippe Maurine
    HOST: Hardware-Oriented Security and Trust, May 2014, Arlington, VA, United States. pp.97-100, &#x27E8;10.1109/HST.2014.6855577&#x27E9;. &#x27E8;lirmm-01096058&#x27E9;.
  23. Path delay test in the presence of multi-aggressor crosstalk, power supply noise and ground bounce
    Anu Asokan, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
    DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.207-212, &#x27E8;10.1109/DDECS.2014.6868791&#x27E9;. &#x27E8;lirmm-01248599&#x27E9;.
  24. Protecting combinational logic in pipelined microprocessor cores against transient and permanent faults
    Imran Wali, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial
    DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.223-225, &#x27E8;10.1109/DDECS.2014.6868794&#x27E9;. &#x27E8;lirmm-01248598&#x27E9;.
  25. Test and diagnosis of power switches
    Miroslav Valka, Alberto Bosio, Luigi Dilillo, Aida Todri-Sanial, Arnaud Virazel, Patrick Girard, Philippe Debaud, Stephane Guilhot
    DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.213-218, &#x27E8;10.1109/DDECS.2014.6868792&#x27E9;. &#x27E8;lirmm-01248590&#x27E9;.
  26. Timing-aware ATPG for critical paths with multiple TSVs
    Carolina Momo Metzeler, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel
    DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.116-121, &#x27E8;10.1109/DDECS.2014.6868774&#x27E9;. &#x27E8;lirmm-01248600&#x27E9;.
  27. An intra-cell defect grading tool
    Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Stefano Bernabovi, Paolo Bernardi
    DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.298-301, &#x27E8;10.1109/DDECS.2014.6868814&#x27E9;. &#x27E8;lirmm-01248591&#x27E9;.
  28. On Adaptive Bandwidth Selection for Efficient MIA
    Mathieu Carbone, Sébastien Tiran, Sébastien Ordas, Michel Agoyan, Yannick Teglia, Gilles R. Ducharme, Philippe Maurine
    COSADE: Constructive Side-Channel Analysis and Secure Design, Apr 2014, Paris, France. pp.82-97, &#x27E8;10.1007/978-3-319-10175-0_7&#x27E9;. &#x27E8;lirmm-01096033&#x27E9;.
  29. Attacking Randomized Exponentiations Using Unsupervised Learning
    Guilherme Perin, Laurent Imbert, Lionel Torres, Philippe Maurine
    COSADE: Constructive Side-Channel Analysis and Secure Design, Apr 2014, Paris, France. pp.144-160, &#x27E8;10.1007/978-3-319-10175-0_11&#x27E9;. &#x27E8;lirmm-01096039&#x27E9;.
  30. TSV aware timing analysis and diagnosis in paths with multiple TSVs
    Carolina Momo Metzeler, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel
    ISVLSI: IEEE Computer Society Annual Symposium on VLSI, Apr 2014, Napa, CA, United States. &#x27E8;10.1109/VTS.2014.6818772&#x27E9;. &#x27E8;lirmm-01248594&#x27E9;. <10.1109/VTS.2014.6818772>
  31. Electro-thermal characterization of Through-Silicon Vias
    Aida Todri-Sanial
    EuroSimE, Apr 2014, Ghent, Belgium. &#x27E8;10.1109/EuroSimE.2014.6813859&#x27E9;. &#x27E8;lirmm-01973585&#x27E9;. <10.1109/EuroSimE.2014.6813859>
  32. Monitoring of particle deposition in cleanrooms: State-of-the-art
    Pascal Nouet, Nina Menant, Delphine Faye, Xavier Lafontan, Djemel Lellouchi
    DTIP: Design, Test, Integration and Packaging, Apr 2014, Cannes, France. pp.368-371, &#x27E8;10.1109/DTIP.2014.7056699&#x27E9;. &#x27E8;lirmm-01166805&#x27E9;.
  33. Direct digital synthesiser (DDS) design parameters optimisation for vibrating MEMS sensors: Optimisation of phase accumulator, Look-Up Table (LUT) and Digital to Analog Converter (DAC) sizes
    Baptiste Marechal, Jean Guérard, Raphael Levy, Olivier Le Traon, Frédérick Mailly, Pascal Nouet
    DTIP: Design, Test, Integration and Packaging, Apr 2014, Cannes, France. pp.1-5, &#x27E8;10.1109/DTIP.2014.7056692&#x27E9;. &#x27E8;lirmm-01166917&#x27E9;.
  34. Efficiency of a glitch detector against electromagnetic fault injection
    Loic Zussa, Amine Dehbaoui, Karim Tobich, Jean-Max Dutertre, Philippe Maurine, Ludovic Guillaume-Sage, Jessy Clédière, Assia Tria
    DATE: Design, Automation and Test in Europe, Mar 2014, Dresden, Germany. pp.1-6, &#x27E8;10.7873/DATE.2014.216&#x27E9;. &#x27E8;lirmm-01096047&#x27E9;.
  35. New implementions of predictive alternate analog/RF test with augmented model redundancy
    Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, Michel Renovell
    DATE: Design, Automation and Test in Europe, Mar 2014, Dresden, Germany. &#x27E8;10.7873/DATE2014.144&#x27E9;. &#x27E8;lirmm-00994714&#x27E9;. <10.7873/DATE2014.144>
  36. Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testing
    Syhem Larguech, Florence Azaïs, Serge Bernard, Vincent Kerzérho, Mariane Comte, Michel Renovell
    LATW: Latin American Test Workshop, Mar 2014, Fortaleza, Brazil. pp.1-6, &#x27E8;10.1109/LATW.2014.6841930&#x27E9;. &#x27E8;lirmm-01119361&#x27E9;.
  37. Power supply noise-aware workload assignments for homogeneous 3D MPSoCs with thermal consideration
    Yuanqing Cheng, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel
    ASP-DAC: Asia and South Pacific Design Automation Conference, Jan 2014, Singapore, Singapore. pp.544-549, &#x27E8;10.1109/ASPDAC.2014.6742948&#x27E9;. &#x27E8;lirmm-01248596&#x27E9;.

Tags

CMOS, MEMS, Design of integrated circuits, analog, mixed, digital, emerging technology, physical modeling, statistical design, life monitoring, component security.

Last update on 20/03/2019