SmartIES: Smart Integrated Electronic Systems
L’équipe SmartIES est une équipe d’une trentaine de chercheurs dont les activités sont centrées sur les méthodes de conception et la modélisation de dispositifs, systèmes et circuits intégrés conçus :
• en technologie CMOS,
• à l’aide de technologies émergentes (CNT, CNTFET, MRAM, …),
• selon des approches de conception alternatives (3D, adiabatique, …)
L’ensemble de ces travaux visent à développer des systèmes et circuits intégrés offrant de hautes performances et une consommation d’énergie réduite, mais également des circuits conscients d’eux même et de leur environnement et donc capables de s’adapter à celui-ci de sorte à garantir la fonctionnalité, la sureté de fonctionnement, la sécurité et le meilleur compromis performance consommation ou bien à satisfaire d’autres contraintes applicatives spécifiques. Dans cette démarche SmartIES se caractérise par sa volonté de conduire les approches théoriques jusqu’à des démonstrateurs expérimentaux ou des bancs de mesure. Au cours de la période, on peut noter de nombreux travaux ayant contribué à des réalisations matérielles (ASIC, plateformes expérimentales dédiées, prototypes matériels et/ou logiciels).
Activités Scientifiques
Depuis 1972, l’évolution rapide de la technologie CMOS a permis à la microélectronique de satisfaire la demande croissante en vitesse tout en permettant une maitrise de la consommation. Toutefois, cette évolution s’essouffle et devrait s’arrêter au nœud 7nm (annonce de l’ITRS) alors même que les demandes en puissance de calcul et efficacité énergétique ne cessent de croître avec l’émergence de l’Internet des Objets et l’Intelligence Artificielle. Dans ce contexte, smartIES vise à développer des solutions de conception innovantes tant avec des technologies CMOS avancées qu’avec des technologies émergentes afin de répondre aux attentes en termes d’efficacité énergétique, performance, fiabilité et sécurité. Les activités de recherche s’articulent autour de trois axes :
Technologies Emergentes & CMOS avancé
Mots clefs : intégration 3D, nanotubes de carbones, ordinateur quantique, logique adiabatique, MRAM, MEMS/NEMS, capteurs, biocapteurs, conception analogique avancée, circuits et systèmes adaptatifs, méthodes de conception statistiques, conception faible puissance.
Capteurs & Systèmes de Capteurs Adaptatifs
Mots clefs : fusion de données, biocapteurs, monitoring de la vie et de l’environnement, Bio impédance, traitement du signal.
Circuits & Systèmes Sécurisés
Mots clefs : attaques par canaux caches, attaques par injection de fautes, rétro--conception physique / fonctionnelle par canal électromagnétiques et thermique, intégrité et authenticité des circuits, traitement du signal, statistiques du signal.
Membres
Permanents
- Nadine Azémard-Crestani, Chargé de Recherche CNRS
- Serge Bernard, Directeur de Recherche CNRS
- Guy Cathebras, Professeur des Universités UM
- Vincent Kerzerho, Chargé de Recherche CNRS
- Laurent Latorre, Professeur des Universités UM
- Frédérick Mailly, Maître de Conférences UM
- Philippe Maurine, Maître de Conférences UM
- Pascal Nouet, Professeur des Universités UM
- Fabien Soulier, Maître de Conférences UM
- Aida Todri-Sanial, Chargé de Recherche CNRS
Non permanents
- Sonia Abdellatif, Doctorant
- Mohamed Moez Belhaj, CDD Chercheur CNRS
- Nicolas Champauzas, Doctorant
- Rongmei Chen, CDD Chercheur CNRS
- Maxime Cozzi, Doctorant
- Marwa Dhifallah, CDD Chercheur CNRS
- Mathieu Dumont, Doctorant
- Christophe Guermont, Doctorant
- Jie Liang, Doctorant CNRS
- Maxime Madau, Doctorant UM
- Josue Rivera Velazquez, Doctorant
- Kaan Sevin, Doctorant
- Ibrahim Shankhour, CDD Ingénieur-Technicien
- Julien Toulemont, Doctorant
- Aurélien Vasselle, Doctorant
- Lucas Vernotte, Doctorant
Publications depuis 2014 - Evaluation 2019
Articles de revues internationales
2019
- Tagging Atlantic bluefin tuna from a farming cage: An attempt to reduce handling times for large scale deploymentsTristan Rouyer, Sylvain Bonhommeau, Nicolas Giordano, Saviour Ellul, Giovanni Ellul, Simeon Deguara, Bertrand Wendling, Mohamed Moez Belhaj, Vincent Kerzérho, Serge BernardFisheries Research, Elsevier, 2019, 211, pp.27-31.
- A global database of water vapor isotopes measured with high temporal resolution infrared laser spectroscopyZhongwang Wei, Xuhui Lee, Franziska Aemisegger, Marion Benetti, Max Berkelhammer, Mathieu Casado, Kelly Caylor, Emanuel Christner, Christoph Dyroff, Omaira Garcìa, Yenny González, Timothy Griffis, Naoyuki Kurita, Jie Liang, Mao-Chang Liang, Guanghui Lin, David Noone, Konstantin Gribanov, Niels Munksgaard, Matthias Schneider, François Ritter, Hans Christian Steen-Larsen, Christine Vallet-Coulomb, Xuefa Wen, Jonathon Wright, Wei Xiao, Kei YoshimuraScientific Data , Nature Publishing Group, 2019, 6, pp.180302.
- Breaking the speed-power-accuracy trade-off in current mirror with non-linear CCII feedbackMohan Julien, Serge Bernard, Fabien Soulier, Vincent Kerzérho, Guy CathébrasMicroelectronics Journal, Elsevier, 2019, 83, pp.77-85.
2018
- Effects of extraction method and storage of dry tissue on marine lipids and fatty acidsFany Sardenne, Nathalie Bodin, Luisa Métral, Anaïs Crottier, Fabienne Le Grand, Antoine Bideau, Blandine Brisset, Jérôme Bourjea, Claire Saraux, Sylvain Bonhommeau, Vincent Kerzérho, Serge Bernard, Tristan RouyerAnalytica Chimica Acta, Elsevier Masson, 2018, 1051, pp.82-93.
- A high-reliability and low-power computing-in-memory implementation within STT-MRAMLiuyang Zhang, Erya Deng, Hao Cai, You Wang, Lionel Torres, Aida Todri-Sanial, Youguang ZhangMicroelectronics Journal, Elsevier, 2018, 81, pp.69-75.
- Atomistic to Circuit-Level Modeling of Doped SWCNT for On-Chip InterconnectsJie Liang, Jaehyun Lee, Salim Berrada, Vihar Georgiev, Reetu Raj Pandey, Rongmei Chen, Asen Asenov, Aida Todri-SanialIEEE Transactions on Nanotechnology, Institute of Electrical and Electronics Engineers, 2018, 17 (6), pp.1084-1088.
- System-level simulations of multi-sensor systems and data fusion algorithmsJosué Manuel Rivera Velázquez, Frédérick Mailly, Pascal NouetMicrosystem Technologies, Springer Verlag, 2018. <10.1007/s00542-018-4204-8>
- Power Supply Noise Aware Task Scheduling on Homogeneous 3D MPSoCs Considering the Thermal ConstraintYing-Lin Zhao, Jianlei Yang, Weisheng Zhao, Aida Todri-Sanial, Yuanqing ChengJournal of Computer Science and Technology, Springer Verlag, 2018, 33 (5), pp.966-983.
- Variability Study of MWCNT Local Interconnects Considering Defects and Contact Resistances - Part II: Impact of Charge Transfer DopingRongmei Chen, Jie Liang, Jaehyun Lee, Vihar P. Georgiev, Raphael Ramos, Hanako Okuno, Dipankar Kalita, Yuanqing Cheng, Liuyang Zhang, Reetu Raj Pandey, Salvatore Amoroso, Campbell Millar, Asenov Asen, Jean Dijon, Aida Todri-SanialIEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2018. <10.1109/TED.2018.2868424>
- Variability Study of MWCNT Local Interconnects Considering Defects and Contact Resistances - Part I: Pristine MWCNTRongmei Chen, Jie Liang, Jaehyun Lee, Vihar P. Georgiev, Raphael Ramos, Hanako Okuno, Dipankar Kalita, Yuanqing Cheng, Liuyang Zhang, Reetu Raj Pandey, Salvatore Amoroso, Campbell Millar, Asenov Asen, Jean Dijon, Aida Todri-SanialIEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2018, 65 (11), pp.4955-4962.
- Assessing Body Built-In Current Sensors for Detection of Multiple Transient FaultsRaphael Andreoni Camponogara-Viera, Jean-Max Dutertre, Marie-Lise Flottes, Olivier Potin, Giorgio Di Natale, Bruno Rouzeyre, Rodrigo Possamai BastosMicroelectronics Reliability, Elsevier, 2018, pp.128-134.
- Understanding Electromigration in Cu-CNT Composite Interconnects: A Multiscale Electrothermal Simulation StudyJaehyun Lee, Salim Berrada, Fikru Adamu-Lema, Nicole Nagy, Vihar P. Georgiev, Toufik Sadi, Jie Liang, Raphael Ramos, Hamilton Carrillo-Nunez, Dipankar Kalita, Katharina Lilienthal, Marcus Wislicenus, Reetu Raj Pandey, Bingan Chen, Kenneth B. K. Teo, Goncalo Goncalves, Hanako Okuno, Benjamin Uhlig, Aida Todri-Sanial, Jean Dijon, Asen AsenovIEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2018, 65 (9), pp.3884-3892.
- A Temperature-Hardened Sensor Interface with a 12-Bit Digital Output Using a Novel Pulse Width Modulation TechniqueEmna Chabchoub, Franck Badets, Frédérick Mailly, Pascal Nouet, Mohamed MasmoudiSensors, MDPI, 2018, 18 (4), pp.1107-1227.
- Addressing the Thermal Issues of STT-MRAM From Compact Modeling to Design TechniquesLiuyang Zhang, Yuanqing Cheng, Kang Wang, Lionel Torres, Youguang Zhang, Aida Todri-SanialIEEE Transactions on Nanotechnology, Institute of Electrical and Electronics Engineers, 2018, 17 (2), pp.345-352.
- On-chip Generation of Sine-wave Summing Digital Signals: an Analytic Study Considering Implementation ConstraintsStéphane David-Grignot, Achraf Lamlih, Mohamed Moez Belhaj, Vincent Kerzérho, Florence Azaïs, Fabien Soulier, Philippe Freitas, Tristan Rouyer, Sylvain Bonhommeau, Serge BernardJournal of Electronic Testing, Springer Verlag, 2018. <10.1007/s10836-018-5710-4>
- From theory to practice: horizontal attacks on protected implementations of modular exponentiationsIbrahima Diop, Yanis Linge, Thomas Ordas, Pierre-Yvan Liardet, Philippe MaurineJournal of Cryptographic Engineering, Springer, In press. <10.1007/s13389-018-0181-1>
- Estimating the Signal-to-Noise ratio under repeated sampling of the same centered signal: applications to side-channel attacks on a cryptoprocessorGilles Ducharme, Philippe MaurineIEEE Transactions on Information Theory, Institute of Electrical and Electronics Engineers, 2018, 64 (9), pp.6333-6339.
2017
- An On-Chip Technique to Detect Hardware Trojans and Assist Counterfeit IdentificationMaxime Lecomte, Jacques Jean-Alain Fournier, Philippe MaurineIEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE, 2017, 25 (12), pp.3317-3330.
- Method for evaluation of transient-fault detection techniquesRaphael Andreoni Camponogara-Viera, Rodrigo Possamai Bastos, Jean-Max Dutertre, Philippe Maurine, Rodrigo Iga JadueMicroelectronics Reliability, Elsevier, 2017, 76-77, pp.68-74.
- New Calibration Technique of Contact-less Resonant BiosensorAnthony Deluthault, Vincent Kerzérho, Serge Bernard, Fabien Soulier, Philippe CauvetJournal of Electronic Testing, Springer Verlag, 2017, 33 (3), pp.365-375.
- Guest Editorial Special Issue on Nanoelectronic Circuit and System Design Methods for the Mobile Computing EraAida Todri-Sanial, Saraju Mohanty, Mariane Comte, Marc BellevilleACM Journal on Emerging Technologies in Computing Systems, Association for Computing Machinery, 2017, 13 (2), pp.1-2.
- A fully-digital and ultra-low-power front-end for differential capacitive sensorsPatcharee Kongpark, Souha Hacine, Laurent Latorre, Frédérick Mailly, Pascal NouetMicrosystem Technologies, Springer Verlag, 2017, 23 (9), pp.3991-4000.
- Smart-MEMS based inertial measurement units: gyro-free approach to improve the gradeGaurav Chatterjee, Laurent Latorre, Frédérick Mailly, Pascal Nouet, Nacim Hachelef, Coumar OudéaMicrosystem Technologies, Springer Verlag, 2017, 23 (9), pp.3969-3978.
- A Survey of Carbon Nanotube Interconnects for Energy Efficient Integrated CircuitsAida Todri-Sanial, Raphael Ramos, Hanako Okuno, Jean Dijon, Abitha Dhavamani, Marcus Widlicenus, Katharina Lilienthal, Benjamin Uhlig, Toufik Sadi, Vihar Georgiev, Asen Asenov, Salvatore Amoroso, Andrew Pender, Andrew Brown, Campbell Millar, Fabian Motzfeld, Bernd Gotsmann, Jie Liang, Goncalo Goncalves, Nalin Rupesinghe, Ken TeoIEEE Circuits and Systems Magazine -New Series-, Institute of Electrical and Electronics Engineers, 2017, 17 (2), pp.47-62.
- Efficient Objective Metric Tool for Medical Electrical Device Development: Eye Phantom for Glaucoma Diagnosis DeviceAnthony Deluthault, Luc Mezenge, Philippe Cauvet, Vincent Kerzérho, Fabien Soulier, Serge BernardJournal of Sensors, Hindawi Publishing Corporation, 2017, 2017, pp.1687-725X.
- Electromagnetic fault injection: the curse of flip-flopsSébastien Ordas, Ludovic Guillaume-Sage, Philippe MaurineJournal of Cryptographic Engineering, Springer, 2017, 7 (3), pp.183-197.
2016
- Temperature Impact Analysis and Access Reliability Enhancement for 1T1MTJ STT-RAMBi Wu, Yuanqing Cheng, Jianlei Yang, Aida Todri-Sanial, Weisheng ZhaoIEEE Transactions on Reliability, Institute of Electrical and Electronics Engineers, 2016, 65 (4), pp.1755-1768.
- A Study of 3-D Power Delivery Networks With Multiple Clock DomainsAida Todri-Sanial, Yuanqing ChengIEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE, 2016, 24 (11), pp.3218-3231.
- Alleviating Through-Silicon-Via Electromigration for 3-D Integrated Circuits Taking Advantage of Self-Healing EffectYuanqing Cheng, Aida Todri-Sanial, Jianlei Yang, Weisheng ZhaoIEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE, 2016, 24 (11), pp.3310-3322.
- Mutual information analysis: higher-order statistical moments, efficiency and efficacyMathieu Carbone, Yannick Teglia, Gilles R. Ducharme, Philippe MaurineJournal of Cryptographic Engineering, Springer, 2016, Journal of Cryptographic Engineering, 5 (20). <10.1007/s13389-016-0123-8>
- Energy Study for 28 nm Fully Depleted Silicon-On-Insulator DevicesKheirallah Rida, Gilles Ducharme, Nadine AzemardJournal of Low Power Electronics, American Scientific Publishers, 2016, 12 (1), pp.58-63.
- Energy Study for 28 nm Fully Depleted Silicon-On-Insulator DevicesRida Kheirallah, Gilles Ducharme, Nadine AzemardJournal of Low Power Electronics, American Scientific Publishers, 2016, 12 (1), pp.58-63.
- SSB Phase Noise Evaluation of Analog/IF Signals on Standard Digital ATEFlorence Azaïs, Stéphane David-Grignot, Laurent Latorre, François LefevreJournal of Electronic Testing, Springer Verlag, 2016, 32 (1), pp.69-82.
- Electrothermal Analysis of Carbon Nanotubes Power Delivery Networks for Nanoscale Integrated CircuitsAlessandro Magnani, Massimiliano De Magistris, Aida Todri-Sanial, Antonio MaffucciIEEE Transactions on Nanotechnology, Institute of Electrical and Electronics Engineers, 2016, 15 (3), pp.380-388.
- A phantom axon setup for validating models of action potential recordingsOlivier Rossel, Fabien Soulier, Serge Bernard, David Guiraud, Guy CathébrasMedical and Biological Engineering and Computing, Springer Verlag, 2016, 10 (4), pp.671-678.
- Digital Embedded Test Instrument for On-Chip Phase Noise Testing of Analog/RF Integrated CircuitsFlorence Azaïs, Stéphane David-Grignot, Laurent Latorre, François LefevreJournal of Circuits, Systems, and Computers, World Scientific Publishing, 2016. <10.1142/S0218126616400144>
2015
- Efficiency evaluation of analog/RF alternate test: Comparative study of indirect measurement selection strategiesSyhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, Michel RenovellMicroelectronics Journal, Elsevier, 2015, 46 (11), pp.1091-1102.
- A new monolithic 3-axis thermal convective accelerometer: principle, design, fabrication and characterizationHuy Binh Nguyen, Frédérick Mailly, Laurent Latorre, Pascal NouetMicrosystem Technologies, Springer Verlag, 2015, 21 (9), pp.1867-1877.
- Pressure sensing method based on the transient response of a thermally actuated micro-wireOlivier Legendre, Hervé Bertin, Hervé Mathias, Ming Zhang, Souhil Megherbi, Frédérick MaillySensors and Actuators A: Physical , Elsevier, 2015, 221, pp.115-122.
- Special Issue on Advances in Design of Ultra-Low Power Circuits and Systems in Emerging TechnologiesAida Todri-Sanial, Sanjukta BhanjaACM Journal on Emerging Technologies in Computing Systems, Association for Computing Machinery, 2015, Guest Editorial, 12 (2), pp.#11.
- Vertical and horizontal correlation attacks on RNS-based exponentiationsGuilherme Perin, Laurent Imbert, Philippe Maurine, Lionel TorresJournal of Cryptographic Engineering, Springer, 2015, 5 (3), pp.171-185.
- Phase Noise Testing of Analog/IF Signals Using Digital ATE: A New Post-Processing Algorithm for Extended Measurement RangeStéphane David-Grignot, Florence Azaïs, Laurent Latorre, François LefevreJournal of Electronic Testing, Springer Verlag, 2015, pp.1-17.
2014
- A model of the leakage in the frequency domain and its application to CPA and DPASébastien Tiran, Sébastien Ordas, Yannick Teglia, Michel Agoyan, Philippe MaurineJournal of Cryptographic Engineering, Springer, 2014, 4 (3), pp.197-212.
- Evaluating a Radiation Monitor for Mixed-Field Environments based on SRAM TechnologyGeorgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri-Sanial, Arnaud Virazel, Julien Mekki, Markus Brugger, Frédéric Wrobel, Frédéric SaignéJournal of Instrumentation, IOP Publishing, 2014, 9. <10.1088/1748-0221/9/05/C05052>
- Multiple Cell Upset Classification in Commercial SRAMsGeorgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri-Sanial, Arnaud Virazel, Helmut Puchner, Christopher Frost, Frédéric Wrobel, Frédéric SaignéIEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2014, 61 (4), pp.1747-1754.
- Enhancing Confidence in Indirect Analog/RF Testing against the Lack of Correlation between Regular Parameters and Indirect MeasurementsHaithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, Michel RenovellMicroelectronics Journal, Elsevier, 2014, 45 (3), pp.336-344.
- An SRAM Based Monitor for Mixed-Field Radiation EnvironmentsGeorgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri-Sanial, Arnaud Virazel, Julien Mekki, Markus Brugger, Frédéric Wrobel, Frédéric SaignéIEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2014, 61 (4), pp.1663-1670.
- Study of Low-Cost Electrical Test Strategies for Post-Silicon Yield Improvement of MEMS Convective AccelerometersAhmed Rekik, Florence Azaïs, Frédérick Mailly, Pascal NouetJournal of Electronic Testing, Springer Verlag, 2014, 30 (1), pp.87-100.
- Dynamic Variability Monitoring Using Statistical Tests for Energy Efficient Adaptive ArchitecturesLionel Vincent, Edith Beigné, Suzanne Lesecq, Julien Mottin, David Coriat, Philippe MaurineIEEE Transactions on Circuits and Systems Part 1 Fundamental Theory and Applications, Institute of Electrical and Electronics Engineers (IEEE), 2014, Part I: Regular Papers, 61 (6), pp.1741-1754.
- Globally Constrained Locally Optimized 3-D Power Delivery NetworksAida Todri-Sanial, Sandip Kundu, Patrick Girard, Alberto Bosio, Luigi Dilillo, Arnaud VirazelIEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE, 2014, 22 (10), pp.2131-2144.
- A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMsJoão Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Jérémy Alvarez-Hérault, Ken MackayIEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE, 2014, 22 (11), pp.2326-2335.
Communications internationales
2018
- Power-Supply Noise Analysis for Monolithic 3D ICs Using Electrical and Thermal Co-SimulationAbhishek Koneru, Aida Todri-Sanial, Krishnendu ChakrabartyICECS: International Conference on Electronics Circuits and Systems, Dec 2018, Bordeaux, France. 25th IEEE International Conference on Electronics Circuits and Systems, 2018. <https://www.ieee-icecs2018.org>
- A multitone analysis for bioimpedance spectroscopy using minimal digital ressourceFabien Soulier, Achraf Lamlih, Vincent Kerzérho, Serge BernardICST: International Conference on Sensing Technology, Dec 2018, Limerick, Ireland. 12th International Conference on Sensing Technology, 2018. <http://www.ece.ul.ie/icst2018>
- Electromagnetic Activity vs. Logical Activity: Near Field Scans for Reverse EngineeringMarc Lacruche, Philippe MaurineCARDIS: Smart Card Research and Advanced Applications, Nov 2018, Montpellier, France. 17th Smart Card Research and Advanced Application Conference, 2018. <https://cardis2018.sciencesconf.org>
- From Spintronic Devices to Hybrid CMOS/Magnetic System On ChipSophiane Senni, Frédéric Ouattara, Jad Mohdad, Kaan Sevin, Guillaume Patrigeon, Pascal Benoit, Pascal Nouet, Lionel Torres, François Duhem, Gregory Di Pendina, Guillaume PrenatVLSI-SoC: Very Large Scale Integration-System on Chip, Oct 2018, Verona, Italy. 26th IFIP/IEEE International Conference on Very Large Scale Integration, 2018, Design and Engineering of Electronics Systems Based on New Computing Paradigms. <http://vlsi-soc.di.univr.it>
- The impact of pulsed electromagnetic fault injection on true random number generatorsMaxime Madau, Michel Agoyan, Josep Balash, Milos Grujic, Patrick Haddad, Philippe Maurine, Vladimir Rozic, Dave Singelee, Bohan Yang, Ingrid VerbauwhedeJ. Daemen; L. Sauvage. FDTC: Fault Diagnosis and Tolerance in Cryptography, Sep 2018, Amsterdam, Netherlands. IEEE International Workshop on Fault Diagnosis and Tolerance in Cryptography, 2018. <10.5281/zenodo.1434075>
- Exploiting Phase Information in Thermal Scans for Stealthy Trojan DetectionMaxime Cozzi, Jean-Marc Galliere, Philippe MaurineDSD: Digital System Design, Aug 2018, Prague, Slovakia. Euromicro Conference on Digital System Design, 2018. <http://dsd-seaa2018.fit.cvut.cz/dsd/>
- A Robust Dual Reference Computing-in-Memory Implementation and Design Space Exploration Within STT-MRAMLiuyang Zhang, Wang Kang, Hao Cai, Peng Ouyang, Lionel Torres, Youguang Zhang, Aida Todri-Sanial, Weisheng ZhaoISVLSI: International Symposium on Very Large Scale Integration, Jul 2018, Hong Kong, China. IEEE Computer Society Annual Symposium on VLSI, 2018. <10.1109/ISVLSI.2018.00058>
- Combined analysis of supply voltage and body-bias voltage for energy managementRida Kheirallah, Jean-Marc Galliere, Nadine Azemard, Gilles DucharmePATMOS: Power and Timing Modeling, Optimization and Simulation, Jul 2018, Platja d’Aro, Spain. 28th IEEE International Symposium on Power and Timing Modeling, Optimization and Simulation, 2018. <10.1109/PATMOS.2018.8464159>
- Low-cost functional test of a 2.4 GHz OQPSK transmitter using standard digital ATEThibault Vayssade, Florence Azaïs, Laurent Latorre, Francois LefèvreIOLTS: International On-Line Testing Symposium, Jul 2018, Platja d'Aro, Spain. IEEE, IEEE 24th International Symposium on On-Line Testing And Robust System Design, pp.17-22, 2018.
- Chameleon: A Thermally Adaptive Error Correction Code Design for STT-MRAM LLCsDijun Liu, Yuanqing Cheng, Y. Wang, B. Wu, B. Zhang, Aida Todri-Sanial, Weisheng ZhaoDAC: Design Automation Conference, Jun 2018, San Fransisco, United States. 2018.
- Challenges and Progress on Carbon Nanotube Integration for BEOL InterconnectsBenjamin Uhlig, Abitha Dhavamani, Nicole Nagy, Katharina Lilienthal, Liske R., Raphael Ramos, Jean Dijon, Hanako Okuno, Dipankar Kalita, Lee Jaehyun, Vihar P. Georgiev, Asenov Asen, Salvatore Amoroso, Liping Wang, Koenemann Fabien, Bernd Gotsmann, Goncalo Goncalves, Bingam Cheng, Jie Liang, Reetu Raj Pandey, Rongmei Chen, Aida Todri-SanialIITC: International Interconnect Technology Conference, Jun 2018, Santa Clara, United States. 21st IEEE International Interconnect Technology Conference, pp.16-18, 2018.
- Wideband Fully Differential Current Driver with Optimized Output Impedance for Bioimpedance MeasurementsAchraf Lamlih, Philippe Freitas, Stéphane David-Grignot, Jérémie Salles, Vincent Kerzérho, Fabien Soulier, Serge Bernard, Tristan Rouyer, Sylvain BonhommeauISCAS: International Symposium on Circuits and Systems, May 2018, Florence, Italy. IEEE, IEEE International Symposium on Circuits and Systems, 2018. <10.1109/ISCAS.2018.8351464>
- A generic model for sensor simulation at system levelPascal Nouet, Josue Manuel Rivera Velazquez, Frédérick MaillyDTIP: Design, Test, Integration and Packaging, May 2018, Roma, Italy. IEEE, 20th Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS, 2018. <10.1109/DTIP.2018.8394198>
- Post-fabrication soft trimming of resistive sensorsIbrahim Shankhour, Jad Mohdad, Frédérick Mailly, Pascal NouetDTIP: Design, Test, Integration and Packaging, May 2018, Roma, Italy. IEEE, 20th Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS, 2018. <10.1109/DTIP.2018.8394221>
- Thermal Scans for Detecting Hardware TrojansMaxime Cozzi, Philippe Maurine, Jean-Marc GalliereCOSADE: Constructive Side-Channel Analysis and Secure Design, Apr 2018, Singapour, Singapore. 9th International Workshop on Constructive Side-Channel Analysis and Secure Design, LNCS (10815), pp.117-132, 2018, COSADE 2018.
- Standard CAD Tool-Based Method for Simulation of Laser-Induced Faults in Large-Scale CircuitsRaphael Andreoni Camponogara-Viera, Jean-Max Dutertre, Philippe Maurine, Rodrigo Possamai BastosISPD: International Symposium on Physical Design, Mar 2018, Monterey, CA, United States. ACM Press, International Symposium on Physical Design, pp.160-167, 2018.
- Progress on carbon nanotube BEOL interconnectsBenjamin Uhlig, Jie Liang, Lee Jaehyun, Raphael Ramos, Abitha Dhavamani, Nicole Nagy, Jean Dijon, Hanako Okuno, Dipankar Kalita, Vihar P. Georgiev, Asenov Asen, Salvatore Amoroso, Liping Wang, Campbell Millar, F. Konemann, Bernd Gotsmann, Goncalo Goncalves, Bingham Chen, Reetu Raj Pandey, Rongmei Chen, Aida Todri-SanialDATE: Design, Automation and Test in Europe, Mar 2018, Dresden, Germany. 21st Design, Automation & Test in Europe Conference & Exhibition, 2018. <10.23919/DATE.2018.8342144>
- Using multifunctional standardized stack as universal spintronic technology for IoTMehdi B. Tahoori, Sarath Mohanachandran Nair, Rajendra Bishnoi, Sophiane Senni, Jad Mohdad, Frédérick Mailly, Lionel Torres, Pascal Benoit, Abdoulaye Gamatié, Pascal Nouet, Frédéric Ouattara, Gilles Sassatelli, Kotb Jabeur, Pierre Vanhauwaert, Alexandru Atitoaie, Ioana Firastrau, G. Di Pendina, Guillaune PrenatDATE: Design, Automation and Test in Europe, Mar 2018, Dresden, Germany. IEEE Design, Automation & Test in Europe Conference & Exhibition, 2018. <10.23919/DATE.2018.8342143>
2017
- A physics-based investigation of Pt-salt doped carbon nanotubes for local interconnectsJie Liang, Raphael Ramos, Jean Dijon, H. Okuno, D. Kalita, D. Renaud, J. Lee, Vihar Georgiev, Salim Berrada, T. Sadi, A. Asenov, B. Uhlig, K. Lilienthal, A. Dhavamani, F. Konemann, B. Gotsmann, G. Goncalves, B. Chen, K. Teo, Reetu Raj Pandey, Aida Todri-SanialIEDM: International Electron Devices Meeting, Dec 2017, San Francisco, United States. IEEE, IEEE International Electron Devices Meeting, 2018. <10.1109/IEDM.2017.8268502>
- Synchronised 4-Phase Resonant Power Clock Supply for Energy Efficient Adiabatic LogicNicolas Jeanniot, Gael Pillonnet, Pascal Nouet, Nadine Azemard, Aida Todri-SanialICRC: International Conference on Rebooting Computing, Nov 2017, Washington, DC, United States. IEEE, IEEE International Conference on Rebooting Computing, 2017. <10.1109/ICRC.2017.8123661>
- Atomistic to circuit level modeling of defective doped SWCNTs with contacts for on-chip interconnect applicationJie Liang, Lee Jaehyun, Salim Berrada, Vihar P. Georgiev, Asenov Asen, Nadine Azemard, Aida Todri-SanialNMDC: Nanotechnology Materials and Devices Conference, Oct 2017, Singapore, Singapore. IEEE 12th Nanotechnology Materials and Devices Conference, 2017. <10.1109/NMDC.2017.8350506>
- Method for evaluation of transient-fault detection techniquesRaphael Andreoni Camponogara-Viera, Rodrigo Possamai Bastos, Jean-Max Dutertre, Philippe MaurineESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Sep 2017, Bordeaux, France. 2017.
- Atoms-to-circuits simulation investigation of CNT interconnects for next generation CMOS technologyJaehyun Lee, Jie Liang, Salvatore Amoroso, Toufik Sadi, Liping Wang, Asen Asenov, Andrew Pender, Dave Reid, Vihar Georgiev, Campbell Millar, Aida Todri-SanialSISPAD: Simulation of Semiconductor Processes and Devices, Sep 2017, Kamakura, Japan. IEEE, International Conference on Simulation of Semiconductor Processes and Devices, 2017. <10.23919/SISPAD.2017.8085287>
- The impact of vacancy defects on CNT interconnects: From statistical atomistic study to circuit simulationsJaehyun Lee, Salim Berrada, Jie Liang, Toufik Sadi, Vihar Georgiev, Aida Todri-Sanial, Dipankar Kalita, Raphaël Ramos, Hanako Okuno, Jean Dijon, Asen AsenovSISPAD: International Conference on Simulation of Semiconductor Processes and Devices, Sep 2017, Kamakura, Japan. IEEE, International Conference on Simulation of Semiconductor Processes and Devices, 2017. <10.23919/SISPAD.2017.8085288>
- Role of Laser-Induced IR Drops in the Occurrence of Faults: Assessment and SimulationRaphael Andreoni Camponogara-Viera, Jean-Max Dutertre, Rodrigo Possamai Bastos, Philippe MaurineDSD: Digital System Design, Aug 2017, Vienna, Austria. IEEE, Euromicro Conference on Digital System Design, 2017. <10.1109/DSD.2017.43>
- High Temperature, Time Domain Sensor Interface based on Phase ShifterEmna Chabchoub, Franck Badets, Mohamed Masmoudi, Pascal Nouet, Frédérick MaillyHiTen: High Temperature Electronics Network, Jul 2017, Cambridge, United Kingdom. International Conference and Exhibition on High Temperature Electronics Network, 2017 (HiTen), pp.103-108, 2017.
- Analytical Study of On-chip Generations of Analog Sine-wave Based on Combined Digital SignalsStéphane David-Grignot, Achraf Lamlih, Vincent Kerzérho, Florence Azaïs, Fabien Soulier, Serge BernardIMSTW: International Mixed Signals Testing Workshop, Jul 2017, Thessaloniki, Greece. IEEE, 22nd IEEE International Mixed Signals Testing Workshop, 2017. <10.1109/IMS3TW.2017.7995205>
- GREAT: HeteroGeneous IntegRated Magnetic tEchnology Using Multifunctional Standardized sTackMehdi B. Tahoori, Sarath Mohanachandran Nair, Rajendra Bishnoi, Sophiane Senni, Jad Mohdad, Frédérick Mailly, Lionel Torres, Pascal Benoit, Pascal Nouet, Rui Ma, Martin Kreißig, Frank Ellinger, Kotb Jabeur, Pierre Vanhauwaert, Gregory Di Pendina, Guillaune PrenatISVLSI: IEEE International Symposium on Very Large Scale Integration, Jul 2017, Bochum, Germany. 2017, Proceedings. <10.1109/ISVLSI.2017.67>
- New time-domain conditioning circuit for resistive sensor: Behavioral modelling for simulation and optimizationEmna Chabchoub, Franck Badets, Mohamed Masmoudi, Frédérick Mailly, Pascal NouetMIXDES: Mixed Design of Integrated Circuits and Systems, Jun 2017, Bydgoszcz, Poland. IEEE, 24th International Conference on Mixed Design of Integrated Circuits and Systems, pp.408-411, 2017.
- Importance of IR Drops on the Modeling of Laser-Induced Transient FaultsRaphael Andreoni Camponogara-Viera, Philippe Maurine, Jean-Max Dutertre, Rodrigo Possamai BastosSMACD: Synthesis, Modeling, Analysis and simulation methods and applications to Circuit Design, Jun 2017, Giardini Naxos, Taormina, Italy. IEEE, 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, 2017. <10.1109/SMACD.2017.7981593>
- A hierarchical model for CNT and Cu-CNT composite interconnects: from density functional theory to circuit-level simulationsLee Jaehyun, Sadi Toufik, Jie Liang, Vihar Georgiev, Aida Todri-Sanial, Asenov AsenIWCN: International Workshop on Computational Nanotechnology, Jun 2017, Windermere, United Kingdom. 19th IEEE International Workshop on Computational Nanotechnology, 2017. <http://iwcn2017.iopconfs.org/>
- Formal analysis of high-performance stabilized active-input current mirrorMohan Julien, Serge Bernard, Fabien Soulier, Vincent Kerzérho, Guy CathébrasISCAS: International Symposium on Circuits and Systems, May 2017, Baltimore, MD, United States. IEEE, IEEE International Symposium on Circuits and Systems, 2017. <10.1109/ISCAS.2017.8051012>
- A high temperature, 12-bit-time-domain sensor interface based on injection locked oscillatorEmna Chabchoub, Franck Badets, Pascal Nouet, Mohamed Masmoudi, Frédérick MaillyISCAS: International Symposium on Circuits and Systems, May 2017, Baltimore, United States. IEEE, 50th IEEE International Symposium of Circuits and Systems., pp.1-4, 2017.
- Toward Carbon Nanotube ComputingAida Todri-SanialEmerging Technology, May 2017, Varsovie, Poland. CMOS Emerging Technology Research Symposium, 2017. <http://www.etcmos.com/current_event.php?event=2017>
- Electrical performance of carbon-based power distribution networks with thermal effectsA. Magnani, M. De Magistris, S. Heidari, Aida Todri-Sanial, A. MaffucciSPI: Signal and Power Integrity, May 2017, Baveno, Italy. IEEE, IEEE 21st Workshop on Signal and Power Integrity, 2017. <10.1109/SaPIW.2017.7944044>
- Combo of innovative educational approaches to teach industrial test to undergraduate studentsBeatrice Pradarelli, Pascal Nouet, Laurent LatorreEDUCON: Global Engineering Education Conference, Apr 2017, Athens, Greece. IEEE, 8th IEEE Global Engineering Education Conference, 2017. <10.1109/EDUCON.2017.7942824>
- Impacts of Technology Trends on Physical Attacks?Philippe Maurine, Sylvain GuilleyCOSADE: Constructive Side-Channel Analysis and Secure Design, Apr 2017, Paris, France. International Workshop on Constructive Side-Channel Analysis and Secure Design, LNCS (10348), pp.190-206, 2017.
- Formal analysis of bandwidth enhancement for high-performance active-input current mirrorMohan Julien, Serge Bernard, Fabien Soulier, Vincent Kerzérho, Guy CathébrasDTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2017, Palma de Mallorca, Spain. IEEE, 12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, 2017. <10.1109/DTIS.2017.7930162>
- Highly linear voltage-to-time converter based on injection locked relaxation oscillatorsEmna Chabchoub, Franck Badets, Mohamed Masmoudi, Pascal Nouet, Frédérick MaillySSD: Systems, Signals and Devices, Mar 2017, Marrakech, Morocco. IEEE, 14th International Multi-Conference on Systems, Signals and Devices, 2017, SAC: Systems, Analysis and Automatic. <10.1109/SSD.2017.8167011>
- Power and Performance Analysis of Doped SW/DW CNT for On-Chip Interconnect ApplicationAida Todri-Sanial, Jie LiangGRAPHENE, Mar 2017, Barcelone, Spain. 7th edition of the largest European Conference in Graphene and 2D Materials, 2017. <http://www.grapheneconf.com/2017/>
2016
- EKF-based state estimation for train localizationDamien Veillard, Frédérick Mailly, Philippe FraisseIEEE Sensors 2016 , Oct 2016, Orlando, United States. 2016, Proceedings of IEEE Sensors 2016 Conference. <10.1109/ICSENS.2016.7808726>
- Mixed-level simulation tool for design optimization of electrical impedance spectroscopy systemsAchraf Lamlih, Vincent Kerzérho, Serge Bernard, Fabien Soulier, Mariane Comte, Michel Renovell, Tristan Rouyer, Sylvain BonhommeauIWIS: International Workshop on Impedance Spectroscopy, Sep 2016, Chemnitz, Germany. Session: Bioimpedance Spectroscopy II (N012). <https://www.tu-chemnitz.de/etit/messtech/iwis/openconf/modules/request.php?module=oc_program&action=program.php>
- Electrothermal Modeling and Analysis of Carbon Nanotube InterconnectsAida Todri-SanialPATMOS: Power And Timing Modeling, Optimization and Simulation, Sep 2016, Brême, Germany. 26th International Workshop on Power And Timing Modeling, Optimization and Simulation, 2016. <http://www.item.uni-bremen.de/patmos/>
- Investigation of electrical and thermal properties of carbon nanotube interconnectsAida Todri-SanialPATMOS: Power and Timing Modeling, Optimization and Simulation, Sep 2016, Brême, Zimbabwe. IEEE, 26th International Workshop on Power and Timing Modeling, Optimization and Simulation, pp.25-32, 2016.
- Physical description and analysis of doped carbon nanotube interconnectsJie Liang, Liuyang Zhang, Nadine Azemard, Pascal Nouet, Aida Todri-SanialPATMOS: Power and Timing Modeling, Optimization and Simulation, Sep 2016, Brême, Germany. IEEE, 26th IEEE International Workshop on Power and Timing Modeling, Optimization and Simulation, pp.250-255, 2016.
- Problem-Based Learning Approach to Teach Printed Circuit Boards TestBeatrice Pradarelli, Pascal Nouet, Laurent LatorreICL: Interactive Collaborative Learning, Sep 2016, Belfast, United Kingdom. 19th International Conference on Interactive Collaborative Learning, 2016. <http://www.icl-conference.org/icl2016/>
- Modeling and Simulation of Carbon Nanotube InterconnectsAida Todri-SanialSISPAD: Simulation of Semiconductor Processes and Devices, Sep 2016, Nuremberg, Germany. 21st International Conference on Simulation of Semiconductor Processes and Devices, 2016. <http://www.sispad2016.org>
- A Simple Conditioner for Resonant Intraocular Pressure SensorFabien Soulier, Frédérick Mailly, Vincent Kerzérho, Anthony Deluthault, Serge Bernard, Philippe CauvetEUROSENSORS XXX, Sep 2016, Budapest, Hungary. 30th European Conference on Solid-State Transducers, 168, pp.67-70, 2016, Procedia Engineering.
- An Embedded Digital Sensor against EM and BB Fault InjectionDavid El-Baze, Jean-Baptiste Rigaud, Philippe MaurineFDTC: Fault Diagnosis and Tolerance in Cryptography, Aug 2016, Santa Barbara, CA, United States. IEEE, Workshop on Fault Diagnosis and Tolerance in Cryptography, pp.78-86, 2016.
- Efficient calibration of contact-less resonant bio-sensor affected by operating conditionsAnthony Deluthault, Vincent Kerzérho, Serge Bernard, Fabien Soulier, Philippe CauvetIMSTW: International Mixed-Signal Testing Workshop, Jul 2016, Sant Feliu de Guixols, Spain. 21st IEEE International Mixed-Signal Testing Workshop, pp.1-6, 2016.
- Quantitative evaluation of reliability and performance for STT-MRAMLiuyang Zhang, Aida Todri-Sanial, Wang Kang, Youguang Zhang, Lionel Torres, Yuanqing Cheng, Weisheng ZhaoISCAS: International Symposium on Circuits and Systems, May 2016, Montréal, QC, Canada. IEEE, http://iscas2016.org, pp.1150-1153, 2016.
- Per Peers Learning Education Approach to Teach Industrial Test to Undergraduate StudentsBeatrice Pradarelli, Pascal Nouet, Laurent LatorreEWME: European Workshop on Microelectronics Education, May 2016, Southampton, United Kingdom. 11th European Workshop on Microelectronics Education, 2016. <http://ewme2016.ecs.soton.ac.uk>
- A clustering technique for fast electrothermal analysis of on-chip power distribution networksAlessandro Magnani, Massimiliano De Magistris, Antonio Maffucci, Aida Todri-SanialSPI: Signal and Power Integrity, May 2016, Turin, Italy. IEEE, IEEE 20th Workshop on Signal and Power Integrity, pp.1-4, 2016.
- Investigation of the power-clock network impact on adiabatic logicNicolas Jeanniot, Aida Todri-Sanial, Pascal Nouet, Gaël Pillonnet, Hervé FanetSPI: Signal and Power Integrity, May 2016, Turin, Italy. 2016 IEEE 20th Workshop on Signal and Power Integrity (SPI) pp.1-4, 2016.
- Granularity and detection capability of an adaptive embedded Hardware Trojan detection systemMaxime Lecomte, Jacques Jean-Alain Fournier, Philippe MaurineHOST: Hardware Oriented Security and Trust, May 2016, McLean, VA, United States. IEEE, IEEE International Symposium on Hardware Oriented Security and Trust, pp.135-138, 2016.
- Reliability and performance evaluation for STT-MRAM under temperature variationLiuyang Zhang, Yuanqing Cheng, Wang Kang, Youguang Zhang, Lionel Torres, Weisheng Zhao, Aida Todri-SanialEuroSimE: Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, Apr 2016, Montpellier, France. 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, pp.1-4, 2016.
- Present and future prospects of carbon nanotube interconnects for energy efficient integrated circuitsAida Todri-Sanial, Alessandro Magnani, Massimiliano De Magistris, Antonio MaffucciEuroSimE: Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, Apr 2016, Montpellier, France. 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, 2016. <10.1109/EuroSimE.2016.7463379>
- Industrial Test Project Oriented EducationBeatrice Pradarelli, Pascal Nouet, Laurent LatorreEDUCON: Global Engineering Education Conference, Apr 2016, Abu Dhabi, United Arab Emirates. IEEE, 2016. <http://www.educon-conference.org/educon2016/index.php>
- On-Chip Fingerprinting of IC Topology for Integrity VerificationMaxime Lecomte, Jacques Jean-Alain Fournier, Philippe MaurineDATE: Design, Automation and Test in Europe, Mar 2016, Dresden, Germany. 2016. <http://www.date-conference.com/conference/session/3.3>
- A Fully-Digital Em Pulse DetectorEl-Baze David, Jean-Baptiste Rigaud, Philippe MaurineDATE: Design, Automation and Test in Europe, Mar 2016, Dresden, Germany. 2016. <http://www.date-conference.com/conference/session/5.3>
- Body Biasing Injection Attacks in PracticeNoemie Beringuier-Boher, Marc Lacruche, David El-Baze, Jean-Max Dutertre, Jean-Baptiste Rigaud, Philippe MaurineCS2: Cryptography and Security in Computing Systems, Jan 2016, Prague, Czech Republic. ACM, 3rd Workshop on Cryptography and Security in Computing Systems (CS2) in conjonction with 11th High Performance and Embedded Architecture and Compilation (HiPEAC) Conference., pp.49-54, 2016.
2015
- Thoroughly analyzing the use of ring oscillators for on-chip hardware trojan detectionMaxime Lecomte, Philippe Maurine, Jacques Jean-Alain FournierReConFig: ReConFigurable Computing and FPGAs, Dec 2015, Mexico, Mexico. International Conference on ReConFigurable Computing and FPGAs, pp.1-6, 2015.
- Collision for Estimating SCA Measurement Quality and Related ApplicationsIbrahima Diop, Mathieu Carbone, Sébastien Ordas, Yanis Linge, Pierre Yvan Liardet, Philippe MaurineCARDIS: Smart Card Research and Advanced Applications, Nov 2015, Bochum, Germany. 14th International Conference, CARDIS 2015, Bochum, Germany, November 4-6, 2015. Revised Selected Papers, LNCS (9514), pp.143-157, 2016, Smart Card Research and Advanced Applications.
- Relevance of impedance spectroscopy for the monitoring of implant-induced fibrosis: A preliminary studyNoëlle Lewis, C Lahuec, S Renaud, E Mcadams, P Bogonez-Franco, C Lethias, S Kellouche, F Carreiras, A Pinna, Aymeric Histace, M Boissiere, E Pauthe, I Lagroye, Fabien Soulier, Serge Bernard, S Binczak, Bertrand Granado, Patrick Garda, M Terosiet, Alexandre Goguin, Olivier RomainIEEE. BIOCAS: Biomedical Circuits and Systems, Oct 2015, Atlanta, United States. Proceedings of BIOCAS 2015 Conference, pp.1-4, 2015.
- EM Injection: Fault Model and LocalitySébastien Ordas, Ludovic Guillaume-Sage, Philippe MaurineFDTC: Fault Diagnosis and Tolerance in Cryptography, Sep 2015, Saint Malo, France. 2015 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC), pp.3-13, 2015.
- Carbon nanotube interconnects for energy-efficient integrated circuitsAida Todri-SanialTNT: Trends in Nanotechnology, Sep 2015, Toulouse, France. 16th International Conference on Trends in Nanotechnology (TNT2015), 2015.
- Statistical Energy Study for 28nm FDSOI TechnologyKheirallah Rida, Gilles Ducharme, Nadine AzemardVARI: Workshop on CMOS Variability, Sep 2015, Salvador, Bahia, Brazil. 2015, 6th International Workshop on CMOS Variability. <http://www.inf.ufrgs.br/vari/>
- Collision Based Attacks in PracticeDiop Ibrahima, Pierre-Yvan Liardet, Yanis Linge, Philippe MaurineDSD: Euromicro Conference on Digital System Design, Aug 2015, Madeire, Portugal. IEEE, Digital System Design (DSD), 2015 Euromicro Conference on, pp.367-374, 2015.
- Carbon-based Power Delivery Networks for nanoscale ICs: electrothermal performance analysisAlessandro Magnani, Massimiliano De Magistris, Aida Todri-Sanial, Antonio MaffucciIEEE-NANO: Nanotechnology, Jul 2015, Rome, Italy. IEEE, 15th IEEE International Conference on Nanotechnology, pp.416-419, 2016.
- On Analysis of On-chip DC-DC Converters for Power Delivery NetworksGhizlane Mouslih, Aida Todri-Sanial, Pascal NouetISVLSI: IEEE Computer Society Annual Symposium on VLSI, Jul 2015, Montpellier, France. IEEE, IEEE Computer Society Annual Symposium on VLSI (ISVLSI), pp.557-560, 2015.
- On the Performance Exploration of 3D NoCs with Resistive-Open TSVsCharles Effiong, Vianney Lapotre, Abdoulaye Gamatié, Gilles Sassatelli, Aida Todri-Sanial, Khalid LatifISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.579-584, 2015, Proceedings of the 2015 IEEE Computer Society Annual Symposium on VLSI (ISVLSI).
- A framework for efficient implementation of analog/RF alternate test with model redundancySyhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, Michel RenovellISVLSI: IEEE Computer Society Annual Symposium on VLSI, Jul 2015, Montpellier, France. IEEE, Proc. IEEE Computer Society Annual Symposium on VLSI (ISVLSI’15), pp.621-626, 2015.
- Toward adaptation of ADCs to operating conditions through on-chip correctionVincent Kerzérho, Ludovic Guillaume-Sage, Florence Azaïs, Mariane Comte, Michel Renovell, Serge BernardISVLSI: IEEE Computer Society Annual Symposium on VLSI, Jul 2015, Montpellier, France. Proc. IEEE Computer Society Annual Symposium on VLSI (ISVLSI’15), pp.634-639, 2015.
- In-silico Phantom Axon: Emulation of an Action Potential Propagating Along Artificial Nerve FiberOlivier Rossel, Fabien Soulier, Serge Bernard, David Guiraud, Guy CathébrasISVLSI: IEEE Computer Society Annual Symposium on VLSI, Jul 2015, Montpellier, France. 2015, Proceedings of 2015 IEEE Computer Society Annual Symposium on VLSI (ISVLSI). <10.1109/ISVLSI.2015.123>
- A generic methodology for building efficient prediction models in the context of alternate testingSyhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, Michel RenovellIMSTW: International Mixed-Signals Test Workshop, Jun 2015, Paris, France. IEEE, 2015, Mixed-Signal Testing Workshop (IMSTW), 2015 20th International. <10.1109/IMS3TW.2015.7177873>
- Digital on-chip measurement circuit for built-in phase noise testingStéphane David-Grignot, Florence Azaïs, Laurent Latorre, François LefevreIMSTW: International Mixed-Signals Test Workshop, Jun 2015, Paris, France. IEEE, 2015, Mixed-Signal Testing Workshop (IMSTW), 2015 20th International. <10.1109/IMS3TW.2015.7177880>
- Une pedagogie par projet pour des etudiants acteurs et auteurs de leur apprentissageBeatrice Pradarelli, Pascal Nouet, Laurent LatorreQPES: Questions de Pédagogie dans l’Enseignement Supérieur, Jun 2015, Brest, France. 2015. <http://www.colloque-pedagogie.org/?q=node/5>
- An architecture-level cache simulation framework supporting advanced PMA STT-MRAMBi Wu, Yuanqing Cheng, Ying Wang, Aida Todri-Sanial, Guangyu Sun, Lionel Torres, Weisheng ZhaoNANOARCH: Nanoscale Architectures, Jun 2015, Boston, MA, United States. Nanoscale Architectures (NANOARCH), 2015 IEEE/ACM International Symposium on, pp.7-12, 2015.
- A New Technique for Low-Cost Phase Noise Production Testing from 1-bit Signal AcquisitionStéphane David-Grignot, Florence Azaïs, Laurent Latorre, François LefevreETS: European Test Symposium, May 2015, Cluj-Napoca, Romania. IEEE, Proc. IEEE European Test Symposium 2015 (ETS'15), pp.1-6, 2015.
- A body-biasing of readout circuit for STT-RAM with improved thermal reliabilityLun Yang, Yuanqing Cheng, Yuhao Wang, Hao Yu, Weisheng Zhao, Aida Todri-SanialISCAS: International Symposium on Circuits and Systems, May 2015, Lisbon, Portugal. IEEE, IEEE International Symposium on Circuits and Systems, pp.1530-1533, 2015.
- A node clustering reduction scheme for power grids electrothermal analysisAlessandro Magnani, M. De Magistris, Antonio Maffucci, Aida Todri-SanialSPI: Signal and Power Integrity, May 2015, Berlin, Germany. Signal and Power Integrity (SPI), 2015 IEEE 19th Workshop on, pp.1-4, 2015.
- An ultra-low-power front-end for differential capacitive sensorsPatcharee Kongpark, Frédérick Mailly, Laurent Latorre, Pascal NouetDTIP: Design, Test, Integration and Packaging, Apr 2015, Montpellier, France. IEEE, 2015, Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS (DTIP2015). <10.1109/DTIP.2015.7160964>
- MEMS based Inertial Measurement UnitsGaurav Chatterjee, Laurent Latorre, Frédérick Mailly, Pascal Nouet, Nacim Hachelef, Coumar OudéaDTIP: Design, Test, Integration and Packaging, Apr 2015, Montpellier, France. IEEE, Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS, pp.1-5, 2015.
- Exploring the limit of ENG spatio-temporal filtering for velocity-selectivityMariam Abdallah, Olivier Rossel, Serge Bernard, Fabien Soulier, Guy CathébrasNER: Neural Engineering, Apr 2015, Montpellier, France. 2015, 7th International IEEE EMBS Neural Engineering Conference.
- Embedded test instrument for on-chip phase noise evaluation of analog/IF signalsFlorence Azaïs, Stéphane David-Grignot, Laurent Latorre, François LefevreDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2015, Belgrade, Serbia. IEEE, Proc. of the 18th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS'15), pp.237-242, 2015.
- Statistical Energy Study for 28nm FDSOI DevicesKheirallah Rida, Jean-Marc Galliere, Aida Todri-Sanial, Gilles Ducharme, Nadine AzemardEuroSimE: Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, Apr 2015, Budapest, Hungary. Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2015 16th International Conference on, 2015. <10.1109/EuroSimE.2015.7103149>
- A digital technique for the evaluation of SSB phase noise of analog/RF signalsFlorence Azaïs, Stéphane David-Grignot, François Lefevre, Laurent LatorreLATS: Latin-American Test Symposium, Mar 2015, Puerto Vallarta, Mexico. IEEE, 2015, Test Symposium (LATS), 2015 16th Latin-American. <10.1109/LATW.2015.7102407>
- Interest of MIA in frequency domain?Mathieu Carbone, Michel Agoyan, Yannick Teglia, Gilles Ducharme, Philippe MaurineCS2'2015: 2nd Workshop on Cryptography and Security in Computing Systems, Jan 2015, Amtersdam, Netherlands. Proceedings of the Second Workshop on Cryptography and Security in Computing Systems, Proceedings of the Second Workshop on Cryptography and Security in Computing Systems. <10.1145/2694805.2694812>
2014
- Evidence of a larger EM-induced fault modelSébastien Ordas, Ludovic Guillaume-Sage, Karim Tobich, Jean-Max Dutertre, Philippe MaurineCARDIS: Smart Card Research and Advanced Applications, Nov 2014, Paris, France. 13th Smart Card Research and Advanced Application Conference, LNCS (8968), pp.245-259, 2015, Smart Card Research and Advanced Applications.
- CMOS implementation of a 3-axis thermal convective accelerometerFrédérick Mailly, Huy Binh Nguyen, Laurent Latorre, Pascal NouetIEEE SENSORS 2014, Nov 2014, Valencia, Spain. IEEE, Sensors Conference 2014, pp.1471-1474, 2014.
- Low-cost phase noise testing of complex RF ICs using standard digital ATEStéphane David-Grignot, Florence Azaïs, Laurent Latorre, François LefevreITC: International Test Conference, Oct 2014, Seattle, WA, United States. IEEE, 2014. <10.1109/TEST.2014.7035301>
- ElectroMagnetic Analysis and Fault Injection onto Secure CircuitsPaolo Maistri, Regis Leveugle, Lilian Bossuet, Alain Aubert, Viktor Fischer, Bruno Robisson, Nicolas Moro, Philippe Maurine, Jean-Max Dutertre, Mathieu LisartVLSI-SoC: Very Large Scale Integration - System-on-Chip, Oct 2014, Mexico, Mexico. 22nd International Conference on Very Large Scale Integration, 2014. <10.1109/VLSI-SoC.2014.7004182>
- Electromagnetic analysis, deciphering and reverse engineering of integrated circuits (E-MATA HARI)Laurent Chusseau, Rachid Omarouayache, Jérémy Raoult, Sylvie Jarrix, Philippe Maurine, Karim Tobich, Alexandre Boyer, Bertrand Vrignon, John Shepherd, Thanh-Ha Le, Maël Berthier, Lionel Rivière, Bruno Robisson, Anne-Lise RibottaVLSI-SoC: Very Large Scale Integration - System-on-Chip, Oct 2014, Playa del Carmen, Mexico. 22nd International Conference on Very Large Scale Integration, pp.1-6, 2014.
- Study of adaptive tuning strategies for Near Field Communication (NFC) transmitter moduleMouhamadou Dieng, Florence Azaïs, Mariane Comte, Serge Bernard, Vincent Kerzérho, Michel Renovell, Thibault Kervaon, Paul-Henri Pugliesi-ContiIMS3TW'14: International Mixed-Signals, Sensors, and Systems Test Workshop, Sep 2014, Porto ALegre, Brazil. IEEE, pp.1-6.
- Stochastic model for phase noise measurement from 1-bit signal acquisitionStéphane David-Grignot, Florence Azaïs, François Lefevre, Laurent LatorreIMS3TW'14: International Mixed-Signals, Sensors, and Systems Test Workshop, Sep 2014, Porto Alegre, Brazil. IEEE, pp.1-6.
- Real-Time Testing of 90nm COTS SRAMs at Concordia Station in AntarcticaGeorgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri-Sanial, Arnaud Virazel, Philippe Cocquerez, Jean-Luc Autran, Antonio Litterio, Frédéric Wrobel, Frédéric SaignéNSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France. IEEE Nuclear & Space Radiation Effects Conference (NSREC 2014), 2014. <http://ieee-npss.org/wp-content/uploads/2014/03/2014-NSREC.pdf>
- Efficient Dynamic Test Methods for COTS SRAMs Under Heavy Ion IrradiationGeorgios Tsiligiannis, Luigi Dilillo, Viyas Gupta, Alberto Bosio, Patrick Girard, Aida Todri-Sanial, Arnaud Virazel, Helmut Puchner, Alexandre Louis Bosser, Arto Javanainen, Ari Virtanen, Frédéric Wrobel, Laurent Dusseau, Frédéric SaignéNSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France. IEEE Nuclear & Space Radiation Effects Conference (NSREC 2014), 2014.
- A Delay Probability Metric for Input Pattern Ranking Under Process Variation and Supply NoiseAnu Asokan, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud VirazelISVLSI: IEEE Computer Society Annual Symposium on VLSI, Jul 2014, Tampa, FL, United States. VLSI (ISVLSI), 2014 IEEE Computer Society Annual Symposium on, pp.226-231, 2014.
- Solutions for the self-adaptation of communicating systems in operationMartin Andraud, Anthony Deluthault, Mouhamadou Dieng, Florence Azaïs, Serge Bernard, Philippe Cauvet, Mariane Comte, Thibault Kervaon, Vincent Kerzérho, Salvador Mir, Paul-Henri Pugliesi-Conti, Michel Renovell, Fabien Soulier, Emmanuel Simeu, Haralampos-G StratigopoulosIOLTS: International On-line Test Symposium, Jul 2014, Platja d’Aro, Spain. IEEE Computer Society, 20th International Symposium on On-Line Testing and Robust System Design, pp.234-239, 2014.
- Methodology for Self-Adaptation of Electronic Medical Devices: Application to an Intraocular Pressure SensorAnthony Deluthault, Fabien Soulier, Serge Bernard, Vincent Kerzérho, Luc Menzenge, Philippe CauvetIOLTS: International On-Line Testing Symposium, Jul 2014, Platja d'Aro, Spain. IEEE, 20th IEEE International Symposium on On-Line Testing and Robust System Design, 2014, Special Session 4 – Solutions for the self-adaptation of communicating systems in operation. <http://tima.imag.fr/conferences/IOLTS/iolts14/>
- Self-Adaptive NFC SystemsVincent Kerzérho, Florence Azaïs, Mouhamadou Dieng, Mariane Comte, Serge Bernard, Michel Renovell, Paul-Henri Pugliesi-Conti, Thibault KervaonIOLTS: International On-Line Testing Symposium, Jul 2014, Platja d'Aro, Spain. IEEE, 20th IEEE International On-Line Testing Symposium, 2014, Special Session 4 – Solutions for the self-adaptation of communicating systems in operation.
- Simplified review of DCDC switching noise and spectrum contentsAdnan Fares, Sami Ajram, Guy CathébrasPRIME: Ph.D. Research in Microelectronics and Electronics, Jun 2014, Grenoble, France. Ph.D. Research in Microelectronics and Electronics (PRIME), 2014 10th Conference on, pp.1-4, 2014.
- Performance exploration of partially connected 3D NoCs under manufacturing variabilityAnelise Kologeski, Fernanda Lima Kastensmidt, Vianney Lapotre, Abdoulaye Gamatié, Gilles Sassatelli, Aida Todri-SanialNEWCAS: International New Circuits and Systems Conference, Jun 2014, Trois-Rivieres, QC, Canada. IEEE, New Circuits and Systems Conference (NEWCAS), 2014 IEEE 12th International, pp.61-64, 2014.
- Phase noise measurement on IF analog signals using standard digital ATE resourcesStéphane David-Grignot, Laurent Latorre, Florence Azaïs, François LefevreNEWCAS: New Circuits and Systems, Jun 2014, Trois-Rivieres, Canada. IEEE, IEEE 12th International New Circuits and Systems Conference, pp.121-124, 2014.
- Investigations on alternate analog/RF test with model redundancyHaithem Ayari, Florence Azaïs, Serge Bernard, Vincent Kerzérho, Syhem Larguech, Mariane Comte, Michel RenovellSTEM Workshop, May 2014, Paderborn, Germany. 1st Workshop on Statistical Test Methods, 2014. <http://www.ets14.de/pages/workshops/stem-workshop.php>
- iBoX — Jitter based Power Supply Noise sensorMiroslav Valka, Alberto Bosio, Luigi Dilillo, Aida Todri-Sanial, Arnaud Virazel, Patrick Girard, Philippe Debaud, Stephane GuilhotETS: European Test Symposium, May 2014, Paderborn, United States. Test Symposium (ETS), 2014 19th IEEE European, pp.1-2, 2014.
- A Comprehensive Evaluation of Functional Programs for Power-Aware TestAymen Touati, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Arnaud Virazel, Paolo BernardiNATW: North Atlantic Test Workshop, May 2014, Johnson City, NY, United States. IEEE, Test Workshop (NATW), 2014 IEEE 23rd North Atlantic, pp.69-72, 2014.
- Investigation of horizontally aligned carbon nanotubes for efficient power delivery in 3D ICsAida Todri-SanialSPI: Signal and Power Integrity, May 2014, Ghent, Belgium. IEEE Workshop on Signal and Power Integrity, 2014. <10.1109/SaPIW.2014.6844535>
- A frequency leakage model for SCASébastien Tiran, Sébastien Ordas, Yannick Teglia, Michel Agoyan, Philippe MaurineHOST'2014: International Symposium on Hardware-Oriented Security and Trust, May 2014, Arlington, VA, United States. IEEE, Proceedings of the 2014 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST), pp.97-100, Hardware-Oriented Security and Trust.
- Protecting combinational logic in pipelined microprocessor cores against transient and permanent faultsImran Wali, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-SanialDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. Design and Diagnostics of Electronic Circuits Systems, 17th International Symposium on, pp.223-225, 2014.
- Path delay test in the presence of multi-aggressor crosstalk, power supply noise and ground bounceAnu Asokan, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud VirazelDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. IEEE, Design and Diagnostics of Electronic Circuits & Systems, 17th International Symposium on, pp.207-212, 2014.
- Timing-aware ATPG for critical paths with multiple TSVsCarolina Metzler, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud VirazelDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. IEEE, Design and Diagnostics of Electronic Circuits & Systems, 17th International Symposium on, pp.116-121, 2014.
- Test and diagnosis of power switchesMiroslav Valka, Alberto Bosio, Luigi Dilillo, Aida Todri-Sanial, Arnaud Virazel, Patrick Girard, Philippe Debaud, Stephane GuilhotDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. Design and Diagnostics of Electronic Circuits Systems, 17th International Symposium on, pp.213-218, 2014.
- An intra-cell defect grading toolAlberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Stefano Bernabovi, Paolo BernardiDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. Design and Diagnostics of Electronic Circuits & Systems, 17th International Symposium on, pp.298-301, 2014.
- On Adaptive Bandwidth Selection for Efficient MIAMathieu Carbone, Sébastien Tiran, Sébastien Ordas, Michel Agoyan, Yannick Teglia, Gilles R. Ducharme, Philippe MaurineCOSADE'2014: 5th International Workshop on Constructive Side-Channel Analysis and Secure Design, Apr 2014, Paris, France. Constructive Side-Channel Analysis and Secure Design, pp.82-97, 2014, Lecture Notes in Computer Science.
- Attacking Randomized Exponentiations Using Unsupervised LearningGuilherme Perin, Laurent Imbert, Lionel Torres, Philippe MaurineCOSADE: Constructive Side-Channel Analysis and Secure Design, Apr 2014, Paris, France. 5th International Workshop on Constructive Side-Channel Analysis and Secure Design, LNCS (8622), pp.144-160, 2014, Constructive Side-Channel Analysis and Secure Design.
- TSV aware timing analysis and diagnosis in paths with multiple TSVsCarolina Metzler, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud VirazelISVLSI: IEEE Computer Society Annual Symposium on VLSI, Apr 2014, Napa, CA, United States. VLSI Test Symposium (VTS), 2014 IEEE 32nd, pp.1-6, 2014.
- Electro-thermal characterization of Through-Silicon ViasAida Todri-SanialEuroSimE, Apr 2014, Ghent, Belgium. 15th International Conference on Thermal, Mechanical and Mulit-Physics Simulation and Experiments in Microelectronics and Microsystems, 2014. <10.1109/EuroSimE.2014.6813859>
- Monitoring of particle deposition in cleanrooms: State-of-the-artPascal Nouet, Nina Menant, Delphine Faye, Xavier Lafontan, Djemel LellouchiDTIP: Design, Test, Integration and Packaging, Apr 2014, Cannes, France. Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS, pp.368-371, 2014.
- Direct digital synthesiser (DDS) design parameters optimisation for vibrating MEMS sensors: Optimisation of phase accumulator, Look-Up Table (LUT) and Digital to Analog Converter (DAC) sizesBaptiste Marechal, Jean Guérard, Raphael Levy, Olivier Le Traon, Frédérick Mailly, Pascal NouetDTIP: Design, Test, Integration and Packaging, Apr 2014, Cannes, France. IEEE, pp.1-5, 2014, Proceedings of the Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS (DTIP2014).
- New implementions of predictive alternate analog/RF test with augmented model redundancyHaithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, Michel RenovellDATE: Design, Automation and Test in Europe, Mar 2014, Dresden, Germany. 2014. <10.7873/DATE2014.144>
- Efficiency of a glitch detector against electromagnetic fault injectionLoic Zussa, Amine Dehbaoui, Karim Tobich, Jean-Max Dutertre, Philippe Maurine, Ludovic Guillaume-Sage, Jessy Clédière, Assia TriaDATE: Design, Automation and Test in Europe, Mar 2014, Dresden, Germany. IEEE, pp.1-6, 2014, Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014.
- Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testingSyhem Larguech, Florence Azaïs, Serge Bernard, Vincent Kerzérho, Mariane Comte, Michel RenovellLATW: Latin American Test Workshop, Mar 2014, Fortaleza, Brazil. 15th IEEE Latin American Test Workshop, pp.1-6, 2014.
- Power supply noise-aware workload assignments for homogeneous 3D MPSoCs with thermal considerationYuanqing Cheng, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud VirazelASP-DAC: Asia and South Pacific Design Automation Conference, Jan 2014, Singapore, Singapore. 19th Asia and South Pacific Design Automation Conference, 2014. <10.1109/ASPDAC.2014.6742948>
- Power supply noise-aware workload assignments for homogeneous 3D MPSoCs with thermal considerationYuanqing Cheng, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud VirazelASP-DAC: Asia and South Pacific Design Automation Conference, Jan 2014, Singapore, Singapore. pp.544-549, 2014, Design Automation Conference (ASP-DAC), 2014 19th Asia and South Pacific.
- Exploring potentials of perpendicular magnetic anisotropy STT-MRAM for cache designXiaolong Zhang, Yuanqing Cheng, Weisheng Zhao, Youguang Zhang, Aida Todri-SanialSolid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on, 2014, Unknown, Unknown Region. pp.1-3, 2014.
Dernière mise à jour le 24/01/2019
Département : Microélectronique
Responsable : Philippe MAURINE