SmartIES: Smart Integrated Electronic Systems
The SmartIES (Smart Integrated Electronic Systems) team focuses on design methods and modeling devices, systems, and integrated circuits. These activities comprise the development of methods, tools, and principles based on physical or electrical simulation approaches. Our main contributions include work on the continuity and extension of, or break with, Moore’s law, the impact of emerging technologies (FDSOI and FINFET) on design methods or functional block architectures, integration approaches (3D stacking and 3D monolithic integration), and heterogeneous integration with novel devices (MRAM, Carbon Nanotubes) on inte-grated circuits. This research is usually paralleled by technological demonstrations (specific circuits, bench experiments, model integration in simulators, etc.), which allow us to illustrate our work with practical examples relating to the transversal research lines of the Department.
Research topics
The design of integrated circuits and systems meeting power and delay constraints has relied upon the continued scaling of silicon CMOS technology. But in the advent of Internet of Things (IoT) and Artificial Intelligence (AI), applications are evolving and demand processing of massive amount of data. Moreover, such applications impose stringent constraints on energy efficiency, performance, reliability and security. In this context, SmartIES aims at developing innovative design solutions with advanced CMOS or emerging technologies.
SmartIES activities are organized in three areas:
Emerging technologies and Advanced CMOS
Keywords: 3D integration, Carbon Nanotubes, Quantum computing, Adiabatic Logic, MRAM, MEMS/NEMS, CNT based biosensors, advanced analogue design, adaptive design solutions, statistical based design, low power design.
SmartIES investigates materials beyond silicon, which could help create the next generation of ICs. Carbon nanotubes are one-dimensional (1D) material and are among the contenders for energy efficient electronics. Other promising contenders are the two-dimensional (2D) materials (graphene, MoS2, etc.) as well as the vertical stacks of different two-dimensional materials known as Van Der Waals heterostructures.
Similarly, spintronics based memory is considered as a potential low power alternative to replace CMOS memory. In the quest of energy efficiency, SmartIES explorezs vertical integration such as three-dimensional (3D) stacking and monolithic 3D (M3D) integration to enable higher functionality, small form factor and heterogeneous implementation. Moreover, novel computing paradigms (adiabatic reversible logic, neuromorphic and quantum computing) are investigated to re-think how architectures and systems are designed to optimize power, performance and reliability.
But before, designing ICs with these emerging technologies necessitates the foundation of behavioral and realistic models for devices, interconnects and memory cells. Therefore, our research focuses on developing physics-driven electrical, thermal, reliability and statistical models to investigate various technology parameters such as process variation, temperature, noise, performance, power consumption and overall energy efficiency.
In recent years, we have researched on:
- Physics-driven modeling and simulation for devices and interconnects based on 1D and 2D materials for integrated circuits regarding power, performance, reliability, adaptability and scalability.
- Exploiting novel 1D/2D field-effect devices for biosensing applications.
- Physics-driven modeling and simulation for magnetic MRAM memories in integrated circuits and study their performance and reliability under temperature variations.
- Modeling and design of micro- and nano-electromechanical switches (MEMS/NEMS)
- Physical design and optimization techniques for energy efficient and reliable system design while considering process variations.
- Design space exploration of various integration schemes such as 3D stacking and monolithic 3D integration for large-scale energy efficient system design
- Exploring novel computing paradigms such as adiabatic reversible logic, neuromorphic computing and quantum computing.
Adaptive Sensors and Multi-Sensors Systems
Keywords: Data Fusion, Biosensors, Life and Environment Monitoring, Sensors for Physiological signal Communicating Systems, Bio Impedance Sensing, Signal Processing.
SmartIES develops sensors and/or associated conditioning electronics for specific or generic applications. Specific systems were developed for micro-system conditioning, bioelectric signal measurement (peripheral nervous system), intra-ocular pressure measurement (glaucoma diagnosis or prevention), bio-impedance spectroscopy (fat content, vitellogenesis in fish) and CNT-FET based biosensors (cancer-related enzymatic activity).
Moreover, generic interfaces for resistive or capacitive sensors are developed for conditioning and analog-to-digital signal conversion. They are in particular based on architectures or oscillators and are characterized as being compact, robust, adaptive, low-power and the nearest possible to the sensor.
SmartIES also designs connected multi-sensor systems. Main addressed applications are inertial navigation and marine species monitoring (tuna, marlin, turtles) both in terms of geolocation and physiological parameters measurements.
Last, the constant decreasing of the price of sensors enables heavy redundancy in system design. SmartIES develops data-fusion algorithms based on artificial neural networks, complementary filtering or dynamic weightening in order to improve resolution or robustness of these measurement systems.
Secure Integrated Circuits and Systems
Keywords: Side-Channel Attacks, Fault Injection, embedded cryptography, integrated countermeasures, IC integrity and authenticity, statistical and learning techniques, Signal Processing.
SmartIES aims at developing innovative solutions for designing and characterizing secure integrated circuits and systems against various attacks (side-channel and fault injection) aiming at denial of service or at extracting secret information. More precisely, smartIES has developed expertise related to the exploitation of electromagnetic (EM) waves and works at :
- Identifying unrevealed threats and new fault injection and side-channel attacks,
- Modeling the EM leakages and the impact of EM interference on ICs,
- Developing tools and platforms for an efficient characterization of ICs,
- Providing solutions to evaluate security during the design flow of ICs,
- Defining hardware countermeasures at the right cost,
- Developing solutions to detect hardware Trojans and counterfeits.
These activities are carried out through collaborative projects with industry, academics and government agencies or through direct partnerships. Technological transfers have been done towards some of our partners aiming notably at using our EM fault or Body Bias injection solutions; SmartIES being pioneer in this area.
Members
Staff
- Nadine Azémard-Crestani, Research Fellow CNRS
- Serge Bernard, Research Director CNRS
- Guy Cathebras, Professor UM
- Jean-Marc Galliere, Assistant Professor UM
- Vincent Kerzerho, Research Fellow CNRS
- Laurent Latorre, Professor UM
- Frédérick Mailly, Assistant Professor UM
- Philippe Maurine, Assistant Professor UM
- Pascal Nouet, Professor UM
- Michel Renovell, Research Director CNRS
- Fabien Soulier, Assistant Professor UM
- Aida Todri-Sanial, Research Director CNRS
Associates & Students
- Sonia Abdellatif, PhD student Financeur étranger
- Madeleine Abernot, PhD student CNRS
- Neha Baranwal, Research associate UM
- Fathi Ben Ali, Research associate CNRS
- Alexis Blaya David, Research associate UM
- Gabriele Boschetto, Research associate CNRS
- Stefania Carapezzi, Research associate CNRS
- Gwenaël Chaillou, PhD student CNRS
- Nicolas Champauzas, PhD student UM
- Geoffrey Chancel, PhD student UM
- Valence Cristiani, PhD student CEA
- Corentin Delacour, PhD student CNRS
- Titouan Etienne, Research associate CNRS
- Pierre Gogendeau, PhD student IFREMER
- Mohan Julien, Research associate CNRS
- Eirini Karachristou, Research associate CNRS
- Jonathan Miquel, PhD student UM
- Siyuan Niu, PhD student UM
- Davide Poggi, PhD student STMicroelectronics SAS
- Josue Rivera Velazquez, PhD student
- Kaan Sevin, PhD student
- Ibrahim Shankhour, PhD student UM
- Adrien Suau, PhD student CERFACS
- Virgil Taillandier, Research associate UM
- Julien Toulemont, PhD student UM
Publications 2014 - 2019: Evaluation period
International Journals
2020
- Oxygen uptake, heart rate and activities of locomotor muscles during a critical swimming speed protocol in the gilthead sea bream Sparus aurataMouniboudine Hachim, Tristan Rouyer, Gilbert Dutto, Vincent Kerzérho, Serge Bernard, Jérôme Bourjea, David MckenzieJournal of Fish Biology, Wiley, 2020. <10.1111/jfb.14621>
- Quantum circuit design methodology for multiple linear regressionSanchayan Dutta, Adrien Suau, Sagnik Dutta, Suvadeep Roy, Bikash Behera, Prasanta PanigrahiIET Quantum Communication, Wiley, In press. <10.1049/iet-qtc.2020.0013>
- A Hardware-Aware Heuristic for the Qubit Mapping Problem in the NISQ EraSiyuan Niu, Adrien Suau, Gabriel Staffelbach, Aida Todri-SanialIEEE Transactions on Quantum Engineering, IEEE, In press. <10.1109/TQE.2020.3026544>
- 1D Nanomaterial‐Based Highly Stretchable Strain Sensors for Human Movement Monitoring and Human–Robotic Interactive SystemsAbhishek Singh Dahiya, Thierry Gil, J Thireau, Nadine Azemard, Alain Lacampagne, Benoît Charlot, Aida Todri-SanialAdvanced Electronic Materials, Wiley, In press. <10.1002/aelm.202000547>
- Modeling and Simulating Electromagnetic Fault InjectionMathieu Lisart, Philippe Maurine, Mathieu DumontIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE, In press, pp.1-1.
- Tagging Atlantic bluefin tuna from a Mediterranean spawning ground using a purse seinerTristan Rouyer, Sylvain Bonhommeau, Nicolas Giordano, François Giordano, Saviour Ellul, Giovanni Ellul, Simeon Deguara, Bertrand Wendling, Serge Bernard, Vincent KerzérhoFisheries Research, Elsevier, 2020, 226, pp.#105522.
- Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF CircuitsHassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, François LefèvreJournal of Electronic Testing, Springer Verlag, 2020, 36 (2), pp.189-203.
- Energy Autonomous Wearable Sensors for Smart Healthcare: A ReviewAbhishek Singh Dahiya, J Thireau, Jamila Boudaden, Swatchith Lal, Umair Gulzar, Yan Zhang, Thierry Gil, Nadine Azemard, Peter Ramm, Tim Kiessling, Cian O'Murchu, Fredrik Sebelius, Jonas Tilly, Colm Glynn, Shane Geary, Colm O'Dwyer, Kafil Razeeb, Alain Lacampagne, Benoit Charlot, Aida Todri-SanialJournal of The Electrochemical Society, Electrochemical Society, 2020, JES Focus Issue on Sensor Reviews, 167 (3). <10.1149/2.0162003JES>
2019
- Emerging technologies and computing paradigms for the Internet of Everything applicationsAida Todri-Sanial, Xueqing Li, Juan NúñezInternational Journal of Circuit Theory and Applications, Wiley, 2019, 47 (9), pp.1381-1382.
- Very Low Resource Digital Implementation of Bioimpedance AnalysisFabien Soulier, Achraf Lamlih, Vincent Kerzérho, Serge Bernard, Tristan RouyerSensors, MDPI, 2019, 19 (15), pp.3381-3394.
- Investigation of Pt-Salt-Doped-Standalone-Multiwall Carbon Nanotubes for On-Chip Interconnect ApplicationsJie Liang, Rongmei Chen, Raphaël Ramos, Jaeyoung Lee, Hanako Okuno, Dipankar Kalita, Vihar P. Georgiev, Salim Berrada, Toufik Saadi, Benjamin Uhlig, Katherina Lilienthal, Abitha Dhavamani, Fabian Konemann, Bernd Gotsmann, Bingan Chen, Asenov Asen, Jean Dijon, Aida Todri-SanialIEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2019, 66 (5), pp.2346-2352.
- From theory to practice: horizontal attacks on protected implementations of modular exponentiationsIbrahima Diop, Yanis Linge, Thomas Ordas, Pierre-Yvan Liardet, Philippe MaurineJournal of Cryptographic Engineering, Springer, 2019, 9 (1), pp.37-52.
- Low-Cost Digital Test Solution for Symbol Error Detection of RF ZigBee TransmittersThibault Vayssade, Florence Azaïs, Laurent Latorre, Francois LefèvreIEEE Transactions on Device and Materials Reliability, Institute of Electrical and Electronics Engineers, 2019, 19 (1), pp.16-24.
- Tagging Atlantic bluefin tuna from a farming cage: An attempt to reduce handling times for large scale deploymentsTristan Rouyer, Sylvain Bonhommeau, Nicolas Giordano, Saviour Ellul, Giovanni Ellul, Simeon Deguara, Bertrand Wendling, Mohamed Moez Belhaj, Vincent Kerzérho, Serge BernardFisheries Research, Elsevier, 2019, 211, pp.27-31.
- Editorial TVLSI Positioning—Continuing and Accelerating an Upward TrajectoryMassimo Alioto, Magdy S. Abadir, Tughrul Arslan, Chirn Chye Boon, Andreas Burg, Chip-Hong Chang, Meng-Fan Chang, Yao-Wen Chang, Poki Chen, Pasquale Corsonello, Paolo Crovetti S., Shiro Dosho, Rolf Drechsler, Ibrahim (abe) M Elfadel, Ruonan Han, Masanori Hashimoto, Chun-Huat Heng, Deukhyoun Heo, Tsung-Yi Ho, Houman Homayoun, Yuh-Shyan Hwang, Ajay Joshi, Rajiv L Joshi, Tanay Karnik, Chulwoo Kim, Tae-Hyoung Kim, Jaydeep Kulkarni, Volkan Kursun, Yoonmyung Lee, Hai Helen Li, Huawei Li, Prabhat Mishra, Baker Mohammad, Mehran Mozaffari Kermani, Makoto Nagata, Koji Nii, Partha Pratim Pande, Bipul C. Paul, Vasilis F. Pavlidis, Jose Pineda de Gyvez, Ioannis Savidis, Patrick Schaumont, Fabio Sebastiano, Anirban Sengupta, Mingoo Seok, Mircea Stan, Mark Mohammad Tehranipoor, Aida Todri-Sanial, Marian Verhelst, Valerio Vignoli, Xiaoqing Wen, Jiang Xu, Wei Zhang, Zhengya Zhang, Zhou Jun, Mark Zwolinski, Stacey Weber JacksonIEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE, 2019, 27 (2), pp.253-280.
- Actions de vulgarisation du guichet national de formation continue du GIP-CNFMBéatrice Pradarelli, Pascal Nouet, Pascal Benoit, Olivier BonnaudJournal sur l'enseignement des sciences et technologies de l'information et des systèmes, EDP Sciences, 2019, 18, pp.1022.
- Breaking the speed-power-accuracy trade-off in current mirror with non-linear CCII feedbackMohan Julien, Serge Bernard, Fabien Soulier, Vincent Kerzérho, Guy CathébrasMicroelectronics Journal, Elsevier, 2019, 83, pp.77-85.
- Simulation and Experimental Demonstration of the Importance of IR-Drops During Laser Fault-InjectionRaphael Andreoni Camponogara-Viera, Philippe Maurine, Jean-Max Dutertre, Rodrigo Possamai BastosIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE, In press. <10.1109/TCAD.2019.2928972>
2018
- Effects of extraction method and storage of dry tissue on marine lipids and fatty acidsFany Sardenne, Nathalie Bodin, Luisa Métral, Anaïs Crottier, Fabienne Le Grand, Antoine Bideau, Blandine Brisset, Jérôme Bourjea, Claire Saraux, Sylvain Bonhommeau, Vincent Kerzérho, Serge Bernard, Tristan RouyerAnalytica Chimica Acta, Elsevier Masson, 2018, 1051, pp.82-93.
- Atomistic to Circuit-Level Modeling of Doped SWCNT for On-Chip InterconnectsJie Liang, Jaehyun Lee, Salim Berrada, Vihar Georgiev, Reetu Raj Pandey, Rongmei Chen, Asen Asenov, Aida Todri-SanialIEEE Transactions on Nanotechnology, Institute of Electrical and Electronics Engineers, 2018, 17 (6), pp.1084-1088.
- A high-reliability and low-power computing-in-memory implementation within STT-MRAMLiuyang Zhang, Erya Deng, Hao Cai, You Wang, Lionel Torres, Aida Todri-Sanial, Youguang ZhangMicroelectronics Journal, Elsevier, 2018, 81, pp.69-75.
- System-level simulations of multi-sensor systems and data fusion algorithmsJosué Manuel Rivera Velázquez, Frédérick Mailly, Pascal NouetMicrosystem Technologies, Springer Verlag, In press. <10.1007/s00542-018-4204-8>
- Power Supply Noise Aware Task Scheduling on Homogeneous 3D MPSoCs Considering the Thermal ConstraintYing-Lin Zhao, Jianlei Yang, Weisheng Zhao, Aida Todri-Sanial, Yuanqing ChengJournal of Computer Science and Technology, Springer Verlag, 2018, 33 (5), pp.966-983.
- Variability Study of MWCNT Local Interconnects Considering Defects and Contact Resistances - Part II: Impact of Charge Transfer DopingRongmei Chen, Jie Liang, Jaehyun Lee, Vihar P. Georgiev, Raphael Ramos, Hanako Okuno, Dipankar Kalita, Yuanqing Cheng, Liuyang Zhang, Reetu Raj Pandey, Salvatore Amoroso, Campbell Millar, Asenov Asen, Jean Dijon, Aida Todri-SanialIEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2018, 65 (11), pp.4963-4970.
- Variability Study of MWCNT Local Interconnects Considering Defects and Contact Resistances - Part I: Pristine MWCNTRongmei Chen, Jie Liang, Jaehyun Lee, Vihar P. Georgiev, Raphael Ramos, Hanako Okuno, Dipankar Kalita, Yuanqing Cheng, Liuyang Zhang, Reetu Raj Pandey, Salvatore Amoroso, Campbell Millar, Asenov Asen, Jean Dijon, Aida Todri-SanialIEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2018, 65 (11), pp.4955-4962.
- Assessing Body Built-In Current Sensors for Detection of Multiple Transient FaultsRaphael Andreoni Camponogara-Viera, Jean-Max Dutertre, Marie-Lise Flottes, Olivier Potin, Giorgio Di Natale, Bruno Rouzeyre, Rodrigo Possamai BastosMicroelectronics Reliability, Elsevier, 2018, 88-90 (29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2018)), pp.128-134.
- Understanding Electromigration in Cu-CNT Composite Interconnects: A Multiscale Electrothermal Simulation StudyJaehyun Lee, Salim Berrada, Fikru Adamu-Lema, Nicole Nagy, Vihar P. Georgiev, Toufik Sadi, Jie Liang, Raphael Ramos, Hamilton Carrillo-Nunez, Dipankar Kalita, Katharina Lilienthal, Marcus Wislicenus, Reetu Raj Pandey, Bingan Chen, Kenneth B. K. Teo, Goncalo Goncalves, Hanako Okuno, Benjamin Uhlig, Aida Todri-Sanial, Jean Dijon, Asen AsenovIEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2018, 65 (9), pp.3884-3892.
- On-chip Generation of Sine-wave Summing Digital Signals: an Analytic Study Considering Implementation ConstraintsStéphane David-Grignot, Achraf Lamlih, Mohamed Moez Belhaj, Vincent Kerzérho, Florence Azaïs, Fabien Soulier, Philippe Freitas, Tristan Rouyer, Sylvain Bonhommeau, Serge BernardJournal of Electronic Testing, Springer Verlag, 2018, 34 (3), pp.281-290.
- A Temperature-Hardened Sensor Interface with a 12-Bit Digital Output Using a Novel Pulse Width Modulation TechniqueEmna Chabchoub, Franck Badets, Frédérick Mailly, Pascal Nouet, Mohamed MasmoudiSensors, MDPI, 2018, 18 (4), pp.1107-1227.
- Addressing the Thermal Issues of STT-MRAM From Compact Modeling to Design TechniquesLiuyang Zhang, Yuanqing Cheng, Kang Wang, Lionel Torres, Youguang Zhang, Aida Todri-SanialIEEE Transactions on Nanotechnology, Institute of Electrical and Electronics Engineers, 2018, 17 (2), pp.345-352.
- Estimating the Signal-to-Noise ratio under repeated sampling of the same centered signal: applications to side-channel attacks on a cryptoprocessorGilles R. Ducharme, Philippe MaurineIEEE Transactions on Information Theory, Institute of Electrical and Electronics Engineers, 2018, 64 (9), pp.6333-6339.
2017
- An On-Chip Technique to Detect Hardware Trojans and Assist Counterfeit IdentificationMaxime Lecomte, Jacques Jean-Alain Fournier, Philippe MaurineIEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE, 2017, 25 (12), pp.3317-3330.
- Method for evaluation of transient-fault detection techniquesRaphael Andreoni Camponogara-Viera, Rodrigo Possamai Bastos, Jean-Max Dutertre, Philippe Maurine, Rodrigo Iga JadueMicroelectronics Reliability, Elsevier, 2017, 76-77, pp.68-74.
- New Calibration Technique of Contact-less Resonant BiosensorAnthony Deluthault, Vincent Kerzérho, Serge Bernard, Fabien Soulier, Philippe CauvetJournal of Electronic Testing, Springer Verlag, 2017, 33 (3), pp.365-375.
- Mutual information analysis: higher-order statistical moments, efficiency and efficacyMathieu Carbone, Yannick Teglia, Gilles R. Ducharme, Philippe MaurineJournal of Cryptographic Engineering, Springer, 2017, Journal of Cryptographic Engineering, 7 (1), pp.1-17.
- Electromagnetic fault injection: the curse of flip-flopsSébastien Ordas, Ludovic Guillaume-Sage, Philippe MaurineJournal of Cryptographic Engineering, Springer, 2017, 7 (3), pp.183-197.
- A Survey of Carbon Nanotube Interconnects for Energy Efficient Integrated CircuitsAida Todri-Sanial, Raphael Ramos, Hanako Okuno, Jean Dijon, Abitha Dhavamani, Marcus Widlicenus, Katharina Lilienthal, Benjamin Uhlig, Toufik Sadi, Vihar Georgiev, Asen Asenov, Salvatore Amoroso, Andrew Pender, Andrew Brown, Campbell Millar, Fabian Motzfeld, Bernd Gotsmann, Jie Liang, Goncalo Goncalves, Nalin Rupesinghe, Ken TeoIEEE Circuits and Systems Magazine -New Series-, Institute of Electrical and Electronics Engineers, 2017, 17 (2), pp.47-62.
- Smart-MEMS based inertial measurement units: gyro-free approach to improve the gradeGaurav Chatterjee, Laurent Latorre, Frédérick Mailly, Pascal Nouet, Nacim Hachelef, Coumar OudéaMicrosystem Technologies, Springer Verlag, 2017, 23 (9), pp.3969-3978.
- A fully-digital and ultra-low-power front-end for differential capacitive sensorsPatcharee Kongpark, Souha Hacine, Laurent Latorre, Frédérick Mailly, Pascal NouetMicrosystem Technologies, Springer Verlag, 2017, 23 (9), pp.3991-4000.
- Efficient Objective Metric Tool for Medical Electrical Device Development: Eye Phantom for Glaucoma Diagnosis DeviceAnthony Deluthault, Luc Mezenge, Philippe Cauvet, Vincent Kerzérho, Fabien Soulier, Serge BernardJournal of Sensors, Hindawi Publishing Corporation, 2017, 2017, pp.ID 8436123.
2016
- Temperature Impact Analysis and Access Reliability Enhancement for 1T1MTJ STT-RAMBi Wu, Yuanqing Cheng, Jianlei Yang, Aida Todri-Sanial, Weisheng ZhaoIEEE Transactions on Reliability, Institute of Electrical and Electronics Engineers, 2016, 65 (4), pp.1755-1768.
- Alleviating Through-Silicon-Via Electromigration for 3-D Integrated Circuits Taking Advantage of Self-Healing EffectYuanqing Cheng, Aida Todri-Sanial, Jianlei Yang, Weisheng ZhaoIEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE, 2016, 24 (11), pp.3310-3322.
- A Study of 3-D Power Delivery Networks With Multiple Clock DomainsAida Todri-Sanial, Yuanqing ChengIEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE, 2016, 24 (11), pp.3218-3231.
- Energy Study for 28 nm Fully Depleted Silicon-On-Insulator DevicesRida Kheirallah, Gilles R. Ducharme, Nadine AzemardJournal of Low Power Electronics, American Scientific Publishers, 2016, 12 (1), pp.58-63.
- SSB Phase Noise Evaluation of Analog/IF Signals on Standard Digital ATEFlorence Azaïs, Stéphane David-Grignot, Laurent Latorre, François LefevreJournal of Electronic Testing, Springer Verlag, 2016, 32 (1), pp.69-82.
- Electrothermal Analysis of Carbon Nanotubes Power Delivery Networks for Nanoscale Integrated CircuitsAlessandro Magnani, Massimiliano De Magistris, Aida Todri-Sanial, Antonio MaffucciIEEE Transactions on Nanotechnology, Institute of Electrical and Electronics Engineers, 2016, 15 (3), pp.380-388.
- Digital Embedded Test Instrument for On-Chip Phase Noise Testing of Analog/RF Integrated CircuitsFlorence Azaïs, Stéphane David-Grignot, Laurent Latorre, François LefevreJournal of Circuits, Systems, and Computers, World Scientific Publishing, 2016, 25 (3), pp.#1640014.
- A phantom axon setup for validating models of action potential recordingsOlivier Rossel, Fabien Soulier, Serge Bernard, David Guiraud, Guy CathébrasMedical and Biological Engineering and Computing, Springer Verlag, 2016, 10 (4), pp.671-678.
2015
- Efficiency evaluation of analog/RF alternate test: Comparative study of indirect measurement selection strategiesSyhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, Michel RenovellMicroelectronics Journal, Elsevier, 2015, 46 (11), pp.1091-1102.
- Special Issue on Advances in Design of Ultra-Low Power Circuits and Systems in Emerging TechnologiesAida Todri-Sanial, Sanjukta BhanjaACM Journal on Emerging Technologies in Computing Systems, Association for Computing Machinery, 2015, Guest Editorial, 12 (2), pp.#11.
- A new monolithic 3-axis thermal convective accelerometer: principle, design, fabrication and characterizationHuy Binh Nguyen, Frédérick Mailly, Laurent Latorre, Pascal NouetMicrosystem Technologies, Springer Verlag, 2015, 21 (9), pp.1867-1877.
- Phase Noise Testing of Analog/IF Signals Using Digital ATE: A New Post-Processing Algorithm for Extended Measurement RangeStéphane David-Grignot, Florence Azaïs, Laurent Latorre, François LefevreJournal of Electronic Testing, Springer Verlag, 2015, 31 (5-6), pp.443-459.
- Pressure sensing method based on the transient response of a thermally actuated micro-wireOlivier Legendre, Hervé Bertin, Hervé Mathias, Ming Zhang, Souhil Megherbi, Frédérick MaillySensors and Actuators A: Physical , Elsevier, 2015, 221, pp.115-122.
- Vertical and horizontal correlation attacks on RNS-based exponentiationsGuilherme Perin, Laurent Imbert, Philippe Maurine, Lionel TorresJournal of Cryptographic Engineering, Springer, 2015, 5 (3), pp.171-185.
2014
- A model of the leakage in the frequency domain and its application to CPA and DPASébastien Tiran, Sébastien Ordas, Yannick Teglia, Michel Agoyan, Philippe MaurineJournal of Cryptographic Engineering, Springer, 2014, 4 (3), pp.197-212.
- Evaluating a Radiation Monitor for Mixed-Field Environments based on SRAM TechnologyGeorgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri-Sanial, Arnaud Virazel, Julien Mekki, Markus Brugger, Frédéric Wrobel, Frédéric SaignéJournal of Instrumentation, IOP Publishing, 2014, 9 (5), pp.#C05052.
- Multiple Cell Upset Classification in Commercial SRAMsGeorgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri-Sanial, Arnaud Virazel, Helmut Puchner, Christopher Frost, Frédéric Wrobel, Frédéric SaignéIEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2014, 61 (4), pp.1747-1754.
- Enhancing Confidence in Indirect Analog/RF Testing against the Lack of Correlation between Regular Parameters and Indirect MeasurementsHaithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, Michel RenovellMicroelectronics Journal, Elsevier, 2014, 45 (3), pp.336-344.
- An SRAM Based Monitor for Mixed-Field Radiation EnvironmentsGeorgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri-Sanial, Arnaud Virazel, Julien Mekki, Markus Brugger, Frédéric Wrobel, Frédéric SaignéIEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2014, 61 (4), pp.1663-1670.
- Study of Low-Cost Electrical Test Strategies for Post-Silicon Yield Improvement of MEMS Convective AccelerometersAhmed Rekik, Florence Azaïs, Frédérick Mailly, Pascal NouetJournal of Electronic Testing, Springer Verlag, 2014, 30 (1), pp.87-100.
- Globally Constrained Locally Optimized 3-D Power Delivery NetworksAida Todri-Sanial, Sandip Kundu, Patrick Girard, Alberto Bosio, Luigi Dilillo, Arnaud VirazelIEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE, 2014, 22 (10), pp.2131-2144.
- A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMsJoão Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Jérémy Alvarez-Hérault, Ken MackayIEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE, 2014, 22 (11), pp.2326-2335.
- Dynamic Variability Monitoring Using Statistical Tests for Energy Efficient Adaptive ArchitecturesLionel Vincent, Edith Beigné, Suzanne Lesecq, Julien Mottin, David Coriat, Philippe MaurineIEEE Transactions on Circuits and Systems Part 1 Fundamental Theory and Applications, Institute of Electrical and Electronics Engineers (IEEE), 2014, Part I: Regular Papers, 61 (6), pp.1741-1754.
International Communications
2020
- EU H2020 NEURONN: Two-Dimensional Oscillatory Neural Networks for Energy Efficient Neuromorphic ComputingAida Todri-Sanial, Stefania Carapezzi, Corentin Delacour, Madeleine Abernot, Eirini Karachristou, Thierry Gil, Nadine Azemard, Jérémie Salles, Siegfried Karg, Elisabetta Corti, Bernabé Linares-Barranco, Maria J.Avedillo, Teresa Serrano-Gotarredona, Juan Núñez, Luis Camuñas-Mesa, Jafar Shamsi, Manuel Jiménez, Armin Klumpp, Jamila Boudaden, Théophile Gonos, Tanguy Hardelin, Marie Durieu, Ahmed Nejim, Slobodan MijalkovicEuropean Forum for Electronic Components and Systems (EFECS), Nov 2020, Brussels, Belgium. <https://efecs.eu/>
- Using Oscillatory Neural Network for Pattern Recognition and Mobile Robot ControlMadeleine Abernot, Thierry Gil, Aida Todri-SanialSOPHI.A SUMMIT, Nov 2020, Sophia Antipolis, France. <https://univ-cotedazur.fr/events-uca/sophia-summit>
- Neuromorphic Computing based on Oscillatory Neural NetworksAida Todri-SanialSOPHI.A SUMMIT, Nov 2020, Sophia Antipolis, France. <https://univ-cotedazur.fr/events-uca/sophia-summit>
- A Look Into Physical Modeling and Design for Carbon Nanotube based CircuitsAida Todri-Sanial10th IEEE CASS Rio Grande do Sul Workshop, Nov 2020, Virtual, France. <https://ieee-cas.org/10th-ieee-cass-rio-grande-do-sul-workshop>
- NeurONN: Neuromorphic Computing for Artificial Intelligence at the EdgeStefania Carapezzi, Madeleine Abernot, Corentin Delacour, Nadine Azemard, Jeremie Salles, Thierry Gil, Aida Todri-Sanial3rd AI Compute Symposium (IBM IEEE CAS/EDS), Oct 2020, Zurich (virtual), Switzerland. <https://www.zurich.ibm.com/thinklab/AIcomputesymposium.html>
- Leakage Assessment through Neural Estimation of the Mutual InformationValence Cristiani, Maxime Lecomte, Philippe MaurineInternational Conference on Applied Cryptography and Network Security (ACNS), Oct 2020, Rome, Italy. pp.144-162.
- EVM measurement of RF ZigBee transceivers using standard digital ATEThibault Vayssade, Florence Azaïs, Laurent Latorre, François LefèvreIEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), Oct 2020, Frascati, Italy. pp.1-6.
- Quantum Computing: Pushing the limits of computingAida Todri-SanialIBM Think Digital Summit France, Oct 2020, Virtual, France. <https://www.ibm.com/fr-fr/events/think-summit/agenda.html>
- Progress and Challenges on Quantum Computer-Aided DesignAida Todri-SanialIBM Quantum Summit, Sep 2020, Virtual, France. <https://ibm.6connex.com/event/quantumsummit/login https://cdn-akamai.6connex.com//296/2152/1600252448729_59_Agenda%20at%20Glance%20%20-%20All%20Days%20(v9-15-20pm).pdf>
- Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICsFlorence Azaïs, Serge Bernard, Mariane Comte, Bastien Deveautour, Sophie Dupuis, Hassan El Badawi, Marie-Lise Flottes, Patrick Girard, Vincent Kerzérho, Laurent Latorre, François Lefèvre, Bruno Rouzeyre, Emanuele Valea, Thibault Vayssade, Arnaud Virazel26th International Symposium on On-Line Testing and Robust System Design (IOLTS), Jul 2020, Napoli, Italy. pp.1-4.
- Toward New Era of Computing: From Devices to ApplicationsAida Todri-SanialWhat’s next in Computing ?, Jul 2020, Montpellier (virtual), France. <https://www.cvent.com/events/2020-what-s-next-in-computing-virtual-conference/event-summary-30a2542c297a4d27a327a3f18fd817b4.aspx>
- Quantum Initiative at the University of MontpellierAida Todri-SanialFrench Tech London Quantum Webinar, Jun 2020, London, United Kingdom. <https://frenchtechlondon.com/podcast-series/quantumwebinar>
- New High Efficiency Heater Design for a 3-axis CMOS MEMS Convective AccelerometerSonia Abdellatif, Brahim Mezghani, Frédérick Mailly, Pascal Nouet22nd Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS (DTIP), Jun 2020, Lyon (Virtual), France. pp.1-6.
- Low-Power Embedded Audio Recording using MEMS MicrophonesLaurent Latorre, Simon Chamaillé-Jammes14th Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS (DTIP), Jun 2020, Lyon, France. <10.1109/DTIP51112.2020.9139147>
- Stretchable Strain Sensors for Human Movement MonitoringAbhishek Singh Dahiya, Thierry Gil, Nadine Azemard, J Thireau, Alain Lacampagne, Aida Todri-Sanial, Benoît Charlot22nd Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS (DTIP), Jun 2020, (Virtual ), France. <10.1109/DTIP51112.2020.9139154>
- Wallance, an Alternative to Blockchain for IoTLoïc Dalmasso, Florent Bruguier, Achraf Lamlih, Pascal BenoitIEEE World Forum on Internet of Things 2020 (WF-IOT), Jun 2020, New Orleans, United States.
- Indirect test of RF circuits using ensemble methodsHassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, François LefèvreEuropean Test Symposium (ETS), May 2020, Tallinn, Estonia. <https://ets2020.ttu.ee/index.php?page=70>
- Low-cost testing of a 2.4GHz ZigBee transmitter using standard digital ATEThibault Vayssade, Florence Azaïs, Laurent Latorre, François LefèvreEuropean Test Symposium (ETS), May 2020, Tallinn, Estonia. <https://ets2020.ttu.ee/index.php?page=70>
- Implementing indirect test of RF circuits without compromising test quality: a practical case studyHassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, François Lefèvre, Ingrid GorenflotIEEE Latin American Test Symposium (LATS), Mar 2020, Maceio, Brazil. pp.1-6.
- Physical Design Challenges and Solutions for 3D Stacked and Monolithic 3D IntegrationAida Todri-SanialASP-DAC, Jan 2020, Beijing, China. <https://aspdac2020.github.io/aspdac20/tutorial/index.html#t9>
- NeurONN: Neuromorphic Computing with Oscillatory Neural NetworksAida Todri-SanialPhase-Change Switch Workshop, 2020, Virtual, France.
- Quantum Challenges: Hardware and Software PerspectivesAida Todri-SanialFRANCE IS AI, 2020, Online, France. <https://francedigitale.org/en/event/france-is-ai/>
- Design and Technology-level Optimization Challenges for Carbon Nanotube CircuitsAida Todri-SanialInternational Workshop on Advanced Electronic Design Automation (EDA), Jan 2020, Xidian, China.
2019
- Importance of Interconnects: A Technology-System-Level Design PerspectiveJie Liang, Aida Todri-Sanial65th International Electron Device Meeting (IEDM), Dec 2019, San Francisco, United States. <https://ieee-iedm.org/wp-content/uploads/2019/10/session-23.pdf>
- Physical design and optimisation methods for TSV-based 3D and monolithic 3D integrationAida Todri-Sanial15th Workshop on Heterogeneous Integration of Nanomaterials and Innovative Devices, Sep 2019, Krakow, Poland. pp.217-220.
- Electromagnetic Fault Injection : How Faults OccurMathieu Dumont, Mathieu Lisart, Philippe MaurineFDTC: Fault Diagnosis and Tolerance in Cryptography, Aug 2019, Atlanta, GA, United States. pp.9-16.
- Which metrics to use for RF indirect test strategy?Hassan El Badawi, Mariane Comte, Florence Azaïs, Vincent Kerzérho, Serge Bernard, François LefevreSMACD: Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, Jul 2019, Lausanne, Switzerland. pp.73-76.
- Power Measurement and Spectral Test of ZigBee Transmitters from 1-bit Under-sampled AcquisitionThibault Vayssade, Florence Azaïs, Laurent Latorre, François LefevreETS: European Test Symposium, May 2019, Baden-Baden, Germany. <10.1109/ETS.2019.8791540>
- Dynamic weighted average in multisensory systemsJosué Manuel Rivera Velázquez, Frédérick Mailly, Pascal NouetDTIP: Design, Test, Integration and Packaging of MEMS/MOEMS, May 2019, Paris, France. pp.1-4.
- Reliable Power Delivery and Analysis of Power-Supply Noise During Testing in Monolithic 3D ICsAbhishek Koneru, Aida Todri-Sanial, Krishnendu ChakrabartyVTS: VLSI Test Symposium, Apr 2019, Monterey, CA, United States. <10.1109/VTS.2019.8758650>
- SmartVista: Smart Autonomous Multi Modal Sensors for Vital Signs MonitoringKafil M. Razeeb, Cian O'Murchu, Aida Todri-Sanial, Frederik Sebelius, Indranil Bose, Colm O 'DwyerSSI: Smart System Integration, Apr 2019, Barcelona, Spain. <https://ssi.mesago.com/content/dam/messefrankfurt-mesago/ssi/2019/documents/pdf/SSI2019_Konferenzprogramm_WEB.pdf>
- Use of ensemble methods for indirect test of RF circuits: can it bring benefits?Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, François LefevreLATS: Latin American Test Symposium, Mar 2019, Santiago, Chile. pp.1-6.
- Test of 2.4 GHz ZigBee Transmitter using Standard Digital ATEThibault Vayssade, Florence Azaïs, Laurent Latorre, François LefevreSouth European Test Seminar (SETS), 2019, Pitztal, Austria.
- The Use of Ensemble Learning in Indirect Testing of Analog and RF Integrated CircuitsHassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, François LefevreSouth European Test Seminar (SETS), 2019, Pitztal, Austria.
2018
- Power-Supply Noise Analysis for Monolithic 3D ICs Using Electrical and Thermal Co-SimulationAbhishek Koneru, Aida Todri-Sanial, Krishnendu ChakrabartyICECS: International Conference on Electronics Circuits and Systems, Dec 2018, Bordeaux, France. <https://www.ieee-icecs2018.org>
- Mechanical Solution for Out-of-Plane Sensitivity Enhancement of CMOS MEMS Convective AccelerometersSonia Abdellatif, Brahim Mezghani, Fares Tounisi, Frédérick Mailly, Pascal NouetICECS: International Conference on Electronics, Circuits and Systems, Dec 2018, Bordeaux, France. pp.301-304.
- A multitone analysis for bioimpedance spectroscopy using minimal digital ressourceFabien Soulier, Achraf Lamlih, Vincent Kerzérho, Serge BernardICST: International Conference on Sensing Technology, Dec 2018, Limerick, Ireland. <http://www.ece.ul.ie/icst2018>
- Improvement of Active-Input Current Mirrors Using Adaptive Biasing TechniqueMohan Julien, Serge Bernard, Fabien Soulier, Vincent Kerzérho, Guy CathébrasDCIS: Design of Circuits and Integrated Systems, Nov 2018, Lyon, France.
- Electromagnetic Activity vs. Logical Activity: Near Field Scans for Reverse EngineeringMarc Lacruche, Philippe MaurineCARDIS: Smart Card Research and Advanced Applications, Nov 2018, Montpellier, France. pp.140-155.
- From Spintronic Devices to Hybrid CMOS/Magnetic System On ChipSophiane Senni, Frédéric Ouattara, Guillaume Patrigeon, Pascal Benoit, Pascal Nouet, Lionel Torres, François Duhem, Gregory Di Pendina, Guillaume PrenatVLSI-SoC: Very Large Scale Integration - System-on-Chip, Oct 2018, Verona, Italy. pp.188-191.
- A Hybrid Bioimpedance Spectroscopy Architecture for a Wide Frequency Exploration of Tissue Electrical PropertiesAchraf Lamlih, Philippe Freitas, Mohamed-Moez Belhaj, Jérémie Salles, Vincent Kerzérho, Fabien Soulier, Serge Bernard, Tristan Rouyer, Sylvain Bonhommeau2018 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC), Oct 2018, Verona, Italy. pp.168-171.
- The impact of pulsed electromagnetic fault injection on true random number generatorsMaxime Madau, Michel Agoyan, Josep Balash, Milos Grujic, Patrick Haddad, Philippe Maurine, Vladimir Rozic, Dave Singelee, Bohan Yang, Ingrid VerbauwhedeFDTC: Fault Diagnosis and Tolerance in Cryptography, Sep 2018, Amsterdam, Netherlands. pp.43-48.
- Exploiting Phase Information in Thermal Scans for Stealthy Trojan DetectionMaxime Cozzi, Jean-Marc Galliere, Philippe MaurineDSD: Digital System Design, Aug 2018, Prague, Slovakia. pp.573-576.
- A Robust Dual Reference Computing-in-Memory Implementation and Design Space Exploration Within STT-MRAMLiuyang Zhang, Wang Kang, Hao Cai, Peng Ouyang, Lionel Torres, Youguang Zhang, Aida Todri-Sanial, Weisheng ZhaoISVLSI: International Symposium on Very Large Scale Integration, Jul 2018, Hong Kong, China. pp.275-280.
- Low-cost functional test of a 2.4 GHz OQPSK transmitter using standard digital ATEThibault Vayssade, Florence Azaïs, Laurent Latorre, Francois LefèvreIOLTS: International On-Line Testing Symposium, Jul 2018, Platja d'Aro, Spain. pp.17-22.
- Combined analysis of supply voltage and body-bias voltage for energy managementRida Kheirallah, Jean-Marc Galliere, Nadine Azemard, Gilles R. DucharmePATMOS: Power And Timing Modeling, Optimization and Simulation, Jul 2018, Platja d’Aro, Spain. pp.88-91.
- Chameleon: A Thermally Adaptive Error Correction Code Design for STT-MRAM LLCsDijun Liu, Yuanqing Cheng, Y. Wang, B. Wu, B. Zhang, Aida Todri-Sanial, Weisheng ZhaoDAC: Design Automation Conference, Jun 2018, San Fransisco, United States.
- Challenges and Progress on Carbon Nanotube Integration for BEOL InterconnectsBenjamin Uhlig, Abitha Dhavamani, Nicole Nagy, Katharina Lilienthal, R. Liske, Raphael Ramos, Jean Dijon, Hanako Okuno, Dipankar Kalita, Lee Jaehyun, Vihar P. Georgiev, Asenov Asen, Salvatore Amoroso, Liping Wang, Koenemann Fabien, Bernd Gotsmann, Goncalo Goncalves, Bingam Cheng, Jie Liang, Reetu Raj Pandey, Rongmei Chen, Aida Todri-SanialIITC: International Interconnect Technology Conference, Jun 2018, Santa Clara, United States. pp.16-18.
- Wideband Fully Differential Current Driver with Optimized Output Impedance for Bioimpedance MeasurementsAchraf Lamlih, Philippe Freitas, Stéphane David-Grignot, Jérémie Salles, Vincent Kerzérho, Fabien Soulier, Serge Bernard, Tristan Rouyer, Sylvain BonhommeauISCAS: International Symposium on Circuits and Systems, May 2018, Florence, Italy. <10.1109/ISCAS.2018.8351464>
- Post-fabrication soft trimming of resistive sensorsIbrahim Shankhour, Jad Mohdad, Frédérick Mailly, Pascal NouetDTIP: Design, Test, Integration and Packaging, May 2018, Roma, Italy. <10.1109/DTIP.2018.8394221>
- A generic model for sensor simulation at system levelPascal Nouet, Josué Manuel Rivera Velázquez, Frédérick MaillyDTIP: Design, Test, Integration and Packaging, May 2018, Roma, Italy. <10.1109/DTIP.2018.8394198>
- Thermal Scans for Detecting Hardware TrojansMaxime Cozzi, Philippe Maurine, Jean-Marc GalliereCOSADE: Constructive Side-Channel Analysis and Secure Design, Apr 2018, Singapour, Singapore. pp.117-132.
- Standard CAD Tool-Based Method for Simulation of Laser-Induced Faults in Large-Scale CircuitsRaphael Andreoni Camponogara-Viera, Jean-Max Dutertre, Philippe Maurine, Rodrigo Possamai BastosISPD: International Symposium on Physical Design, Mar 2018, Monterey, CA, United States. pp.160-167.
- Progress on carbon nanotube BEOL interconnectsBenjamin Uhlig, Jie Liang, Lee Jaehyun, Raphael Ramos, Abitha Dhavamani, Nicole Nagy, Jean Dijon, Hanako Okuno, Dipankar Kalita, Vihar P. Georgiev, Asenov Asen, Salvatore Amoroso, Liping Wang, Campbell Millar, F. Konemann, Bernd Gotsmann, Goncalo Goncalves, Bingham Chen, Reetu Raj Pandey, Rongmei Chen, Aida Todri-SanialDATE: Design, Automation and Test in Europe, Mar 2018, Dresden, Germany. pp.937-942.
- Using multifunctional standardized stack as universal spintronic technology for IoTMehdi B. Tahoori, Sarath Mohanachandran Nair, Rajendra Bishnoi, Sophiane Senni, Jad Mohdad, Frédérick Mailly, Lionel Torres, Pascal Benoit, Abdoulaye Gamatié, Pascal Nouet, Frédéric Ouattara, Gilles Sassatelli, Kotb Jabeur, Pierre Vanhauwaert, Alexandru Atitoaie, Ioana Firastrau, G. Di Pendina, Guillaune PrenatDATE: Design, Automation and Test in Europe, Mar 2018, Dresden, Germany. pp.931-936.
2017
- A physics-based investigation of Pt-salt doped carbon nanotubes for local interconnectsJie Liang, Raphael Ramos, Jean Dijon, H. Okuno, D. Kalita, D. Renaud, J. Lee, Vihar Georgiev, Salim Berrada, T. Sadi, A. Asenov, B. Uhlig, K. Lilienthal, A. Dhavamani, F. Konemann, B. Gotsmann, G. Goncalves, B. Chen, K. Teo, Reetu Raj Pandey, Aida Todri-SanialIEDM: International Electron Devices Meeting, Dec 2017, San Francisco, United States. <10.1109/IEDM.2017.8268502>
- An {EM} Fault Injection Susceptibility Criterion and Its Application to the Localization of HotspotsPhilippe Maurine, Maxime Madau, Michel AgoyanCARDIS: Smart Card Research and Advanced Applications, Nov 2017, Lugano, Switzerland. pp.180-195.
- Synchronised 4-Phase Resonant Power Clock Supply for Energy Efficient Adiabatic LogicNicolas Jeanniot, Gaël Pillonnet, Pascal Nouet, Nadine Azemard, Aida Todri-SanialICRC: International Conference on Rebooting Computing, Nov 2017, Washington, DC, United States. <10.1109/ICRC.2017.8123661>
- Atomistic to circuit level modeling of defective doped SWCNTs with contacts for on-chip interconnect applicationJie Liang, Lee Jaehyun, Salim Berrada, Vihar P. Georgiev, Asenov Asen, Nadine Azemard, Aida Todri-SanialNMDC: Nanotechnology Materials and Devices Conference, Oct 2017, Singapore, Singapore. pp.66-67.
- Method for evaluation of transient-fault detection techniquesRaphael Andreoni Camponogara-Viera, Rodrigo Possamai Bastos, Jean-Max Dutertre, Philippe MaurineESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Sep 2017, Bordeaux, France.
- Atoms-to-circuits simulation investigation of CNT interconnects for next generation CMOS technologyJaehyun Lee, Jie Liang, Salvatore Amoroso, Toufik Sadi, Liping Wang, Asen Asenov, Andrew Pender, Dave Reid, Vihar Georgiev, Campbell Millar, Aida Todri-SanialSISPAD: Simulation of Semiconductor Processes and Devices, Sep 2017, Kamakura, Japan. pp.153-156.
- The impact of vacancy defects on CNT interconnects: From statistical atomistic study to circuit simulationsJaehyun Lee, Salim Berrada, Jie Liang, Toufik Sadi, Vihar Georgiev, Aida Todri-Sanial, Dipankar Kalita, Raphaël Ramos, Hanako Okuno, Jean Dijon, Asen AsenovSISPAD: Simulation of Semiconductor Processes and Devices, Sep 2017, Kamakura, Japan. pp.157-160.
- Role of Laser-Induced IR Drops in the Occurrence of Faults: Assessment and SimulationRaphael Andreoni Camponogara-Viera, Jean-Max Dutertre, Rodrigo Possamai Bastos, Philippe MaurineDSD: Digital System Design, Aug 2017, Vienna, Austria. pp.252-259.
- High Temperature, Time Domain Sensor Interface based on Phase ShifterEmna Chabchoub, Franck Badets, Mohamed Masmoudi, Pascal Nouet, Frédérick MaillyHiTen: High Temperature Electronics Network, Jul 2017, Cambridge, United Kingdom. pp.103-108.
- GREAT: HeteroGeneous IntegRated Magnetic tEchnology Using Multifunctional Standardized sTackMehdi B. Tahoori, Sarath Mohanachandran Nair, Rajendra Bishnoi, Sophiane Senni, Jad Mohdad, Frédérick Mailly, Lionel Torres, Pascal Benoit, Pascal Nouet, Rui Ma, Martin Kreißig, Frank Ellinger, Kotb Jabeur, Pierre Vanhauwaert, Gregory Di Pendina, Guillaune PrenatISVLSI: International Symposium on Very Large Scale Integration, Jul 2017, Bochum, Germany. pp.344-349.
- Analytical Study of On-chip Generations of Analog Sine-wave Based on Combined Digital SignalsStéphane David-Grignot, Achraf Lamlih, Vincent Kerzérho, Florence Azaïs, Fabien Soulier, Serge BernardIMSTW: International Mixed Signals Testing Workshop, Jul 2017, Thessaloniki, Greece. <10.1109/IMS3TW.2017.7995205>
- New time-domain conditioning circuit for resistive sensor: Behavioral modelling for simulation and optimizationEmna Chabchoub, Franck Badets, Mohamed Masmoudi, Frédérick Mailly, Pascal NouetMIXDES: Mixed Design of Integrated Circuits and Systems, Jun 2017, Bydgoszcz, Poland. pp.408-411.
- A hierarchical model for CNT and Cu-CNT composite interconnects: from density functional theory to circuit-level simulationsLee Jaehyun, Sadi Toufik, Jie Liang, Vihar Georgiev, Aida Todri-Sanial, Asenov AsenIWCN: International Workshop on Computational Nanotechnology, Jun 2017, Windermere, United Kingdom. <http://iwcn2017.iopconfs.org/>
- A high temperature, 12-bit-time-domain sensor interface based on injection locked oscillatorEmna Chabchoub, Franck Badets, Pascal Nouet, Mohamed Masmoudi, Frédérick MaillyISCAS: International Symposium on Circuits and Systems, May 2017, Baltimore, United States. <10.1109/ISCAS.2017.8050504>
- Toward Carbon Nanotube ComputingAida Todri-SanialEmerging Technology, May 2017, Varsovie, Poland. <http://www.etcmos.com/current_event.php?event=2017>
- Formal analysis of high-performance stabilized active-input current mirrorMohan Julien, Serge Bernard, Fabien Soulier, Vincent Kerzérho, Guy CathébrasISCAS: International Symposium on Circuits and Systems, May 2017, Baltimore, MD, United States. <10.1109/ISCAS.2017.8051012>
- Improving artisanal and semi-industrial fisheries data: a pilot experience on gillnet fishery in AbidjanJustin Monin, Tristan Rouyer, Sylvain Bonhommeau, Nicolas Champauzas, Sosthène Akia, Laurent de Knyff, Serge Bernard, Vincent KerzérhoMeeting of the ICCAT Working Group on stock Assessment Methods (WGSAM), May 2017, Madrid, Spain.
- Electrical performance of carbon-based power distribution networks with thermal effectsAlessandro Magnani, Massimiliano de Magistris, Salomeh Heidari, Aida Todri-Sanial, Antonio MaffucciSPI: Signal and Power Integrity, May 2017, Baveno, Italy. <10.1109/SaPIW.2017.7944044>
- Combo of innovative educational approaches to teach industrial test to undergraduate studentsBéatrice Pradarelli, Pascal Nouet, Laurent LatorreEDUCON: Global Engineering Education Conference, Apr 2017, Athens, Greece. pp.56-64.
- Impacts of Technology Trends on Physical Attacks?Philippe Maurine, Sylvain GuilleyCOSADE: Constructive Side-Channel Analysis and Secure Design, Apr 2017, Paris, France. pp.190-206.
- Formal analysis of bandwidth enhancement for high-performance active-input current mirrorMohan Julien, Serge Bernard, Fabien Soulier, Vincent Kerzérho, Guy CathébrasDTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2017, Palma de Mallorca, Spain. <10.1109/DTIS.2017.7930162>
- Power and Performance Analysis of Doped SW/DW CNT for On-Chip Interconnect ApplicationAida Todri-Sanial, Jie LiangGRAPHENE, Mar 2017, Barcelone, Spain. <http://www.grapheneconf.com/2017/>
- Highly linear voltage-to-time converter based on injection locked relaxation oscillatorsEmna Chabchoub, Franck Badets, Mohamed Masmoudi, Pascal Nouet, Frédérick MaillySSD: Systems, Signals and Devices, Mar 2017, Marrakech, Morocco. <10.1109/SSD.2017.8167011>
2016
- EKF-based state estimation for train localizationDamien Veillard, Frédérick Mailly, Philippe FraisseIEEE SENSORS, Oct 2016, Orlando, United States. <10.1109/ICSENS.2016.7808726>
- Mixed-level simulation tool for design optimization of electrical impedance spectroscopy systemsAchraf Lamlih, Vincent Kerzérho, Serge Bernard, Fabien Soulier, Mariane Comte, Michel Renovell, Tristan Rouyer, Sylvain BonhommeauIWIS: International Workshop on Impedance Spectroscopy, Sep 2016, Chemnitz, Germany. <https://www.tu-chemnitz.de/etit/messtech/iwis/openconf/modules/request.php?module=oc_program&action=program.php>
- Problem-Based Learning Approach to Teach Printed Circuit Boards TestBéatrice Pradarelli, Pascal Nouet, Laurent LatorreICL: Interactive Collaborative Learning, Sep 2016, Belfast, United Kingdom. pp.45-57.
- Electrothermal Modeling and Analysis of Carbon Nanotube InterconnectsAida Todri-SanialPATMOS: Power And Timing Modeling, Optimization and Simulation, Sep 2016, Brême, Germany. <http://www.item.uni-bremen.de/patmos/>
- Physical description and analysis of doped carbon nanotube interconnectsJie Liang, Liuyang Zhang, Nadine Azemard, Pascal Nouet, Aida Todri-SanialPATMOS: Power And Timing Modeling, Optimization and Simulation, Sep 2016, Brême, Germany. pp.250-255.
- Investigation of electrical and thermal properties of carbon nanotube interconnectsAida Todri-SanialPATMOS: Power and Timing Modeling, Optimization and Simulation, Sep 2016, Brême, Zimbabwe. pp.25-32.
- Modeling and Simulation of Carbon Nanotube InterconnectsAida Todri-SanialSISPAD: Simulation of Semiconductor Processes and Devices, Sep 2016, Nuremberg, Germany. <http://www.sispad2016.org>
- A Simple Conditioner for Resonant Intraocular Pressure SensorFabien Soulier, Frédérick Mailly, Vincent Kerzérho, Anthony Deluthault, Serge Bernard, Philippe CauvetEUROSENSORS, Sep 2016, Budapest, Hungary. pp.67-70.
- An Embedded Digital Sensor against EM and BB Fault InjectionDavid El-Baze, Jean-Baptiste Rigaud, Philippe MaurineFDTC: Fault Diagnosis and Tolerance in Cryptography, Aug 2016, Santa Barbara, CA, United States. pp.78-86.
- Efficient calibration of contact-less resonant bio-sensor affected by operating conditionsAnthony Deluthault, Vincent Kerzérho, Serge Bernard, Fabien Soulier, Philippe CauvetIMSTW: International Mixed-Signal Testing Workshop, Jul 2016, Sant Feliu de Guixols, Spain. pp.1-6.
- Quantitative evaluation of reliability and performance for STT-MRAMLiuyang Zhang, Aida Todri-Sanial, Wang Kang, Youguang Zhang, Lionel Torres, Yuanqing Cheng, Weisheng ZhaoISCAS: International Symposium on Circuits and Systems, May 2016, Montréal, QC, Canada. pp.1150-1153.
- Per Peers Learning Education Approach to Teach Industrial Test to Undergraduate StudentsBéatrice Pradarelli, Pascal Nouet, Laurent LatorreEWME: European Workshop on Microelectronics Education, May 2016, Southampton, United Kingdom. <10.1109/EWME.2016.7496485>
- A clustering technique for fast electrothermal analysis of on-chip power distribution networksAlessandro Magnani, Massimiliano De Magistris, Antonio Maffucci, Aida Todri-SanialSPI: Signal and Power Integrity, May 2016, Turin, Italy. <10.1109/SaPIW.2016.7496292>
- Investigation of the power-clock network impact on adiabatic logicNicolas Jeanniot, Aida Todri-Sanial, Pascal Nouet, Gaël Pillonnet, Hervé FanetSPI: Signal and Power Integrity, May 2016, Turin, Italy. <10.1109/SaPIW.2016.7496270>
- Granularity and detection capability of an adaptive embedded Hardware Trojan detection systemMaxime Lecomte, Jacques Jean-Alain Fournier, Philippe MaurineHOST: Hardware Oriented Security and Trust, May 2016, McLean, VA, United States. pp.135-138.
- Present and future prospects of carbon nanotube interconnects for energy efficient integrated circuitsAida Todri-Sanial, Alessandro Magnani, Massimiliano De Magistris, Antonio MaffucciEuroSimE: Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, Apr 2016, Montpellier, France. <10.1109/EuroSimE.2016.7463379>
- Reliability and performance evaluation for STT-MRAM under temperature variationLiuyang Zhang, Yuanqing Cheng, Wang Kang, Youguang Zhang, Lionel Torres, Weisheng Zhao, Aida Todri-SanialEuroSimE: Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, Apr 2016, Montpellier, France. <10.1109/EuroSimE.2016.7463380>
- Industrial Test Project Oriented EducationBéatrice Pradarelli, Pascal Nouet, Laurent LatorreEDUCON: Global Engineering Education Conference, Apr 2016, Abu Dhabi, United Arab Emirates. pp.119-124.
- On-Chip Fingerprinting of IC Topology for Integrity VerificationMaxime Lecomte, Jacques Jean-Alain Fournier, Philippe MaurineDATE: Design, Automation and Test in Europe, Mar 2016, Dresden, Germany. pp.133-138.
- A Fully-Digital Em Pulse DetectorDavid El-Baze, Jean-Baptiste Rigaud, Philippe MaurineDATE: Design, Automation and Test in Europe, Mar 2016, Dresden, Germany. pp.439-444.
- Body Biasing Injection Attacks in PracticeNoemie Beringuier-Boher, Marc Lacruche, David El-Baze, Jean-Max Dutertre, Jean-Baptiste Rigaud, Philippe MaurineCS2: Cryptography and Security in Computing Systems, Jan 2016, Prague, Czech Republic. pp.49-54.
2015
- Thoroughly analyzing the use of ring oscillators for on-chip hardware trojan detectionMaxime Lecomte, Philippe Maurine, Jacques Jean-Alain FournierReConFig: ReConFigurable Computing and FPGAs, Dec 2015, Mexico, Mexico. pp.1-6.
- Collision for Estimating SCA Measurement Quality and Related ApplicationsIbrahima Diop, Mathieu Carbone, Sébastien Ordas, Yanis Linge, Pierre Yvan Liardet, Philippe MaurineCARDIS: Smart Card Research and Advanced Applications, Nov 2015, Bochum, Germany. pp.143-157.
- Relevance of impedance spectroscopy for the monitoring of implant-induced fibrosis: A preliminary studyNoëlle Lewis, Cyril Lahuec, S Renaud, Eric Mcadams, Paco Bogonez-Franco, Claire Lethias, Sabrina Kellouche, F Carreiras, Andrea Pinna, Aymeric Histace, Michel Boissière, Emmanuel Pauthe, I Lagroye, Fabien Soulier, Serge Bernard, S Binczak, Bertrand Granado, Patrick Garda, Mehdi Terosiet, Alexandre Goguin, Olivier RomainBIOCAS: Biomedical Circuits and Systems, Oct 2015, Atlanta, United States. <10.1109/BioCAS.2015.7348399>
- EM Injection: Fault Model and LocalitySébastien Ordas, Ludovic Guillaume-Sage, Philippe MaurineFDTC: Fault Diagnosis and Tolerance in Cryptography, Sep 2015, Saint Malo, France. pp.3-13.
- Carbon nanotube interconnects for energy-efficient integrated circuitsAida Todri-SanialTNT: Trends in Nanotechnology, Sep 2015, Toulouse, France.
- Statistical Energy Study for 28nm FDSOI TechnologyRida Kheirallah, Gilles R. Ducharme, Nadine AzemardVARI: Workshop on CMOS Variability, Sep 2015, Salvador, Bahia, Brazil. <http://www.inf.ufrgs.br/vari/>
- Collision Based Attacks in PracticeIbrahima Diop, Pierre-Yvan Liardet, Yanis Linge, Philippe MaurineDSD: Digital System Design, Aug 2015, Madeire, Portugal. pp.367-374.
- Carbon-based Power Delivery Networks for nanoscale ICs: electrothermal performance analysisAlessandro Magnani, Massimiliano De Magistris, Aida Todri-Sanial, Antonio MaffucciIEEE-NANO: Nanotechnology, Jul 2015, Rome, Italy. pp.416-419.
- On the Performance Exploration of 3D NoCs with Resistive-Open TSVsCharles Effiong, Vianney Lapotre, Abdoulaye Gamatié, Gilles Sassatelli, Aida Todri-Sanial, Khalid LatifISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.579-584.
- On Analysis of On-chip DC-DC Converters for Power Delivery NetworksGhizlane Mouslih, Aida Todri-Sanial, Pascal NouetISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.557-560.
- In-silico Phantom Axon: Emulation of an Action Potential Propagating Along Artificial Nerve FiberOlivier Rossel, Fabien Soulier, Serge Bernard, David Guiraud, Guy CathébrasISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.228-230.
- A framework for efficient implementation of analog/RF alternate test with model redundancySyhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, Michel RenovellISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.621-626.
- Toward adaptation of ADCs to operating conditions through on-chip correctionVincent Kerzérho, Ludovic Guillaume-Sage, Florence Azaïs, Mariane Comte, Michel Renovell, Serge BernardISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.634-639.
- Digital on-chip measurement circuit for built-in phase noise testingStéphane David-Grignot, Florence Azaïs, Laurent Latorre, François LefevreIMSTW: International Mixed-Signals Test Workshop, Jun 2015, Paris, France. <10.1109/IMS3TW.2015.7177880>
- A generic methodology for building efficient prediction models in the context of alternate testingSyhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, Michel RenovellIMSTW: International Mixed-Signals Test Workshop, Jun 2015, Paris, France. <10.1109/IMS3TW.2015.7177873>
- An architecture-level cache simulation framework supporting advanced PMA STT-MRAMBi Wu, Yuanqing Cheng, Ying Wang, Aida Todri-Sanial, Guangyu Sun, Lionel Torres, Weisheng ZhaoNANOARCH: Nanoscale Architectures, Jun 2015, Boston, MA, United States. pp.7-12.
- A New Technique for Low-Cost Phase Noise Production Testing from 1-bit Signal AcquisitionStéphane David-Grignot, Florence Azaïs, Laurent Latorre, François LefevreETS: European Test Symposium, May 2015, Cluj-Napoca, Romania. pp.1-6.
- A body-biasing of readout circuit for STT-RAM with improved thermal reliabilityLun Yang, Yuanqing Cheng, Yuhao Wang, Hao Yu, Weisheng Zhao, Aida Todri-SanialISCAS: International Symposium on Circuits and Systems, May 2015, Lisbon, Portugal. pp.1530-1533.
- A node clustering reduction scheme for power grids electrothermal analysisAlessandro Magnani, M. de Magistris, Antonio Maffucci, Aida Todri-SanialSPI: Signal and Power Integrity, May 2015, Berlin, Germany. <10.1109/SaPIW.2015.7237399>
- An ultra-low-power front-end for differential capacitive sensorsPatcharee Kongpark, Frédérick Mailly, Laurent Latorre, Pascal NouetDTIP: Design, Test, Integration and Packaging, Apr 2015, Montpellier, France. <10.1109/DTIP.2015.7160964>
- MEMS based Inertial Measurement UnitsGaurav Chatterjee, Laurent Latorre, Frédérick Mailly, Pascal Nouet, Nacim Hachelef, Coumar OudéaDTIP: Design, Test, Integration and Packaging, Apr 2015, Montpellier, France. <10.1109/DTIP.2015.7160966>
- Embedded test instrument for on-chip phase noise evaluation of analog/IF signalsFlorence Azaïs, Stéphane David-Grignot, Laurent Latorre, François LefevreDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2015, Belgrade, Serbia. pp.237-242.
- Exploring the limit of ENG spatio-temporal filtering for velocity-selectivityMariam Abdallah, Olivier Rossel, Serge Bernard, Fabien Soulier, Guy CathébrasNER: Neural Engineering, Apr 2015, Montpellier, France. pp.585-588.
- Statistical Energy Study for 28nm FDSOI DevicesRida Kheirallah, Jean-Marc Galliere, Aida Todri-Sanial, Gilles R. Ducharme, Nadine AzemardEuroSimE: Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, Apr 2015, Budapest, Hungary. <10.1109/EuroSimE.2015.7103149>
- A digital technique for the evaluation of SSB phase noise of analog/RF signalsFlorence Azaïs, Stéphane David-Grignot, François Lefevre, Laurent LatorreLATS: Latin-American Test Symposium, Mar 2015, Puerto Vallarta, Mexico. <10.1109/LATW.2015.7102407>
- Interest of MIA in frequency domain?Mathieu Carbone, Yannick Teglia, Philippe Maurine, Gilles R. DucharmeCS2: Cryptography and Security in Computing Systems, Jan 2015, Amtersdam, Netherlands. pp.35-38.
2014
- Evidence of a larger EM-induced fault modelSébastien Ordas, Ludovic Guillaume-Sage, Karim Tobich, Jean-Max Dutertre, Philippe MaurineCARDIS: Smart Card Research and Advanced Applications, Nov 2014, Paris, France. pp.245-259.
- CMOS implementation of a 3-axis thermal convective accelerometerFrédérick Mailly, Huy Binh Nguyen, Laurent Latorre, Pascal NouetIEEE SENSORS, Nov 2014, Valencia, Spain. pp.1471-1474.
- Exploring potentials of perpendicular magnetic anisotropy STT-MRAM for cache designXiaolong Zhang, Yuanqing Cheng, Weisheng Zhao, Youguang Zhang, Aida Todri-SanialICSICT: International Conference on Solid-State and Integrated Circuit Technology, Oct 2014, Guilin, China. <10.1109/ICSICT.2014.7021342>
- Low-cost phase noise testing of complex RF ICs using standard digital ATEStéphane David-Grignot, Florence Azaïs, Laurent Latorre, François LefevreITC: International Test Conference, Oct 2014, Seattle, WA, United States. <10.1109/TEST.2014.7035301>
- Electromagnetic analysis, deciphering and reverse engineering of integrated circuits (E-MATA HARI)Laurent Chusseau, Rachid Omarouayache, Jérémy Raoult, Sylvie Jarrix, Philippe Maurine, Karim Tobich, Alexandre Boyer, Bertrand Vrignon, John Shepherd, Thanh-Ha Le, Maël Berthier, Lionel Rivière, Bruno Robisson, Anne-Lise RibottaVLSI-SoC: Very Large Scale Integration - System-on-Chip, Oct 2014, Playa del Carmen, Mexico. pp.1-6.
- ElectroMagnetic Analysis and Fault Injection onto Secure CircuitsPaolo Maistri, R. Leveugle, Lilian Bossuet, Alain Aubert, Viktor Fischer, Bruno Robisson, Nicolas Moro, Philippe Maurine, Jean-Max Dutertre, Mathieu LisartVLSI-SoC: Very Large Scale Integration - System-on-Chip, Oct 2014, Mexico, Mexico. <10.1109/VLSI-SoC.2014.7004182>
- Stochastic model for phase noise measurement from 1-bit signal acquisitionStéphane David-Grignot, Florence Azaïs, François Lefevre, Laurent LatorreIMS3TW: International Mixed-Signals, Sensors, and Systems Test Workshop, Sep 2014, Porto Alegre, Brazil. <10.1109/IMS3TW.2014.6997400>
- Study of adaptive tuning strategies for Near Field Communication (NFC) transmitter moduleMouhamadou Dieng, Florence Azaïs, Mariane Comte, Serge Bernard, Vincent Kerzérho, Michel Renovell, Thibault Kervaon, Paul-Henri Pugliesi-ContiIMS3TW: International Mixed-Signals, Sensors, and Systems Test Workshop, Sep 2014, Porto ALegre, Brazil. <10.1109/IMS3TW.2014.6997401>
- Real-Time Testing of 90nm COTS SRAMs at Concordia Station in AntarcticaGeorgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri-Sanial, Arnaud Virazel, Philippe Cocquerez, Jean-Luc Autran, Antonio Litterio, Frédéric Wrobel, Frédéric SaignéNSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France. <http://ieee-npss.org/wp-content/uploads/2014/03/2014-NSREC.pdf>
- Efficient Dynamic Test Methods for COTS SRAMs Under Heavy Ion IrradiationGeorgios Tsiligiannis, Luigi Dilillo, Viyas Gupta, Alberto Bosio, Patrick Girard, Aida Todri-Sanial, Arnaud Virazel, Helmut Puchner, Alexandre Louis Bosser, Arto Javanainen, Ari Virtanen, Frédéric Wrobel, Laurent Dusseau, Frédéric SaignéNSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France.
- A Delay Probability Metric for Input Pattern Ranking Under Process Variation and Supply NoiseAnu Asokan, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud VirazelISVLSI: International Symposium on Very Large Scale Integration, Jul 2014, Tampa, FL, United States. pp.226-231.
- Methodology for Self-Adaptation of Electronic Medical Devices: Application to an Intraocular Pressure SensorAnthony Deluthault, Fabien Soulier, Serge Bernard, Vincent Kerzérho, Luc Menzenge, Philippe CauvetIOLTS: International On-Line Testing Symposium, Jul 2014, Platja d'Aro, Spain. <http://tima.imag.fr/conferences/IOLTS/iolts14/>
- Self-Adaptive NFC SystemsVincent Kerzérho, Florence Azaïs, Mouhamadou Dieng, Mariane Comte, Serge Bernard, Michel Renovell, Paul-Henri Pugliesi-Conti, Thibault KervaonIOLTS: International On-Line Testing Symposium, Jul 2014, Platja d'Aro, Spain.
- Solutions for the self-adaptation of communicating systems in operationMartin Andraud, Anthony Deluthault, Mouhamadou Dieng, Florence Azaïs, Serge Bernard, Philippe Cauvet, Mariane Comte, Thibault Kervaon, Vincent Kerzérho, Salvador Mir, Paul-Henri Pugliesi-Conti, Michel Renovell, Fabien Soulier, Emmanuel Simeu, Haralampos-G StratigopoulosIOLTS: International On-line Test Symposium, Jul 2014, Platja d’Aro, Spain. pp.234-239.
- Simplified review of DCDC switching noise and spectrum contentsAdnan Fares, Sami Ajram, Guy CathébrasPRIME: Ph.D. Research in Microelectronics and Electronics, Jun 2014, Grenoble, France. <10.1109/PRIME.2014.6872677>
- Phase noise measurement on IF analog signals using standard digital ATE resourcesStéphane David-Grignot, Laurent Latorre, Florence Azaïs, François LefevreNEWCAS: New Circuits and Systems, Jun 2014, Trois-Rivieres, Canada. pp.121-124.
- Performance exploration of partially connected 3D NoCs under manufacturing variabilityAnelise Kologeski, Fernanda Lima Kastensmidt, Vianney Lapotre, Abdoulaye Gamatié, Gilles Sassatelli, Aida Todri-SanialNEWCAS: New Circuits and Systems, Jun 2014, Trois-Rivieres, QC, Canada. pp.61-64.
- Investigations on alternate analog/RF test with model redundancyHaithem Ayari, Florence Azaïs, Serge Bernard, Vincent Kerzérho, Syhem Larguech, Mariane Comte, Michel RenovellSTEM Workshop, May 2014, Paderborn, Germany. <http://www.ets14.de/pages/workshops/stem-workshop.php>
- iBoX — Jitter based Power Supply Noise sensorMiroslav Valka, Alberto Bosio, Luigi Dilillo, Aida Todri-Sanial, Arnaud Virazel, Patrick Girard, Philippe Debaud, Stephane GuilhotETS: European Test Symposium, May 2014, Paderborn, United States. <10.1109/ETS.2014.6847830>
- A Comprehensive Evaluation of Functional Programs for Power-Aware TestAymen Touati, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Arnaud Virazel, Paolo BernardiNATW: North Atlantic Test Workshop, May 2014, Johnson City, NY, United States. pp.69-72.
- Investigation of horizontally aligned carbon nanotubes for efficient power delivery in 3D ICsAida Todri-SanialSPI: Signal and Power Integrity, May 2014, Ghent, Belgium. <10.1109/SaPIW.2014.6844535>
- A frequency leakage model for SCASébastien Tiran, Sébastien Ordas, Yannick Teglia, Michel Agoyan, Philippe MaurineHOST: Hardware-Oriented Security and Trust, May 2014, Arlington, VA, United States. pp.97-100.
- Protecting combinational logic in pipelined microprocessor cores against transient and permanent faultsImran Wali, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-SanialDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.223-225.
- Path delay test in the presence of multi-aggressor crosstalk, power supply noise and ground bounceAnu Asokan, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud VirazelDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.207-212.
- Test and diagnosis of power switchesMiroslav Valka, Alberto Bosio, Luigi Dilillo, Aida Todri-Sanial, Arnaud Virazel, Patrick Girard, Philippe Debaud, Stephane GuilhotDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.213-218.
- Timing-aware ATPG for critical paths with multiple TSVsCarolina Momo Metzler, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud VirazelDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.116-121.
- An intra-cell defect grading toolAlberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Stefano Bernabovi, Paolo BernardiDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.298-301.
- TSV aware timing analysis and diagnosis in paths with multiple TSVsCarolina Momo Metzler, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud VirazelVTS: VLSI Test Symposium, Apr 2014, Napa, CA, United States. <10.1109/VTS.2014.6818772>
- On Adaptive Bandwidth Selection for Efficient MIAMathieu Carbone, Sébastien Tiran, Sébastien Ordas, Michel Agoyan, Yannick Teglia, Gilles R. Ducharme, Philippe MaurineCOSADE: Constructive Side-Channel Analysis and Secure Design, Apr 2014, Paris, France. pp.82-97.
- Attacking Randomized Exponentiations Using Unsupervised LearningGuilherme Perin, Laurent Imbert, Lionel Torres, Philippe MaurineCOSADE: Constructive Side-Channel Analysis and Secure Design, Apr 2014, Paris, France. pp.144-160.
- Electro-thermal characterization of Through-Silicon ViasAida Todri-SanialEuroSimE, Apr 2014, Ghent, Belgium. <10.1109/EuroSimE.2014.6813859>
- Monitoring of particle deposition in cleanrooms: State-of-the-artPascal Nouet, Nina Menant, Delphine Faye, Xavier Lafontan, Djemel LellouchiDTIP: Design, Test, Integration and Packaging, Apr 2014, Cannes, France. pp.368-371.
- Direct digital synthesiser (DDS) design parameters optimisation for vibrating MEMS sensors: Optimisation of phase accumulator, Look-Up Table (LUT) and Digital to Analog Converter (DAC) sizesBaptiste Maréchal, Jean Guérard, Raphaël Levy, Olivier Le Traon, Frédérick Mailly, Pascal NouetDTIP: Design, Test, Integration and Packaging, Apr 2014, Cannes, France. <10.1109/DTIP.2014.7056692>
- Efficiency of a glitch detector against electromagnetic fault injectionLoic Zussa, Amine Dehbaoui, Karim Tobich, Jean-Max Dutertre, Philippe Maurine, Ludovic Guillaume-Sage, Jessy Clédière, Assia TriaDATE: Design, Automation and Test in Europe, Mar 2014, Dresden, Germany. <10.7873/DATE.2014.216>
- New implementions of predictive alternate analog/RF test with augmented model redundancyHaithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, Michel RenovellDATE: Design, Automation and Test in Europe, Mar 2014, Dresden, Germany. <10.7873/DATE2014.144>
- Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testingSyhem Larguech, Florence Azaïs, Serge Bernard, Vincent Kerzérho, Mariane Comte, Michel RenovellLATW: Latin American Test Workshop, Mar 2014, Fortaleza, Brazil. <10.1109/LATW.2014.6841930>
- Power supply noise-aware workload assignments for homogeneous 3D MPSoCs with thermal considerationYuanqing Cheng, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud VirazelASP-DAC: Asia and South Pacific Design Automation Conference, Jan 2014, Singapore, Singapore. pp.544-549.
Last update on 13/10/2020
Department : Microélectronique
Head : Philippe MAURINE